Patent Assignment
Reel/Frame 036723/0021
Assignment of Assignor's Interest
Recorded: 2015-09-30
Received: 2015-09-30
Pages: 13
Assignor
INFINEON TECHNOLOGIES AG
Executed: 2015-07-08
Assignee
POLARIS INNOVATIONS LIMITED
29 EARLSFORT TERRACE, DUBLIN 2, DUBLIN, IEX, IRELAND
Covered Properties
(100)
Method for Fabricating Metallic Bit-Line Contacts
Application:
11/929,215 →
Dram Cell Arrangement with Vertical Mos Transistors
Application:
11/158,439 →
Semiconductor Memory Element, Semiconductor Memory Element Arrangement, Method for Fabricating a Semiconductor Memory Element and Method for Operating a Semiconductor Memory Element
Application:
10/486,184 →
Arrangement of Microstructures
Application:
10/972,804 →
Biocompatible Microchip and a Method for Producing the Same
Application:
10/491,143 →
Trench Isolation Having a Self-Adjusting Surface Seal and Method for Producing One Such Trench Isolation
Application:
10/485,984 →
Field Effect Transistor and Method for Fabricating It
Application:
10/482,331 →
Photolithographic Mask Having Half Tone Main Features and Perpendicular Half Tone Assist Features
Application:
10/487,911 →
Memory for Producing a Memory Component
Application:
10/480,999 →
Electronic Chip and Electronic Chip Assembly
Application:
10/479,735 →
Molecular Electronics Arrangement and Method for Producing a Molecular Electronics Arrangement
Application:
10/482,719 →
Arrangement and Method for Conditioning a Polishing Pad
Application:
10/480,807 →
Nanotube Array and Method for Producing a Nanotube Array
Application:
10/476,663 →
Method of Forming an Isolation Layer and Method of Manufacturing a Trench Capacitor
Application:
10/483,423 →
Method for Producing an Electronic Component, Especially a Memory Chip
Application:
10/477,967 →
Dynamic Memory and Method for Testing a Dynamic Memory
Application:
10/478,441 →
Coating Material for Electronic Components
Application:
10/472,772 →
Method for Fabricating Contacts for Integrated Circuits, and Semiconductor Component Having Such Contacts
Application:
10/754,439 →
Dram Cell Arrangement with Vertical Mos Transistors, and Method for Its Fabrication
Application:
10/720,730 →
Testing a Data Store Using an External Test Unit for Generating Test Sequence and Receiving Compressed Test Results
Application:
10/478,403 →
Integrated Dynamic Memory and Operating Method
Application:
10/699,231 →
Method for the Production of an Integrated Circuit
Application:
10/476,355 →
Process for the Back-Surface Grinding of Wafers
Application:
10/696,866 →
Multi-Level Driver Stage
Application:
10/690,001 →
Method for Production of a Metallic or Metal-Containing Layer
Application:
10/692,150 →
Method for Comparing the Address of a Memory Access with an Already Known Address of a Faulty Memory Cell
Application:
10/689,422 →
Method for Writing to the Magnetoresistive Memory Cells of an Integrated Magnetoresistive Semiconductor Memory
Application:
10/685,064 →
Method for Operating an Mram Semiconductor Memory Configuration
Application:
10/685,082 →
Memory Module with a Heat Dissipation Means
Application:
10/682,649 →
Method and Apparatus for Operating a Semiconductor Memory at Double Data Transfer Rate
Application:
10/680,773 →
Method for Adjusting the Overlay of Two Mask Planes in a Photolithographic Process for the Production of an Integrated Circuit
Application:
10/473,434 →
Semiconductor Element Having a Semi-Magnetic Contact
Application:
10/667,730 →
Integrated Circuit Having Electrical Connecting Elements
Application:
10/662,795 →
Sense Amplifier Configuration for a Semiconductor Memory Device
Application:
10/662,634 →
Integrated Dram Memory Component
Application:
10/650,818 →
Method for Etching a Hard Mask Layer and a Metal Layer
Application:
10/647,614 →
Method for Writing to Magnetoresistive Memory Cells and Magnetoresistive Memory Which Can Be Written to by the Method
Application:
10/642,856 →
Method for Producing Ferroelectric Capacitors and Integrated Semiconductor Memory Chips
Application:
10/638,594 →
Method for Exposing at Least One or at Least Two Semiconductor Wafers
Application:
10/635,583 →
Selection Device for a Semiconductor Memory Device
Application:
10/623,824 →
Method for Fabricating Microstructures and Arrangement of Microstructures
Application:
10/606,069 →
Multilayer Phase-Change Type Optical Disc Capable of Recording and Reproducing Information at High Transfer Rate
Application:
10/296,119 →
Integrated Memory and Method for Operating an Integrated Memory
Application:
10/368,081 →
Photolithographic Mask
Application:
10/353,463 →
Resist for Forming a Structure for Aligning an Electron or Ion Beam and Technique for Forming the Structure
Application:
10/340,987 →
Method for Processing a Substrate to Form a Structure
Application:
10/340,047 →
Field Effect Transistor and Fabrication Method
Application:
10/304,134 →
Memory, Processor System and Method for Performing Write Operations on a Memory Region
Application:
10/299,750 →
Method for Reconfiguring a Memory
Application:
10/288,911 →
Apparatus for Assessing a Silicon Dioxide Content
Application:
10/273,521 →
