Generalized BIST for multiport memories
View Patent ↗A generalized hardware architecture that supports built-in self testing (BIST) for a range of different computer memory configurations and a generalized BIST algorithm can be compiled, based on specified configuration characteristics (e.g., the number of write ports, the number of read ports, the number of entries, and the number of bits per entry in the computer memory), to generate the hardware design for a particular computer memory system. In one embodiment, the generalized hardware architecture includes a multiplexer block that enables a single BIST comparator to be multiplexed for use in performing BIST testing via different read ports of the computer memory.
1. A computer-implemented method, implemented by a computer-based, automated design tool, for designing BIST circuitry for testing a memory having one or more write ports and one or more read ports, the computer-implemented method comprising:
(a) receiving, by the design tool, one or more values for one or more memory configuration parameters for the memory, the one or more memory configuration parameters comprising a number of write ports for the memory and a number of read ports for the memory; and
(b) generating, by the design tool, a hardware design for the BIST circuitry by the design tool compiling a generic BIST algorithm based on the numbers of read and write ports for the memory.
2. The method of claim 1 , wherein:
the design tool is limited to designing the BIST circuitry having a maximum value for the total number of write and read ports; and
step (a) comprises receiving the numbers of write and read ports, wherein the sum of the received numbers of write and read ports is less than or equal to the maximum value.
3. The method of claim 1 , wherein:
the one or more memory configuration parameters further comprise a number of bits per memory entry and a number of entries in the memory;
step (a) further comprises receiving values for the number of bits per memory entry and the number of entries in the memory; and
step (b) further comprises generating, by the design tool, the hardware design for the BIST circuitry by the design tool compiling the generic BIST algorithm based on the number of bits per memory entry and the number of entries in the memory.
4. The method of claim 1 , wherein:
the design tool is adapted to compile the generic BIST algorithm based on different sets of the memory configuration parameter values to generate different BIST circuitry hardware designs corresponding to different memory configurations; and
the method further comprises:
(c) receiving, by the design tool, one or more different values for one or more memory configuration parameters for a different memory configuration; and
(d) generating, by the design tool, a different hardware design for different BIST circuitry by the design tool compiling the generic BIST algorithm based on the one or more different values for the one or more memory configuration parameters for the different memory configuration.
5. The method of claim 4 , wherein:
the design tool is limited to designing the BIST circuitry having a maximum value for the total number of write and read ports; and
step (a) comprises receiving the numbers of write and read ports, wherein the sum of the received numbers of write and read ports is less than or equal to the maximum value.
6. The method of claim 1 , wherein step (b) comprises generating, by the design tool, the hardware design for the BIST circuitry to test (i) memory cells in the memory, (ii) one or more read port decoders for the memory, and (iii) one or more write port decoders for the memory.
7. The lull method of claim 6 , wherein step (b) comprises generating, by the design tool, the hardware design for the BIST circuitry to further test (iv) bit-write enabling for the memory and (v) a comparator of the BIST circuitry.
8. The method of claim 7 , wherein the step (b) comprises generating, by the design tool, the hardware design for the BIST circuitry to perform BIST testing that comprises:
a first test phase adapted to test the memory cells and the one or more read port decoders;
a second test phase adapted to test the one or more write port decoders; and
a third test phase adapted to test the bit-write enabling and the comparator.
9. The method of claim 6 , wherein:
the memory has two or more write ports and two or more write port decoders; and
step (b) comprises generating, by the design tool, the hardware design for the BIST circuitry to perform BIST testing for the write port decoders that involves cycling through the different write port decoders.
10. The method of claim 6 , wherein:
the memory has two or more read ports and two or more read port decoders; and
step (b) comprises generating, by the design tool, the hardware design for the BIST circuitry to perform BIST testing for the read port decoders that involves cycling through the different read port decoders.
11. The method of claim 1 , wherein:
the memory has multiple read ports; and
step (b) comprises:
(b1) including, in the hardware design for the BIST circuitry, a multiplexer block adapted to receive data from each of the multiple read ports and output selected data from one of the multiple read ports; and
(b2) including, in the hardware design for the BIST circuitry, a comparator adapted to compare the selected data from the multiplexer block with expected data to determine whether the selected data matches the expected data.
