IP Library Granted Patent US 7,802,114
Granted Patent B2
US 7,802,114 · App. 11/687,487 · Granted Sep 21, 2010

State change sensing

Assignee: Spansion LLC
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Quick Facts
Patent No.
US 7,802,114
App. No.
11/687,487
Granted
Sep 21, 2010
Kind
B2
Abstract

Application of too much voltage to a memory cell will cause damage to the cell or even destroy the cell. Tracking current that arises from an application of voltage upon a memory cell allows for minimization of damage upon the memory cell. If there is a change in current, then the voltage application can be accordingly changed.

Claims (33)

1. A system, comprising:

a sensor component that tracks one or more respectively sensed amounts of current in real time during a state change operation associated with a cell component, and recognizes a difference between a voltage application relating to change of state associated with the cell component during the state change operation and a different voltage application relating to a verification associated with the state change operation, such that verification of state change relating to the state change operation occurs during the state change operation to facilitate real time regulation of voltage applied to the cell component to facilitate the state change during the state change operation;

the sensor component further comprising:

an observation component that monitors a response associated with the voltage application upon the cell component; and

a balance component that regulates a voltage application component to regulate the voltage applied based at least in part on the response of the cell component from the voltage application; and

an optimization component that calculates efficiency information relating to one or more voltage applications, comprising the voltage application, upon the cell component.

2. The system of claim 1 , further comprising an error check component that processes errors relating to one or more voltage applications, comprising the voltage application, upon the cell component.

3. The system of claim 1 , further comprising a notification component that sends one or more messages about one or more voltage applications, comprising the voltage application, upon the cell component.

4. The system of claim 1 , further comprising a check component that verifies information about one or more voltage applications, comprising the voltage application, to the cell component.

5. The system of claim 1 , further comprising a receiving component that obtains a command to apply voltage to the cell component.

6. The system of claim 5 , further comprising an authorization component that determines if an obtained command can be implemented.

7. The system of claim 1 , further comprising a storage component that holds information relating to one or more voltage applications, comprising the voltage application, upon the cell component.

8. The system of claim 1 , wherein the cell component is a memory cell.

9. A method, comprising:

sensing one or more impacts from voltage administration upon a cell component during a state change operation associated with a cell component;

tracking the sensed impacts in real time during the state change operation, wherein a difference between a voltage administration relating to state change associated with the cell component during the state change operation and a different voltage administration relating to a verification associated with the state change operation is recognized;

verifying state change in relation to the state change operation during the state change operation while the state change is being performed on the cell component to facilitate real time voltage control;

controlling the voltage administered during the state change operation in real time based at least in part on the sensed impacts; and

calculating optimization data related to the voltage administration upon the cell component.

10. The method of claim 9 , further comprising receiving a request to administer a voltage upon the cell component.

11. The method of claim 10 , further comprising determining if the received request is authorized and operating in accordance with a determined result.

12. The method of claim 10 , further comprising verifying the received request to determine accuracy of information contained in the received request.

13. The method of claim 9 , further comprising storing information related to the voltage administration upon the cell component.

14. The method of claim 9 , further comprising engaging error checks related to the voltage administration upon the cell component.

15. The method of claim 9 , further comprising administering voltage upon the cell component.

16. The method of claim 9 , further comprising implementing sent information related to the one or more impacts from the voltage administration.

17. The method of claim 9 , further comprising supplying a notification about the voltage administration upon the cell component.

18. A system comprising:

means for observing voltage applications that change a state of a memory cell during a change of state operation;

means for tracking observed reactions of the memory cell to the voltage applications during the change of state operation, wherein a difference between a voltage application relating to change of state associated with the memory cell during the change of state operation and a different voltage application relating to a verification associated with the change of state operation is known;

means for verifying the change of state during the change of state operation while the change of state is being performed on the memory cell to facilitate real time voltage control associated with the change of state operation;

means for regulating the voltages applied during the change of state operation in real time based at least in part on the observed reactions; and

means for calculating efficiency information relating to one or more voltage applications, comprising the voltage application, upon the memory cell.

Assignments (9)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2022
From: CYPRESS SEMICONDUCTOR CORPORATION
To: INFINEON TECHNOLOGIES LLC
Reel/Frame 059721/0467 →
RELEASE OF SECURITY INTEREST Recorded Mar 16, 2022
From: MUFG UNION BANK, N.A.
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 059410/0438 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST Recorded Dec 5, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MUFG UNION BANK, N.A.
Reel/Frame 051209/0721 →
CORRECTIVE ASSIGNMENT TO CORRECT THE FOLLOWING NUMBERS 6272046,7277824,7282374,7286384,7299106,7337032,7460920,7519447 PREVIOUSLY RECORDED ON REEL 039676 FRAME 0237. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Oct 16, 2018
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MORGAN STANLEY SENIOR FUNDING
Reel/Frame 047797/0854 →
SECURITY INTEREST Recorded Aug 15, 2016
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039676/0237 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 1, 2015
From: SPANSION, LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036042/0212 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Dec 30, 2014
From: BARCLAYS BANK PLC
To: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY INC.; SPANSION TECHNOLOGY LLC
Reel/Frame 034715/0305 →
SECURITY AGREEMENT Recorded Jun 4, 2010
From: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY INC.; SPANSION TECHNOLOGY LLC
To: BARCLAYS BANK PLC
Reel/Frame 024522/0338 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2007
From: ACHTER, MICHAEL
To: SPANSION, LLC.
Reel/Frame 019025/0702 →
Continuity (1)
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