Resistive memory having shunted memory cells
View Patent ↗A memory includes a bit line and a plurality of resistive memory cells coupled to the bit line. Each resistive memory cell is programmable to each of at least three resistance states. The memory includes a first resistor for selectively coupling to the bit line to form a first current divider with a selected memory cell during a read operation.
1. An integrated circuit comprising:
a bit line;
a plurality of resistive memory cells coupled to the bit line, each resistive memory cell programmable to each of at least two resistance states;
a first resistor for selectively coupling to the bit line to form a first current divider with a selected memory cell during a read operation; and
a second resistor for selectively coupling to the bit line to form a second current divider with the selected memory cell during a read operation in response to the resistance of the selected memory cell being greater than the resistance of the first resistor.
2. The integrated circuit of claim 1 , wherein the resistive memory cells comprise phase change memory cells.
3. The integrated circuit of claim 1 , wherein the first resistor comprises a linear resistor.
4. The integrated circuit of claim 1 , wherein the first resistor comprises an active device acting as a resistor.
5. A memory comprising:
a plurality of resistive memory cells, each resistive memory cell programmable to each of at least two resistance states; and
a shunt circuit comprising at least a first shunt resistor for selectively coupling in parallel with the memory cells to form a first current divider with a selected memory cell and a second shunt resistor for selectively coupling in parallel with the memory cells to form a second current divider with the selected memory cell in response to a resistance of the selected memory cell being greater than a resistance of the first shunt resistor.
6. The memory of claim 5 , wherein the memory cells comprise phase change memory cells.
7. The memory of claim 5 , wherein the first shunt resistor comprises a linear resistor.
8. The memory of claim 5 , wherein the first shunt resistor comprises an active device acting as a resistor.
9. The memory of claim 5 , further comprising:
a sense circuit for sensing a state of the selected memory cell based on a divided current signal through the shunt circuit and the selected memory cell.
10. The memory of claim 9 , further comprising:
a bit line coupled to the plurality of memory cells, the shunt circuit, and the sense circuit.
11. The memory of claim 9 , wherein the sense circuit comprises a sense amplifier for sensing a state of the selected memory cell and the shunt circuit is coupled to an input of the sense amplifier.
12. A memory comprising:
a bit line;
a plurality of resistive memory cells coupled to the bit line, each resistive memory cell programmable to each of at least two resistance states; and
means for selectively shunting current from a selected memory cell during a read operation for sensing a resistance state of the selected memory cell,
wherein the means comprises a first resistor for selectively shunting current from the selected memory cell and a second resistor for selectively shunting current from the selected memory cell in response to the resistance of the selected memory cell being greater than the resistance of the first resistor.
13. The memory cell of claim 12 , wherein the resistive memory cells comprise phase change memory cells.
14. The memory of claim 12 , further comprising:
means for selectively electrically coupling the bit line to the means for shunting the current.
15. The memory of claim 13 , further comprising:
means for sensing a state of the selected memory cell based on the shunted current.
16. The memory of claim 13 , wherein each memory cell comprises at least one of Ge, Sb, Te, Ga, As, In, Se, and S.
17. A method for sensing a state of a resistive memory cell, the method comprising:
applying a first current to a bit line coupled to a selected memory cell;
shunting a first porti 6 n of the first current through a first resistor selectively coupled to the bit line;
sensing whether the selected memory cell is set at a first resistance state based on the shunted first portion of the first current;
shunting a second portion of the first current through a second resistor selectively coupled to the bit line in response to sensing the selected memory cell is not set at the first resistance state; and
sensing whether the selected memory cell is set at a second resistance state based on the shunted second portion of the first current.
18. The method of claim 17 , wherein sensing the state of the resistive memory cell comprises sensing the state of a phase change memory cell.
19. The method of claim 17 , further comprising:
sensing whether the selected memory cell is set at a third resistance state based on the shunted second portion of the first current.
20. The method of claim 17 , further comprising:
shunting a third portion of the first current through a third resistor selectively coupled to the bit line in response to sensing the selected memory cell is not set at the second resistance state; and
sensing whether the selected memory cell is set at a third resistance state based on the shunted third portion of the first current.
21. The method of claim 20 , further comprising:
sensing whether the selected memory cell is set at a fourth resistance state based on the shunted third portion of the first current.
22. A method for sensing a state of a resistive memory cell, the method comprising:
applying a first current to a bit line coupled to a selected memory cell set to one of at least four resistance states, the four resistance states including a first state having a first resistance, a second state having a second resistance greater than the first resistance, a third state having a third resistance greater than the second resistance, and a fourth state having a fourth resistance greater than the third resistance;
shunting a portion of the first current through a resistor selectively coupled to the bit line, a resistance of the resistor greater than the second resistance and less than the third resistance;
sensing whether the selected memory cell is set at a state having a resistance greater than the resistance of the resistor;
sensing the selected memory cell is set to one of the first state and the second state in response to sensing the selected memory cell is set at a state having a resistance less than the resistance of the resistor; and
decoupling the resistor from the bit line and sensing the selected memory cell is set to one of the third state and the fourth state in response to sensing the selected memory cell is set at a state having a resistance greater than the resistance of the resistor.
23. The method of claim 22 , wherein sensing the state of the resistive memory cell comprises sensing the state of a phase change memory cell.
24. The method of claim 22 , further comprising:
decoupling the resistor from the bit line in response to sensing the selected memory cell is set at a state having a resistance less than the resistance of the resistor.