IP Library Granted Patent US 7,605,092
Granted Patent B2
US 7,605,092 · App. 11/772,080 · Granted Oct 20, 2009

Passive elements, articles, packages, semiconductor composites, and methods of manufacturing same

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Quick Facts
Patent No.
US 7,605,092
App. No.
11/772,080
Granted
Oct 20, 2009
Kind
B2
Abstract

Systems and methods associated with semiconductor articles are disclosed, including forming a first layer of material on a substrate, etching trenches within regions defining a passive element in the first layer, forming metal regions on sidewalls of the trenches, and forming a region of dielectric or polymer material over or in the substrate. Moreover, an exemplary method may also include forming areas of metal regions on the sidewalls of the trenches such that planar strip portions of the areas form electrically conductive regions of the passive element(s) that are aligned substantially perpendicularly with respect to a primary plane of the substrate. Other exemplary embodiments may comprise various articles or methods including capacitive and/or inductive aspects, Titanium- and/or Tantalum-based resistive aspects, products, products by processes, packages and composites consistent with one or more aspects of the innovations set forth herein.

Claims (105)

1. An inductive article comprising:

a substrate defined by a primary plane;

a first layer of dielectric or polymer material formed on the substrate, the first layer having trenches cut in a direction perpendicular to the primary plane;

metal layers formed on the sidewalls of the trenches such that planar strip portions of areas form electrically conductive regions of an inductive element that are aligned substantially perpendicularly with respect to the primary plane; and

a region of dielectric or polymer material in the trenches, positioned between the metal layers on the sidewalls;

wherein the first layer is about 3 to about 12 micrometers thick.

2. The article of claim 1 , wherein the region of dielectric or polymer material is a polyimide layer formed by spin coating or baking.

3. The inductive article of claim 1 , wherein the region of dielectric of polymer material is a polyimide layer that has been planarized down to an upper surface of the first layer, and further comprising plugs of polyimide material formed in the trenches and that are associated with contact regions used to form electrical connections to components above the substrate.

4. The inductive article of claim 3 , wherein the contact regions form a landing pad for electrical connection with an external element.

5. The inductive article of claim 1 wherein the metal layers are comprised of gold, aluminum and/or copper, and include a layer of about 0.5 um to about 2 um in thickness.

6. The inductive article of claim 1 wherein the region of dielectric or polymer material is about 10 to about 20 micrometers in thickness.

7. The inductive article of claim 1 wherein the region of dielectric or polymer material includes a porous dielectric comprising a gas.

8. The inductive article of claim 7 wherein the gas includes air.

9. An inductive article comprising:

a substrate defined by a primary plane;

a first layer of dielectric or polymer material formed on the substrate, the first layer having trenches cut in a direction perpendicular to the primary plane;

metal layers formed on the sidewalls of the trenches such that planar strip portions of areas form electrically conductive regions of an inductive element that are aligned substantially perpendicularly with respect to the primary plane; and

a region of dielectric or polymer material in the trenches, positioned between the metal layers on the sidewalls;

wherein the metal layers are comprised of gold, aluminum and/or copper, and include a layer of about 0.5 um to about 2 um in thickness.

10. The inductive article of claim 9 wherein the region of dielectric or polymer material is about 10 to about 20 micrometers in thickness.

11. The inductive article of claim 9 wherein the region of dielectric or polymer material is a polyimide layer formed by spin coating or baking.

12. The inductive article of claim 9 wherein the region of dielectric or polymer material includes a porous dielectric comprising a gas.

13. The inductive article of claim 12 wherein the gas includes air.

14. The inductive article of claim 9 wherein the region of dielectric of polymer material is a polyimide layer that has been planarized down to an upper surface of the first layer, and further comprising plugs of polyimide material formed in the trenches and that are associated with contact regions used to form electrical connections to components above the substrate.

15. The inductive article of claim 14 , wherein the contact regions form a landing pad for electrical connection with an external element.

16. An inductive article comprising:

a substrate defined by a primary plane;

a first layer of dielectric or polymer material formed on the substrate, the first layer having trenches cut in a direction perpendicular to the primary plane;

metal layers formed on the sidewalls of the trenches such that planar strip portions of areas form electrically conductive regions of an inductive element that are aligned substantially perpendicularly with respect to the primary plane; and

a region of dielectric or polymer material in the trenches, positioned between the metal layers on the sidewalls;

wherein the region of dielectric or polymer material is about 10 to about 20 micrometers in thickness.

17. The inductive article of claim 16 wherein the region of dielectric or polymer material is a polyimide layer formed by spin coating or baking.

18. The inductive article of claim 16 wherein the region of dielectric or polymer material includes a porous dielectric comprising a gas.

