IP Library Granted Patent US 7,324,380
Granted Patent B2
US 7,324,380 · App. 11/611,665 · Granted Jan 29, 2008

Method for trimming the temperature coefficient of a floating gate voltage reference

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Quick Facts
Patent No.
US 7,324,380
App. No.
11/611,665
Granted
Jan 29, 2008
Kind
B2
Abstract

A voltage reference circuit provides a reference voltage that can be precisely programmed. The threshold voltage of a first non-volatile memory (NVM) transistor is programmed while coupled in parallel with a second NVM transistor. During programming, one or more capacitors are connected between the floating gate of the first NVM transistor and ground, and one or more capacitors are connected between the floating gate of the second NVM transistor and ground. The first and second NVM transistors are then coupled to a differential amplifier, which is used to generate a single-ended reference voltage in response to the programmed threshold voltage of the first NVM transistor. Bipolar transistors are selectively switched between the various capacitors and ground, thereby providing precise adjustment of the temperature coefficient of the voltage reference circuit.

Claims (35)

1. A method of providing a reference voltage in an integrated circuit, comprising:

programming a threshold voltage of a first non-volatile memory (NVM) transistor while coupled with a second NVM transistor;

coupling a first capacitor between a floating gate of the first NVM transistor and a first voltage supply during the programming step;

generating a single-ended reference voltage in response to the programmed threshold voltage of the first NVM transistor; and then

adjusting a temperature coefficient associated with the single-ended reference voltage by introducing a first p-n junction in series with the first capacitor.

2. The method of claim 1 , wherein the temperature coefficient is reduced by introducing the first p-n junction in series with the first capacitor.

3. The method of claim 1 , further comprising:

coupling a second capacitor between the floating gate of the first NVM transistor and the first voltage supply during the programming step; and

adjusting the temperature coefficient associated with the single-ended reference voltage by introducing a second p-n junction in series with the second capacitor.

4. The method of claim 3 , wherein the temperature coefficient is adjusted in a first direction by introducing the first and second p-n junctions in series with the first capacitor.

5. The method of claim 1 , wherein the first p-n junction is introduced by switching a PNP bipolar transistor into a series connection with the first capacitor.

6. The method of claim 1 , wherein the first voltage supply comprises a ground terminal.

7. The method of claim 1 , wherein the first p-n junction is introduced between the first capacitor and the first voltage supply.

8. The method of claim 1 , wherein the first p-n junction is introduced such that the first p-n junction is forward-biased.

9. The method of claim 1 , further comprising:

coupling a second capacitor between a floating gate of the second NVM transistor and the first voltage supply during the programming step; and

adjusting the temperature coefficient associated with the single-ended reference voltage by introducing a second p-n junction in series with the second capacitor.

10. The method of claim 9 , wherein the temperature coefficient is adjusted in a first direction by introducing the first p-n junction in series with the first capacitor, and wherein the temperature coefficient is adjusted in a second direction, opposite the first direction, by introducing the second p-n junction in series with the second capacitor.

11. The method of claim 9 , wherein the first p-n junction is introduced between the first capacitor and the first voltage supply, and the second p-n junction is introduced between the second capacitor and the first voltage supply.

12. The method of claim 9 , wherein the first and second p-n junctions are introduced such that the first and second p-n junctions are forward-biased.

13. The method of claim 1 , further comprising selecting a total capacitance coupled between the floating gate of the first NVM transistor and the first voltage supply during the programming step to be equal to a total capacitance coupled between the floating gate of the second NVM transistor and the first voltage supply during the programming step.

14. A method of providing a reference voltage in an integrated circuit, comprising:

programming a threshold voltage of a first non-volatile memory (NVM) transistor while coupled with a second NVM transistor;

coupling a first capacitor between a floating gate of the second NVM transistor and a first voltage supply during the programming step;

generating a single-ended reference voltage in response to the programmed threshold voltage of the first NVM transistor; and then

adjusting a temperature coefficient associated with the single-ended reference voltage by introducing a first p-n junction in series with the first capacitor.

15. The method of claim 14 , wherein the temperature coefficient is increased by introducing the first p-n junction in series with the first capacitor.

16. The method of claim 14 , further comprising:

coupling a second capacitor between the floating gate of the second NVM transistor and the first voltage supply during the programming step; and

adjusting the temperature coefficient associated with the single-ended reference voltage by introducing a second p-n junction in series with the second capacitor.

17. The method of claim 14 , wherein the first p-n junction is introduced by switching a PNP bipolar transistor into a series connection with the first capacitor.

18. The method of claim 14 , wherein the first voltage supply comprises a ground terminal.

19. The method of claim 14 , wherein the first p-n junction is introduced between the first capacitor and the first voltage supply.

20. The method of claim 14 , wherein the first p-n junction is introduced such that the first p-n junction is forward-biased.

21. The method of claim 14 , further comprising selecting a total capacitance coupled between the floating gate of the first NVM transistor and the first voltage supply during the programming step to be equal to a total capacitance coupled between the floating gate of the second NVM transistor and the first voltage supply during the programming step.

Assignments (8)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
RELEASE OF SECURITY INTEREST Recorded May 6, 2016
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT AND COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 038631/0345 →
RELEASE OF SECURITY INTEREST Recorded May 6, 2016
From: JPMORGAN CHASE BANK, N.A. (ON ITS BEHALF AND ON BEHALF OF ITS PREDECESSOR IN INTEREST, CHASE MANHATTAN BANK)
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 038632/0074 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
MERGER Recorded Sep 3, 2009
From: CATALYST SEMICONDUCTOR, INC.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, L.L.C.
Reel/Frame 023180/0479 →
SECURITY AGREEMENT Recorded Oct 27, 2008
From: CATALYST SEMICONDUCTOR, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 021744/0171 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 26, 2007
From: NEGUT, ALINA I.; GEORGESCU, SORIN S.; EFTIMIE, SABIN A.
To: CATALYST SEMICONDUCTOR, INC.
Reel/Frame 018930/0997 →