12. The method of claim 11 , wherein step (b) further comprises including, in the hardware design for the BIST circuitry, a controller adapted to generate and update a mux select signal to cause the multiplexer block to sequentially select data from different ones of the multiple read ports.
13. The storage medium of claim 1 , wherein the design tool generates the hardware design for the BIST circuitry to accommodate port to port interactions.
14. A non-transitory computer-readable storage medium, having encoded thereon program code, wherein, when the program code is executed by a computer, the computer implements a design tool for designing BIST circuitry for testing a memory having one or more write ports and one or more read ports, wherein the design tool:
receives one or more values for one or more memory configuration parameters for the memory, the one or more memory configuration parameters comprising a number of write ports for the memory and a number of read ports for the memory; and
generates a hardware design for the BIST circuitry by compiling a generic BIST algorithm based on the numbers of read and write ports for the memory.
15. The storage medium of claim 14 , wherein the design tool generates the hardware design for the BIST circuitry to test (i) memory cells in the memory, (ii) one or more read port decoders for the memory, and (iii) one or more write port decoders for the memory.
16. The storage medium of claim 15 , wherein the design tool generates the hardware design for the BIST circuitry to further test (iv) bit-write enabling for the memory and (v) a comparator of the BIST circuitry.
17. The storage medium of claim 16 , wherein the the design tool generates the hardware design for the BIST circuitry to perform BIST testing that comprises:
a first test phase adapted to test the memory cells and the one or more read port decoders;
a second test phase adapted to test the one or more write port decoders; and
a third test phase adapted to test the bit-write enabling and the comparator.
18. The storage medium of claim 15 , wherein:
the memory has two or more write ports and two or more write port decoders; and
the design tool generates the hardware design for the BIST circuitry to perform BIST testing for the write port decoders that involves cycling through the different write port decoders.
19. The storage medium of claim 15 , wherein:
the memory has two or more read ports and two or more read port decoders; and
the design tool generates the hardware design for the BIST circuitry to perform BIST testing for the read port decoders that involves cycling through the different read port decoders.
20. The storage medium of claim 14 , wherein the design tool generates the hardware design for the BIST circuitry to accommodate port to port interactions.
21. A method for designing BIST circuitry for testing a memory having one or more write ports and one or more read ports, the method comprising:
assigning one or more values for one or more memory configuration parameters for the memory; and
compiling a generic BIST algorithm based on the one or more memory configuration parameters to generate a design for the BIST circuitry, the generic BIST algorithm adapted to test i) memory cells in the memory, ii) one or more read port decoders for the memory, iii) one or more write port decoders for the memory, and iv) bit-write enabling for the memory and a comparator of the BIST circuitry, the generic BIST algorithm comprising:
a first test phase adapted to test the memory cells and the one or more read port decoders;
a second test phase adapted to test the one or more write port decoders; and
a third test phase adapted to test the bit-write enabling and the comparator.
22. A method for designing BIST circuitry for testing a memory having one or more write ports and one or more read ports, the method comprising:
assigning one or more values for one or more memory configuration parameters for the memory, the memory including two or more write ports and two or more write port decoders;
compiling a generic BIST algorithm based on the one or more memory configuration parameters to generate a design for the BIST circuitry, the generic BIST algorithm adapted to test memory cells in the memory, one or more read port decoders for the memory, and the write port decoders for the memory; and
testing for the write port decoders involves cycling through the different write port decoders.
23. A method for designing BIST circuitry for testing a memory having one or more write ports and one or more read ports, the method comprising:
assigning one or more values for one or more memory configuration parameters for the memory, the memory including two or more read ports and two or more read port decoders;
compiling a generic BIST algorithm based on the one or more memory configuration parameters to generate a design for the BIST circuitry, the generic BIST algorithm adapted to test memory cells in the memory, the read port decoders for the memory, and one or more write port decoders for the memory; and
testing for the read port decoders involves cycling through the different read port decoders.