19. The inductive article of claim 18 wherein the gas includes air.

20. The inductive article of claim 19 wherein the region of dielectric of polymer material is a polyimide layer that has been planarized down to an upper surface of the first layer, and further comprising plugs of polyimide material formed in the trenches and that are associated with contact regions used to form electrical connections to components above the substrate.

21. The inductive article of claim 20 wherein the contact regions form a landing pad for electrical connection with an external element.

22. An inductive article comprising:

a substrate defined by a primary plane;

a first layer of dielectric or polymer material formed on the substrate, the first layer having trenches cut in a direction perpendicular to the primary plane;

metal layers formed on the sidewalls of the trenches such that planar strip portions of areas form electrically conductive regions of an inductive element that are aligned substantially perpendicularly with respect to the primary plane; and

a region of dielectric or polymer material in the trenches, positioned between the metal layers on the sidewalls;

wherein the region of dielectric or polymer material includes a porous dielectric comprising a gas; and

wherein the gas includes air.

23. The inductive article of claim 22 wherein the region of dielectric of polymer material is a polyimide layer that has been planarized down to an upper surface of the first layer, and further comprising plugs of polyimide material formed in the trenches and that are associated with contact regions used to form electrical connections to components above the substrate.

24. A capacitive article comprising:

a substrate defined by a primary plane;

a first layer of dielectric/polymer material formed on the substrate, the first layer having trenches cut in a direction substantially perpendicular to the primary plane;

planar metal regions formed on the sidewalls of the trenches such that planar strip portions of areas form electrically conductive regions of a capacitive element that are aligned substantially perpendicularly with respect to the primary plane; and

a region of dielectric material in the trenches, positioned between the metal layers on the sidewalls;

wherein the first layer is about 3 to about 12 micrometers thick.

25. The capacitive article of claim 24 , wherein the region of dielectric material is a polyimide layer formed by spin coating or baking.

26. The capacitive article of claim 24 , wherein opposed/paired sets of the areas of the metal layer disposed on the sidewalls of the trenches form plates of the capacitive element.

27. The capacitive article of claim 24 , wherein the planar metal regions are comprised of gold, aluminum and/or copper, and include a layer of about 0.5 um to about 2 um in thickness.

28. The capacitive article of claim 24 , wherein the region of dielectric material is dielectric layer of about 10 to about 20 micrometers in thickness.

29. The capacitive article of claim 24 wherein the capacitive element comprises a metal-insulator-metal (MIM) device, wherein a capacitive relationship exists between paired areas of the metal layer on the sidewalls of the trenches, with an insulating region being a portion of a high k dielectric insulating material forming the region of dielectric material within the trenches.

30. The capacitive article of claim 24 wherein the region of dielectric material includes a high k dielectric insulating material being one or more materials selected from a group of materials composed of Al 2 O 3 , Ta 2 O 5 , and HfO x , where x is about 1 to about 2.

31. A capacitive article comprising:

a substrate defined by a primary plane;

a first layer of dielectric/polymer material formed on the substrate, the first layer having trenches cut in a direction substantially perpendicular to the primary plane;

planar metal regions formed on the sidewalls of the trenches such that planar strip portions of areas form electrically conductive regions of a capacitive element that are aligned substantially perpendicularly with respect to the primary plane; and

a region of dielectric material in the trenches, positioned between the metal layers on the sidewalls;

wherein the planar metal regions are comprised of gold, aluminum and/or copper, and include a layer of about 0.5 um to about 2 um in thickness.

32. The capacitive article of claim 31 wherein the region of dielectric material is dielectric layer of about 10 to about 20 micrometers in thickness.

33. The capacitive article of claim 31 , wherein the region of dielectric material is a polyimide layer formed by spin coating or baking.

34. The capacitive article of claim 31 , wherein opposed/paired sets of the areas of the metal layer disposed on the sidewalls of the trenches form plates of the capacitive element.

35. The capacitive article of claim 31 wherein the capacitive element comprises a metal-insulator-metal (MIM) device, wherein a capacitive relationship exists between paired areas of the metal layer on the sidewalls of the trenches, with an insulating region being a portion of a high k dielectric insulating material formed the dielectric material within the trench.

36. The capacitive article of claim 31 wherein the region of dielectric material includes a high k dielectric insulating material being one or more materials selected from a group of materials composed of Al 2 0 3 , Ta 2 O 5 , and HfO x , where x is about 1 to about 2.

37. A capacitive article comprising:

a substrate defined by a primary plane;

a first layer of dielectric/polymer material formed on the substrate, the first layer having trenches cut in a direction substantially perpendicular to the primary plane;

planar metal regions formed on the sidewalls of the trenches such that planar strip portions of areas form electrically conductive regions of a capacitive element that are aligned substantially perpendicularly with respect to the primary plane; and

a region of dielectric material in the trenches, positioned between the metal layers on the sidewalls;

wherein the region of dielectric material is dielectric layer of about 10 to about 20 micrometers in thickness.

