IP Library Granted Patent US 7,652,909
Granted Patent B2
US 7,652,909 · App. 11/875,922 · Granted Jan 26, 2010

2T/2C ferroelectric random access memory with complementary bit-line loads

Assignee: Ramtron International Corporation
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Quick Facts
Patent No.
US 7,652,909
App. No.
11/875,922
Granted
Jan 26, 2010
Kind
B2
Abstract

The signal margin of a small array 2T/2C memory is increased by writing the ferroelectric load capacitors on the bit lines to complementary states. A ferroelectric memory array includes rows and columns of 2T/2C memory cells, wherein each column of the memory array includes a first memory subcell having a first node coupled to a word line, a second node coupled to a first bit line, and a third node coupled to a first plate line, the first memory cell being poled in a first direction; a second memory subcell having a first node coupled to the word line, a second node coupled to a second bit line, and a third node coupled to the first plate line, the second memory cell being poled in a second direction; a first load subcell having a first node coupled to the word line, a second node coupled to the first bit line, and a third node coupled to a second plate line, the first load cell being poled in the first direction; and a second load subcell having a first node coupled to the word line, a second node coupled to a second bit line, and a third node coupled to the second plate line, the second load cell being poled in the second direction.

Claims (37)

1. A 2T/2C ferroelectric memory cell and load thereof comprising:

a first memory subcell having a first node coupled to a word line, a second node coupled to a first bit line, and a third node coupled to a first plate line, the first memory cell being poled in a first direction;

a second memory subcell having a first node coupled to the word line, a second node coupled to a second bit line, and a third node coupled to the first plate line, the second memory cell being poled in a second direction;

a first load subcell having a first node coupled to the word line, a second node coupled to the first bit line, and a third node coupled to a second plate line, the first load cell being poled in the first direction; and

a second load subcell having a first node coupled to the word line, a second node coupled to a second bit line, and a third node coupled to the second plate line, the second load cell being poled in the second direction.

2. The 2T/2C ferroelectric memory cell of claim 1 wherein the first memory subcell and the second memory subcell each comprise a transistor coupled to a ferroelectric capacitor.

3. The 2T/2C ferroelectric memory cell of claim 1 wherein the first load subcell and the second load subcell each comprise a transistor coupled to a ferroelectric capacitor.

4. The 2T/2C ferroelectric memory cell of claim 1 further comprising a sense amplifier coupled to the first and second bit lines.

5. The 2T/2C ferroelectric memory cell of claim 4 wherein the sense amplifier receives a sense amplifier enable signal.

6. The 2T/2C ferroelectric memory cell of claim 1 further comprising first and second precharge transistors respectively coupled to the first and second bit lines.

7. The 2T/2C ferroelectric memory cell of claim 6 wherein the first and second precharge transistors each receive a precharge control signal.

8. A 2T/2C ferroelectric memory array comprising a plurality of rows and columns of 2T/2C memory cells, wherein each column of the memory array comprises:

a first memory subcell having a first node coupled to a word line, a second node coupled to a first bit line, and a third node coupled to a first plate line, the first memory cell being poled in a first direction;

a second memory subcell having a first node coupled to the word line, a second node coupled to a second bit line, and a third node coupled to the first plate line, the second memory cell being poled in a second direction;

a first load subcell having a first node coupled to the word line, a second node coupled to the first bit line, and a third node coupled to a second plate line, the first load cell being poled in the first direction; and

a second load subcell having a first node coupled to the word line, a second node coupled to a second bit line, and a third node coupled to the second plate line, the second load cell being poled in the second direction.

9. The 2T/2C ferroelectric memory array of claim 8 wherein the first memory subcell and the second memory subcell each comprise a transistor coupled to a ferroelectric capacitor.

10. The 2T/2C ferroelectric memory array of claim 8 wherein the first load subcell and the second load subcell each comprise a transistor coupled to a ferroelectric capacitor.

11. The 2T/2C ferroelectric memory array of claim 8 further comprising a sense amplifier coupled to the first and second bit lines.

12. The 2T/2C ferroelectric memory array of claim 11 wherein the sense amplifier receives a sense amplifier enable signal.

13. The 2T/2C ferroelectric memory array of claim 8 further comprising first and second precharge transistors respectively coupled to the first and second bit lines.

14. The 2T/2C ferroelectric memory array of claim 13 wherein the first and second precharge transistors each receive a precharge control signal.

15. A method of operating a 2T/2C memory comprising:

providing a 2T/2C memory cell coupled to a word line, a first bit line, a second bit line, and a first plate line;

poling a ferroelectric capacitor associated with the first bit line in the 2T/2C memory cell in a first direction;

poling a ferroelectric capacitor associated with the second bit line in the 2T/2C memory cell in a second direction;

providing a 2T/2C load cell coupled to the word line, the first bit line, the second bit line, and a second plate line;

poling a ferroelectric capacitor associated with the first bit line in the 2T/2C load cell in the first direction; and

poling a ferroelectric capacitor associated with the second bit line in the 2T/2C load cell in the second direction.

16. The method of claim 15 further comprising multiply pulsing the first and second plate lines during a write mode of operation.

17. The method of claim 15 further comprising multiply pulsing the first and second plate lines during a read mode of operation.

18. The method of claim 15 further comprising sensing the charge on the first and second bit lines.

19. The method of claim 15 further comprising precharging the first and second bit lines.

20. A ferroelectric memory comprising:

a 2T/2C memory cell having first ferroelectric capacitor and second ferroelectric capacitor, said first and second ferroelectric capacitor being oppositely poled; and

a 2T/2C load cell having third ferroelectric capacitor and fourth ferroelectric capacitor, said third and fourth ferroelectric capacitors being oppositely poled,

wherein the first and third ferroelectric capacitors are associated with a first bit line and are similarly poled, and the second and fourth ferroelectric capacitors are associated with a second bit line and are similarly poled.

Assignments (8)
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
RELEASE OF SECURITY INTEREST Recorded Dec 22, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 041175/0939 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2016
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MONTEREY RESEARCH, LLC
Reel/Frame 040908/0960 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
RELEASE Recorded Mar 9, 2015
From: SILICON VALLEY BANK
To: RAMTRON INTERNATIONAL CORPORATION
Reel/Frame 035198/0959 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 5, 2012
From: RAMTRON INTERNATIONAL CORPORATION
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 029408/0437 →
SECURITY AGREEMENT Recorded Mar 21, 2012
From: RAMTRON INTERNATIONAL CORPORATION
To: SILICON VALLEY BANK
Reel/Frame 027905/0963 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 21, 2007
From: DU, XIAO HONG
To: RAMTRON INTERNATIONAL CORPORATION
Reel/Frame 019990/0333 →
Continuity (1)
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