IP Library Granted Patent US 7,456,441
Granted Patent B2
US 7,456,441 · App. 11/532,477 · Granted Nov 25, 2008

Single well excess current dissipation circuit

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Quick Facts
Patent No.
US 7,456,441
App. No.
11/532,477
Granted
Nov 25, 2008
Kind
B2
Abstract

A current dissipation circuit that dissipates excess current to or from a circuit node when that monitored circuit node experiences abnormal voltage conditions, rather than having that excess current being dissipated through other protected circuitry. The current dissipation circuit may use single well technology, and may even provide reverse voltage protection without necessarily triggering more significant current dissipation. In another embodiment, the current dissipation circuit is provided by a series connection of at least five alternating p-type and n-type regions provided between the monitored circuit node and a current source or sink.

Claims (41)

1. A circuit for carrying current between a first circuit node and a second circuit node in a manner that is different depending on a state of the circuit, the state being dependent on a voltage at either or both of the first circuit node and the second circuit node, the circuit comprising:

a first well having a first polarity and coupled to the first circuit node through a first parallel combination of a first contact region having the first polarity and a second contact region having a second polarity that is opposite the first polarity, wherein a net dopant density of each of the first and second contact regions is higher than a net dopant density of the first well, wherein the first contact region is coupled to the first circuit node through a resistor circuit element; and

a second well having the first polarity and separated from the first well by an intervening region of the second polarity, the second well being coupled to the second circuit node through a second parallel combination of a third contact region having the first polarity and a fourth contact region having the second polarity, wherein a net dopant density of each of the third and fourth contact regions is higher than a net dopant density of the second well.

2. A circuit in accordance with claim 1 , wherein the second contact region is coupled to the first circuit node without an intervening resistor circuit element.

3. A circuit in accordance with claim 2 , wherein the third and fourth contact regions are coupled to the second circuit node without an intervening resistor element.

4. A circuit in accordance with claim 1 , wherein the second circuit node is fixed to a substantially fixed voltage supply.

5. A circuit in accordance with claim 4 , wherein the first circuit node is an I/O pad.

6. A circuit in accordance with claim 4 , wherein the intervening region is a first intervening region and the substantially fixed voltage supply is a first substantially fixed voltage supply, the circuit further comprising:

a third well having the first polarity and separated from the first well by a second intervening region of the second polarity, the third well being coupled to a third circuit node through a third parallel combination of a fifth contact region having the first polarity and a sixth contact region having the second polarity, wherein a net dopant density of each of the fifth and sixth contact regions is higher than a net dopant density of the third well.

7. A circuit in accordance with claim 1 , wherein the first circuit node is an I/O pad.

8. A circuit in accordance with claim 1 , wherein the first polarity is n-type and the second polarity is p-type.

9. A circuit in accordance with claim 1 , wherein the first polarity is p-type and the second polarity is n-type.

10. A circuit comprising:

an input pad;

core circuitry coupled to the input pad;

a current protection portion coupled to the input pad so as to limit the amount of current provided to or from the input pad to the core circuit during positive or negative exception conditions, the current protection portion comprising a series connection of the following in order between the input pad and a current source or sink:

a first region of a first polarity type;

a first region of a second polarity type opposite the first polarity type, wherein the first region of the second polarity type is coupled to the input pad via a resistor circuit element;

a second region of the first polarity type;

a second region of the second polarity type; and

a third region of the first polarity type.

11. A circuit in accordance with claim 10 , wherein the first polarity type is n-type and the second polarity type is p-type.

12. A circuit in accordance with claim 10 , wherein the first polarity type is p-type and the second polarity type is n-type.

13. A circuit comprising:

an input pad;

core circuitry coupled to the input pad;

a current protection portion coupled to the input pad so as to limit the amount of current provided to or from the input pad to the core circuit during positive or negative exception conditions, the current protection portion comprising a series connection of the following in order between the input pad and a current source or sink:

a first region of a first polarity type;

a first region of a second polarity type opposite the first polarity type, wherein the first region of the second polarity type is coupled to the input pad via a resistor circuit element;

a second region of the first polarity type, wherein the second region of the first polarity type is coupled to a first substantially fixed voltage source;

a second region of the second polarity type; and

a third region of the first polarity type.

14. A circuit in accordance with claim 13 , wherein the second region of the second polarity type is coupled to a second substantially fixed voltage source.

15. A circuit comprising:

an input pad;

a first bipolar transistor having its emitter terminal coupled to the input pad, the first bipolar transistor having its base terminal coupled to its emitter terminal via a resistor circuit element;

a second bipolar transistor having its collector terminal coupled to the base terminal of the first bipolar transistor, the second bipolar transistor having a base terminal coupled to the collector terminal of the first bipolar transistor;

a third bipolar transistor having its emitter terminal coupled to the base terminal of the second bipolar transistor and to a first voltage source, the third bipolar transistor having its base terminal coupled to the emitter terminal of the second bipolar transistor, the third bipolar transistor having its collector terminal coupled to a second voltage source.

16. A circuit in accordance with claim 15 , wherein the first and second voltage sources are the same.

17. A circuit in accordance with claim 15 , wherein the first and third bipolar transistors are PNP bipolar transistors, and the second bipolar transistor is an NPN bipolar transistor.

18. A circuit in accordance with claim 15 , wherein the first and third bipolar transistors are NPN bipolar transistors, and the second bipolar transistor is a PNP bipolar transistor.

Assignments (8)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
RELEASE OF SECURITY INTEREST Recorded May 6, 2016
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT AND COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 038631/0345 →
RELEASE OF SECURITY INTEREST Recorded May 6, 2016
From: JPMORGAN CHASE BANK, N.A. (ON ITS BEHALF AND ON BEHALF OF ITS PREDECESSOR IN INTEREST, CHASE MANHATTAN BANK)
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 038632/0074 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
PURCHASE AGREEMENT DATED 28 FEBRUARY 2009 Recorded Sep 25, 2009
From: AMI SEMICONDUCTOR, INC.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 023282/0465 →
SECURITY AGREEMENT Recorded Jun 23, 2008
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; AMIS HOLDINGS, INC.; AMI SEMICONDUCTOR, INC.; AMIS FOREIGN HOLDINGS INC.; AMI ACQUISITION LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 021138/0070 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 4, 2007
From: TYLER, MATTHEW A.; NAUGHTON, JOHN J.
To: AMI SEMICONDUCTOR, INC.
Reel/Frame 019251/0414 →