38. The capacitive article of claim 37 , wherein the region of dielectric material is a polyimide layer formed by spin coating or baking.

39. The capacitive article of claim 37 , wherein opposed/paired sets of the areas of the metal layer disposed on the sidewalls of the trenches form plates of the capacitive element.

40. The capacitive article of claim 37 wherein the capacitive element comprises a metal-insulator-metal (MIM) device, wherein a capacitive relationship exists between paired areas of the metal layer on the sidewalls of the trenches, with an insulating region being a portion of a high k dielectric insulating material formed the dielectric material within the trench.

41. The capacitive article of claim 37 wherein the region of dielectric material includes a high k dielectric insulating material being one or more materials selected from a group of materials composed of Al 2 O 3 , Ta 2 O 5 , and HfO x , where x is about 1 to about 2.

42. A capacitive article comprising:

a substrate defined by a primary plane;

a first layer of dielectric/polymer material formed on the substrate, the first layer having trenches cut in a direction substantially perpendicular to the primary plane;

planar metal regions formed on the sidewalls of the trenches such that planar strip portions of areas form electrically conductive regions of the capacitive element that are aligned substantially perpendicularly with respect to the primary plane; and

a region of dielectric material in the trenches, positioned between the metal regions on the sidewalls;

wherein the capacitive element comprises a metal-insulator-metal (MIM) device, wherein a capacitive relationship exists between paired areas of the metal regions on the sidewalls of the trenches, with an insulating region being a portion of a high k dielectric insulating material forming the region of dielectric material within the trenches.

43. The article of claim 42 , wherein the capacitive element comprises a large surface area MIM capacitor.

44. A capacitive article comprising:

a substrate defined by a primary plane;

a first layer of dielectric/polymer material formed on the substrate, the first layer having trenches cut in a direction substantially perpendicular to the primary plane;

planar metal regions formed on the sidewalls of the trenches such that planar strip portions of areas form electrically conductive regions of the capacitive element that are aligned substantially perpendicularly with respect to the primary plane; and

a region of dielectric material in the trenches, positioned between the metal layers on the sidewalls;

wherein the capacitive element comprises a switch-controlled variable MIM capacitor.

45. A capacitive article comprising:

a substrate defined by a primary plane;

a first layer of dielectric/polymer material formed on the substrate, the first layer having trenches cut in a direction substantially perpendicular to the primary plane;

planar metal regions formed on the sidewalls of the trenches such that planar strip portions of areas form electrically conductive regions of the capacitive element that are aligned substantially perpendicularly with respect to the primary plane; and

a region of dielectric material in the trenches, positioned between the metal layers on the sidewalls;

wherein the region of dielectric material includes a high k dielectric insulating material being one or more materials selected from a group of materials composed of Al 2 O 3 , Ta 2 O 5 , and HfO x , where x is about 1 to about 2.

46. The capacitive article of claim 45 wherein the region of dielectric material is a polyimide layer formed by spin coating or baking.

47. The capacitive article of claim 45 wherein opposed/paired sets of the areas of the metal layer disposed on the sidewalls of the trenches form plates of the capacitive element.

48. The capacitive article of claim 47 wherein the region of dielectric material is a polyimide layer formed by spin coating or baking.

49. The capacitive article of claim 45 wherein the capacitive element comprises a metal-insulator-metal (MIM) device, wherein a capacitive relationship exists between paired areas of the metal layer on the sidewalls of the trenches, with an insulating region being a portion of a high k dielectric insulating material forming the region of dielectric material within the trenches.

50. The capacitive article of claim 49 wherein the capacitive element comprises a large surface area MIM capacitor.

51. The capacitive article of claim 45 wherein the capacitive element comprises a switch-controlled variable MIM capacitor.

52. A resistive article substantially comprised of a Titanium or Tantalum base metal material and a nitridization compound including about 30 to about 60 percentage of nitrogen by weight of Titanium or Tantalum, and trace amounts of oxygen introduced into an ambient.

53. The resistive article of claim 52 , wherein the resistive element substantially comprises TiN x O y , where x is about 1 to about 2, and y is about 0.1 to about 0.3.

54. The resistive article of claim 52 , wherein the resistive element substantially comprises TaN x O y , where is about 1 to about 2, and y is about 0.1 to about 0.3.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: SILICON STORAGE TECHNOLOGY, INC.
Reel/Frame 059687/0344 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: SILICON STORAGE TECHNOLOGY, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041675/0316 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 7, 2007
From: CHEN, BOMY; WANG, LONG CHING; FANG, SYCHYI
To: SILICON STORAGE TECHNOLOGY, INC.,
Reel/Frame 019799/0684 →