Method for Determining Statistical Fluctuations of Values of Geometrical Properties of Structures Required for the Fabrication of Semiconductor Components
Application:
10/272,848 →
Test Wafer and Method for Producing the Test Wafer
Application:
10/268,203 →
Semiconductor Module Having a Configurable Data Width of an Output Bus, and a Housing Configuration Having a Semiconductor Module
Application:
10/266,322 →
Integrated Memory Device, Method of Operating an Integrated Memory, and Memory System Having a Plurality of Integrated Memories
Application:
10/262,172 →
Method for Producing a Semiconductor Structure, and Use of the Method
Application:
10/261,849 →
Method of Producing Biocompatible Structures and Biocompatible Microchip
Application:
10/262,179 →
Trench Capacitor and Method for Manufacturing the Same
Application:
10/254,692 →
Method of Etching a Layer in a Trench and Method of Fabricating a Trench Capacitor
Application:
10/253,196 →
Integrated Circuit and Method for Operating the Integrated Circuit
Application:
10/245,629 →
Method for fabricating an integrated semiconductor circuit to prefent formation of voids
Application:
10/237,543 →
Method for Fabricating a Trench Capacitor for a Semiconductor Memory
Application:
10/234,547 →
Field-Effect Transistor Having a Contact to One of Its Doping Regions, and Method for Fabricating the Transistor
Application:
10/231,882 →
Mask for Fabricating Semiconductor Components
Application:
10/226,743 →
Method for Producing Transistors in Integrated Semiconductor Circuits
Application:
10/223,034 →
Integrated Memory with Memory Cells in a Plurality of Memory Cell Blocks, and Method of Operating Such a Memory
Application:
10/217,936 →
Electronic Component with Stacked Electronic Elements and Method for Fabricating an Electronic Component
Application:
10/217,185 →
Mehtod for Detecting Removal of Organic Material from a Semiconductor Device in a Manufacturing Process
Application:
10/215,226 →
Method for Forming a Diffusion Region
Application:
10/210,735 →
Method for Filling Trenches in Integrated Semiconductor Circuits
Application:
10/210,374 →
Phenyl-Linked Oxazole Cyanates as Dielectrics Having Good Adhesive and Filling Properties
Application:
10/206,505 →
Device for Cooling Electric or Electronic Devices
Application:
10/202,704 →
Method for Fabricating an Integrated Semiconductor Circuit
Application:
10/207,427 →
Semiconductor Memory with Precharge Control
Application:
10/200,902 →
Method for the Defect Analysis of Memory Modules
Application:
10/200,642 →
Data Generator for Generating Test Data for Word-Oriented Semiconductor Memories
Application:
10/200,633 →
Test of a Semiconductor Memory Having a Plurality of Memory Banks
Application:
10/198,575 →
Integrated Semiconductor Memory and Fabrication Method
Application:
10/195,194 →
Euv Reflection Mask
Application:
10/195,179 →
Memory Cell Having a Second Transistor for Holding a Charge Value
Application:
10/194,877 →
Semiconductor Memory Device Having a Plurality of Memory Areas with Memory Elements
Application:
10/190,812 →
Evaluation Circuit for a Dram
Application:
10/190,814 →
Method and Device for Simultaneous Testing of a Plurality of Integrated Circuits
Application:
10/190,042 →
Method for Adjusting a Temperature in a Resist Process
Application:
10/190,097 →
Electronic Printed Circuit Board Having a Plurality of Identically Designed, Housing-Encapsulated Semiconductor Memories
Application:
10/187,763 →
Negative Resist Process with Simultaneous Development and Chemical Consolidation of Resist Structures
Application:
10/186,652 →
Electronic Component, Tester Device and Method for Calibrating a Tester Device
Application:
10/186,644 →
Chemical Consolidation of Photoresists in the Uv Range
Application:
10/186,651 →
Circuit Configuration and Method for Determining a Time Constant of a Storage Capacitor of a Memory Cell in a Semiconductor Memory
Application:
10/186,599 →
Wafer Handling System and Wafer Handling Method
Application:
10/186,970 →
Method for Fabricating a Semiconductor Memory Device
Application:
10/186,662 →
Feram Memory and Method for Manufacturing It
Application:
10/186,645 →
Method for Fabricating a Semiconductor Memory Device
Application:
10/186,597 →
Process for the Abrasive Machining of Surfaces, in Particular of Semiconductor Wafers
Application:
10/186,971 →
Method of Producing Organic Semiconductors Having High Charge Carrier Mobility Through Pi-Conjugated Crosslinking Groups
Application:
10/186,658 →
Negative Resist Process with Simultaneous Development and Aromatization of Resist Structures
Application:
10/186,648 →
Photoresists with Reaction Anchors for Chemical Consolidation of Resist Structures for Exposures at 157 Nm
Application:
10/186,657 →
Method for Fabricating a Semiconductor Memory Device
Application:
10/186,607 →
Amplification of Resist Structures of Fluorinated Resist Polymers by Structural Growth of the Structures by Targeted Chemical Bonding of Fluorinated Oligomers
Application:
10/186,139 →
Method and Bus System for Synchronizing a Data Exchange Between a Data Source and a Control Device
Application:
10/186,138 →
On Chip Scrambling
Application:
10/186,327 →