LOW COST, HIGH PIN COUNT, WAFER SORT AUTOMATED TEST EQUIPMENT (ATE) DEVICE UNDER TEST (DUT) INTERFACE FOR TESTING ELECTRONIC DEVICES IN HIGH PARALLELISM
An interference device to communicate electrical signals from a probe card used to test electronic circuits. The interface device includes at least one interposer configured to electrically couple to the probe card and a plurality of mechanical springs mechanically coupled to the at least one interposer. Each of the plurality of mechanical springs is removably arranged such that one or more of the plurality of mechanical springs may be removed. A flexible circuit is electrically coupled to the plurality of mechanical springs. The flexible circuit is further configured to mechanically couple to the at least one interposer.
1 . An interface device to communicate electrical signals from a probe card used to test electronic circuits, the interface device comprising:
at least one interposer configured to electrically couple to the probe card;
a plurality of mechanical springs mechanically coupled to the at least one interposer, each of the plurality of mechanical springs being removably arranged such that one or more of the plurality of mechanical springs may be removed; and
a flexible circuit electrically coupled to the plurality of mechanical springs, the flexible circuit further being configured to mechanically couple to the at least one interposer.
2 . The interface device of claim 1 wherein each of the plurality of mechanical springs has a stroke of greater then 100 μm.
3 . The interface device of claim 1 wherein each of the each of the plurality of mechanical springs is formed from an electrically conductive material.
4 . The interface device of claim 1 wherein each of the plurality of mechanical springs is formed from a non-conductive material formed with an electrically conductive outer layer.
5 . The interface device of claim 1 wherein the at least one interposer has the plurality of mechanical springs arranged in and 8 column by 52 row matrix.
6 . The interface device of claim 5 wherein each of the plurality of springs has a pitch of 1 mm for the columns and 1.25 mm for the rows.
7 . The interface device of claim 1 wherein each of the plurality of mechanical springs requires a contact force of about 30 Newtons for electrical communication.
8 . The interface device of claim 1 further comprising an electrical coupling between the plurality of mechanical springs mechanically coupled to the at least one interposer to edge contacts located on each of a plurality of edge connectors arranged on the probe card, the plurality of edge connectors configured to allow daughter cards to be mounted orthogonally to a face of the probe card.
9 . The interface device of claim 8 wherein 64 of the plurality of edge connectors are arranged on the probe card.
10 . The interface device of claim 1 wherein 64 interposers are mechanically coupled to the probe card.
11 . An interface device to communicate electrical signals from a probe card used to test electronic circuits, the interface device comprising:
a plurality of interposers configured to be electrically coupled to the probe card;
a plurality of mechanical springs mechanically coupled to each of the plurality of interposers, each of the plurality of mechanical springs being at least partially formed from an electrically conductive material, each of the plurality of mechanical springs further having a stroke of at least 100 μm and removably arranged such that one or more of the plurality of mechanical springs may be removed for replacement; and
a plurality of flexible circuits, each of the plurality of flexible circuits being configured to be mechanically coupled to select ones of the plurality of interposers and electrically coupled to select ones of the plurality of mechanical springs.
12 . The interface device of claim 11 wherein the at least one interposer has the plurality of mechanical springs arranged in an 8 column by 52 row matrix.
13 . The interface device of claim 12 wherein each of the plurality of springs has a pitch of 1 mm for the columns and 1.25 mm for the rows.
14 . The interface device of claim 11 wherein each of the plurality of mechanical springs requires a contact force of about 30 Newtons for electrical communication.
15 . The interface device of claim 11 further comprising an electrical coupling from the plurality of mechanical springs mechanically coupled to the at least one interposer to edge contacts on each of a plurality of edge connectors arranged on the probe card, the plurality of edge connectors configured to allow daughter cards to be mounted orthogonally to a face of the probe card.
16 . The interface device of claim 15 wherein 64 of the plurality of edge connectors are arranged on the probe card.
17 . The interface device of claim 11 wherein 64 interposers are mechanically coupled to the probe card.
18 . An interposer for communicating electrical signals from a probe card used to test electronic circuits, the interposer comprising:
a plurality of mechanical springs mechanically coupled to the interposer and arranged in a matrix, each of the plurality of mechanical springs being at least partially formed from an electrically conductive material, each of the plurality of mechanical springs further having a stroke of at least 100 μm and removably arranged such that one or more of the plurality of mechanical springs may be removed for replacement; and
at least one flexible circuit, the at least one flexible circuit being configured to be mechanically coupled to the interposer and electrically coupled to select ones of the plurality of mechanical springs.
19 . The interposer of claim 18 wherein the matrix is arranged to have 8 columns and 52 rows.
20 . The interposer of claim 18 wherein each of the plurality of springs in the matrix has a pitch of 1 mm for the columns and 1.25 mm for the rows.
21 . The interposer of claim 18 further comprising an electrical coupling from the plurality of mechanical springs to edge contacts on each of a plurality of edge connectors arranged on the probe card, the plurality of edge connectors configured to allow daughter cards to be mounted orthogonally to a face of the probe card.