IP Library Granted Patent US 7,728,438
Granted Patent B2
US 7,728,438 · App. 11/537,496 · Granted Jun 1, 2010

Optical semiconductor device and method of manufacturing the same

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Quick Facts
Patent No.
US 7,728,438
App. No.
11/537,496
Granted
Jun 1, 2010
Kind
B2
Abstract

An optical semiconductor device of which the moisture resistance and the like are improved and the manufacturing method thereof are provided. An optical semiconductor device of the embodiment is configured to include an optical semiconductor element on a surface of which a circuit portion including a light-receiving or light-emitting element is formed; a terminal portion which is provided on a back of the optical semiconductor element and electrically connected with the circuit portion; a covering layer which covers the surface of the optical semiconductor element and is made of a transparent material; and sealing resin which covers side faces of the covering layer and of the optical semiconductor element. The circuit portion and the terminal portion may be connected by a rewiring pattern.

Claims (31)

1. A semiconductor device, comprising:

a semiconductor element;

a first conductive electrode, wherein the first conductive electrode is electrically connected to a circuit on a front surface of the semiconductor element;

a penetrating region extending from the front surface to a back surface of the semiconductor element in a manner substantially perpendicular to the front and back surfaces of the semiconductor element, wherein the penetrating region is over the first conductive electrode;

a second conductive electrode inside the penetrating region and electrically connected to the first conductive electrode;

a transparent cover on the front surface of the semiconductor element, wherein a side surface of the transparent cover and a side surface of the semiconductor element are on the same plane; and

a sealing resin, wherein the resin covers and is in direct contact with the side surface of the semiconductor element and the side surface of the transparent cover and a thickness of the sealing resin in direct contact with the side surface of the semiconductor element is greater than a thickness of the sealing resin in direct contact with the side surface of the transparent cover.

2. The device of claim 1 wherein the second conductive electrode is connected to a terminal portion on the back surface of the semiconductor element.

3. The device of claim 1 further comprising adhesive resin between the semiconductor element and the cover.

4. The device of claim 1 wherein the second conductive electrode comprises a conductive material.

5. A semiconductor device, comprising:

a semiconductor element;

a circuit on a front surface of the semiconductor element, wherein the circuit includes at least one of a light receiving element and a light emitting element;

a first conductive electrode on the front surface of the semiconductor element and electrically connected to the circuit;

a penetrating region extending from the front surface to a back surface of the semiconductor element in a manner substantially perpendicular to the front and back surfaces of the semiconductor element, wherein the penetrating region is over the first conductive electrode;

a second conductive electrode inside the penetrating region and electrically connected to the first conductive electrode;

a transparent cover on the front surface of the semiconductor element, wherein a side surface of the transparent cover and a side surface of the semiconductor element are on the same plane; and

a sealing resin, wherein the resin covers and is in direct contact with the side surface of the semiconductor element and the side surface of the transparent cover and a thickness of the sealing resin in direct contact with the side surface of the semiconductor element is greater than a thickness of the sealing resin in direct contact with the side surface of the transparent cover.

6. The device of claim 5 wherein the second conductive electrode is connected to a terminal portion on the back surface of the semiconductor element.

7. The device of claim 5 further comprising adhesive resin between the semiconductor element and the cover.

8. The device of claim 5 wherein the second conductive electrode comprises a conductive material.

9. The device of claim 1 wherein a front surface of the transparent cover and a front surface of the sealing resin are in the same plane.

10. The device of claim 5 wherein a front surface of the transparent cover and a front surface of the sealing resin are in the same plane.

11. The device of claim 1 further comprising an insulating layer between and in contact with both the sealing resin and the back surface of the semiconductor element.

12. The device of claim 5 further comprising an insulating layer between and in contact with both the sealing resin and the back surface of the semiconductor element.

13. The device of claim 1 wherein the sealing resin covers the back surface of the semiconductor element.

14. The device of claim 1 wherein the sealing resin is in direct contact with the side surface of the semiconductor element and the side surface of the transparent cover.

15. The device of claim 5 wherein the sealing resin covers the back surface of the semiconductor element.

16. The device of claim 5 wherein the sealing resin is in direct contact with the side surface of the semiconductor element and the side surface of the transparent cover.

17. The device of claim 11 further comprising a terminal portion electrically connected to the second conductive electrode, the terminal portion extending from the back surface of the semiconductor element through the insulating layer and the sealing resin.

18. The device of claim 12 further comprising a terminal portion electrically connected to the second conductive electrode, the terminal portion extending from the back surface of the semiconductor element through the insulating layer and the sealing resin.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2014
From: KANTO SANYO SEMICONDUCTOR CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 033713/0296 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT #12/577882 PREVIOUSLY RECORDED ON REEL 026594 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2014
From: SANYO ELECTRIC CO., LTD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032836/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2011
From: SANYO ELECTRIC CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 026594/0385 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 12, 2010
From: KAMEYAMA, KOUJIRO; MITA, KIYOSHI
To: SANYO ELECTRIC CO., LTD.; KANTO SANYO SEMICONDUCTORS CO., LTD.
Reel/Frame 024215/0572 →