Method for fabricating metallic bit-line contacts
View Patent ↗A memory cell and method of forming the same is provided. To make contact between a bit line and a select transistor of a dynamic memory unit on a semiconductor wafer, a contact hole is filled with a metal or a metal alloy. A liner layer may be introduced between the semiconductor substrate and the metal filling. The semiconductor substrate has a doped region in the contact hole.
1. An integrated circuit comprising a memory cell formed on a substrate, the memory cell comprising:
a storage capacitor; and
a select transistor, comprising:
a diffusion region forming a source/drain electrode of the select transistor;
a bit-line contact formed in an insulator layer and comprising a filling comprising at least one of a metal and a metal alloy, wherein the bit-line contact connects the source/drain electrode to an associated bit line; and
a doped region formed within the source/drain electrode, wherein at least a portion of the source/drain electrode disposed between the doped region and the substrate prevents any contact between the doped region and the substrate.
2. The integrated circuit of claim 1 , wherein the select transistor is at least partially disposed in the substrate and the storage capacitor is completely disposed in the substrate.
3. The integrated circuit claim 1 , wherein the bit-line contact comprises at least one of tungsten, aluminum and copper.
4. The integrated circuit claim 1 , wherein the memory cell is part of a memory cell arrangement comprising peripheral contacts formed in a same structure plane and comprising a filling substantially similar to that of the bit-line contact.
5. The integrated circuit claim 1 , wherein the bit-line contact further comprises a liner layer formed between the substrate and the filling of the bit-line contact.
6. The integrated circuit claim 5 , wherein the liner layer comprises at least one of Ti and Ti/TiN.
7. An integrated circuit comprising a memory cell formed on a substrate, the memory cell comprising:
a select transistor, comprising:
a diffusion region forming a source/drain electrode of the select transistor;
a bit-line contact formed in an insulator layer and comprising a filling comprising at least one of a metal and a metal alloy, wherein the bit-line contact connects the source/drain electrode to an associated bit line; and
a doped region between the substrate and the filling of the bit-line contact, wherein at least a portion of the source/drain electrode disposed between the doped region and the substrate prevents any contact between the doped region and the substrate.
8. The integrated circuit of claim 7 , wherein the doped region is formed on the source/drain electrode.
9. The integrated circuit of claim 7 , wherein the select transistor is at least partially disposed in the substrate and wherein the memory cell further comprises a storage capacitor is completely disposed in the substrate.
10. The integrated circuit claim 7 , wherein the bit-line contact comprises at least one of tungsten, aluminum and copper.
11. The integrated circuit claim 7 , wherein the memory cell is part of a memory cell arrangement comprising peripheral contacts formed in a same structure plane and comprising a filling substantially similar to that of the bit-line contact.
12. The integrated circuit claim 7 , wherein the bit-line contact further comprises a liner layer formed between the substrate and the filling of the bit-line contact.
13. The integrated circuit claim 12 , wherein the liner layer comprises at least one of Ti and Ti/TiN.
14. An integrated circuit comprising a memory cell formed on a substrate, the memory cell comprising:
a select transistor, comprising:
a diffusion region forming a source/drain electrode of the select transistor;
a bit-line contact formed in an insulator layer and comprising a filling comprising at least one of a metal and a metal alloy, wherein the bit-line contact connects the source/drain electrode to an associated bit line;
a doped region formed within the source/drain electrode between the substrate and the filling of the bit-line contact, wherein at least a portion of the source/drain electrode disposed between the doped region and the substrate prevents any contact between the doped region and the substrate; and
an annealed region formed as a result of an anneal process performed during fabrication of the bit-line contact.
15. The integrated circuit claim , wherein the annealed region includes a damaged region damaged during a doping processed performed to form the doped region.
16. The integrated circuit claim 14 , wherein the annealed region includes at least a portion of the doped region.
17. The integrated circuit claim 14 , wherein the bit-line contact further comprises a liner layer formed between the substrate and the filling of the bit-line contact.
18. The integrated circuit claim 17 , wherein the liner layer comprises at least one of Ti and Ti/TiN.
19. The integrated circuit claim 14 , wherein another source/drain electrode of the select transistor is connected to an electrode of a storage capacitor which is completely disposed in the substrate.