Program method with locally optimized write parameters
View Patent ↗A method of addressing a memory cell includes applying a plurality of pulses to the memory cell, wherein a subsequent pulse has an amplitude greater than an initial pulse. In addition, a memory includes a memory cell and a control circuit configured to address the memory cell by applying a plurality of pulses to the memory cell, wherein a subsequent pulse has an amplitude greater than an initial pulse.
1. A memory, comprising:
an array of memory cells;
a programming optimization circuit configured to perform an optimization process by reading a sampling of programmed memory cells associated with a subset of the array, and output optimization result data associated therewith; and
a control circuit configured to evaluate the optimization result data and establish a program condition for memory cells associated with the subset of the array,
wherein the memory cells comprise multi-level phase change memory cells.
2. A memory, comprising:
an array of memory cells;
a programming optimization circuit configured to perform an optimization process on a sampling of memory cells associated with a subset of the array, and output optimization result data associated therewith;
a control circuit configured to evaluate the optimization result data and establish a program condition for memory cells associated with the subset of the array; and
a program condition memory configured to store the established program conditions from the control circuit for a plurality of different subsets of the array.
3. The memory of claim 2 , wherein the control circuit is configured to receive a program control signal and an address, retrieve one or more program conditions from the program condition memory based on the address, and employ the retrieved one or more program conditions to program a memory cell in the array associated with the address.
4. The memory of claim 1 , further comprising a trigger circuit configured to generate a trigger signal for initiating the optimization process of the programming optimization circuit.
5. The memory of claim 4 , wherein the trigger circuit is configured to generate the trigger signal based on one of a programming cycle count and a detected thermal condition associated with the array.
6. The memory of claim 1 , wherein the array of memory cells comprises an array of phase change memory cells.
7. The memory of claim 1 , wherein the subset of the array comprises one of a sector or a page of the memory array.
8. A system containing a memory, comprising:
an array of memory cells comprising at least a portion of the memory;
a programming optimization circuit configured to perform an optimization process by reading a sampling of programmed memory cells associated with a subset of the array, and output optimization result data associated therewith; and
a control circuit configured to evaluate the optimization result data and establish a program condition for memory cells associated with the subset of the array; and
a program condition memory configured to store the established program conditions from the control circuit for a plurality of different subsets of the array.
9. The memory of claim 8 , wherein the control circuit is configured to receive a program control signal and an address, retrieve one or more program conditions from the program condition memory based on the address, and employ the retrieved one or more program conditions to program a memory cell in the array associated with the address.
10. The memory of claim 8 , further comprising a trigger circuit configured to generate a trigger signal for initiating the optimization process of the programming optimization circuit.
11. The memory of claim 10 , wherein the trigger circuit is configured to generate the trigger signal based on one of a programming cycle count and a detected thermal condition associated with the array.
12. The memory of claim 8 , wherein the array of memory cells comprises an array of binary state or multi-level phase change memory cells.
13. A method of programming a memory cell, comprising:
establishing a program condition based on a measured memory cell performance characteristic of a sampling of memory cells in a portion of a memory array; and
using the program condition to program a memory cell residing in the memory array portion,
wherein the measured memory cell performance characteristic comprises a read data state of the sampling of memory cells, and
wherein the read data state comprises a read data state over a plurality of varied write conditions.
14. The method of claim 13 , wherein the read data state comprises an identification of a resistance distribution of the sampling of memory cells.