IP Library Granted Patent US 8,911,888
Granted Patent B2
US 8,911,888 · App. 11/957,476 · Granted Dec 16, 2014

Three-dimensional magnetic memory with multi-layer data storage layers

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Quick Facts
Patent No.
US 8,911,888
App. No.
11/957,476
Granted
Dec 16, 2014
Kind
B2
Abstract

Magnetic memories and methods are disclosed. A magnetic memory as described herein includes a plurality of stacked data storage layers to form a three-dimensional magnetic memory. The data storage layers are each formed from a multi-layer structure. At ambient temperatures, the multi-layer structures exhibit an antiparallel coupling state with a near zero net magnetic moment. At higher transition temperatures, the multi-layer structures transition from the antiparallel coupling state to a parallel coupling state with a net magnetic moment. At yet higher temperatures, the multi-layer structure transitions from the antiparallel coupling state to a receiving state where the coercivity of the multi-layer structures drops below a particular level so that magnetic fields from write elements or neighboring data storage layers may imprint data into the data storage layer.

Claims (51)

1. A magnetic memory, comprising:

a first storage stack having a first data storage layer defining a first plane and adapted to store bits of data; and

a plurality of secondary storage stacks fabricated on top of one another on the first storage stack, wherein each of the secondary storage stacks includes a second data storage layer defining a secondary plane that is parallel to the first plane and adapted to store bits of data;

wherein the first data storage layer and the second data storage layers are each formed from a multi-layer structure exhibiting an antiparallel coupling state at ambient temperatures.

2. The magnetic memory of claim 1 wherein the multi-layer structure further exhibits a transition from the antiparallel coupling state to a parallel coupling state at a transition temperature that is higher than the ambient temperatures.

3. The magnetic memory of claim 2 wherein the multi-layer structure further exhibits a transition from the antiparallel coupling state to a receiving state at a receiving temperature that is higher than the ambient temperatures and the transition temperature, wherein the receiving state represents a drop in coercivity of the multi-layer structure below a write threshold.

4. The magnetic memory of claim 1 wherein the multi-layer structure comprises:

a first ferromagnetic layer;

an antiparallel coupling layer formed on the first ferromagnetic layer;

a second ferromagnetic layer formed on the antiparallel coupling layer; and

a third ferromagnetic layer formed on the second ferromagnetic layer;

wherein the first ferromagnetic layer is antiparallel coupled to the second ferromagnetic layer and the third ferromagnetic layer at the ambient temperatures;

wherein the first ferromagnetic layer is parallel coupled to the third ferromagnetic layer at a transition temperature that is higher than the ambient temperatures.

5. The magnetic memory of claim 4 wherein the first ferromagnetic layer and the third ferromagnetic layer have a Curie temperature that is higher than the Curie temperature of the second ferromagnetic layer.

6. The magnetic memory of claim 4 wherein the first ferromagnetic layer and the third ferromagnetic layer each comprise multi-layer structures comprised of alternating layers of Co and Pd or Pt.

7. The magnetic memory of claim 4 wherein:

the second ferromagnetic layer comprises a multi-layer structure comprised of alternating layers of CoNi and Pd or Pt; and

the antiparallel coupling layer is comprised of Ru or Ir.

8. A method of fabricating a magnetic memory, the method comprising:

forming a first storage stack that includes a first data storage layer defining a first plane and adapted to store bits of data; and

forming a plurality of secondary storage stacks on top of one another on the first storage stack, wherein each of the secondary storage stacks includes a second data storage layer defining a secondary plane that is parallel to the first plane and adapted to store bits of data;

wherein the first data storage layer and the second data storage layers are each formed from a multi-layer structure exhibiting an antiparallel coupling state at ambient temperatures.

9. The method of claim 8 wherein the multi-layer structure further exhibits a transition from the antiparallel coupling state to a parallel coupling state at a transition temperature that is higher than the ambient temperatures.

10. The method of claim 9 wherein the multi-layer structure further exhibits a transition from the antiparallel coupling state to a receiving state at a receiving temperature that is higher than the ambient temperatures and the transition temperature, wherein the receiving state represents a drop in coercivity of the multi-layer structure below a write threshold.

11. The method of claim 10 wherein:

forming a first storage stack comprises forming a first heating layer, forming the first data storage layer, and forming a first insulating layer; and

forming a plurality of secondary storage stacks comprises forming a second heating layer, forming the second data storage layer, and forming a second insulating layer.

12. The method of claim 8 wherein forming the multi-layer structure of the first data storage layer or the second data storage layer comprises:

forming a first ferromagnetic layer;

forming an antiparallel coupling layer on the first ferromagnetic layer;

forming a second ferromagnetic layer on the antiparallel coupling layer; and

forming a third ferromagnetic layer on the second ferromagnetic layer;

wherein the first ferromagnetic layer is antiparallel coupled to the second ferromagnetic layer and the third ferromagnetic layer at the ambient temperatures;

wherein the first ferromagnetic layer is parallel coupled to the third ferromagnetic layer at a transition temperature that is higher than the ambient temperatures.

13. The method of claim 12 wherein the first ferromagnetic layer and the third ferromagnetic layer have a Curie temperature that is higher than the second ferromagnetic layer.

14. The method of claim 12 wherein:

forming the first ferromagnetic layer comprises forming alternating layers of Co and Pd or Pt; and

forming the third ferromagnetic layer comprises forming alternating layers of Co and Pd or Pt.

15. The method of claim 14 wherein:

forming the second ferromagnetic layer comprises forming alternating layers of CoNi and Pd or Pt; and

forming the antiparallel coupling layer comprises forming a layer of Ru or Ir.

16. A magnetic memory, comprising:

a first storage stack including a first data storage layer defining a first plane and adapted to store bits of data, wherein the first data storage layer is formed from a multi-layer structure exhibiting an antiparallel coupling state at ambient temperatures;

a second storage stack proximate to the first storage stack, wherein the second storage stack includes a second data storage layer defining a second plane that is parallel to the first plane and is adapted to store bits of data, and wherein the second data storage layer is formed from a multi-layer structure exhibiting an antiparallel coupling state at the ambient temperatures; and

a third storage stack proximate to the second storage stack, wherein the third storage stack includes a third data storage layer defining a third plane that is parallel to the first and second planes and is adapted to store bits of data, and wherein the third data storage layer is formed from a multi-layer structure exhibiting an antiparallel coupling state at the ambient temperatures.

17. The magnetic memory of claim 16 wherein the multi-layer structure of the first data storage layer includes:

a first ferromagnetic layer;

an antiparallel coupling layer formed on the first ferromagnetic layer;

a second ferromagnetic layer formed on the antiparallel coupling layer; and

a third ferromagnetic layer formed on the second ferromagnetic layer;

wherein the first ferromagnetic layer and the third ferromagnetic layer of the multi-layer structure have a Curie temperature that is higher than the Curie temperature of the second ferromagnetic layer.

Assignments (12)
SECURITY AGREEMENT (SUPPLEMENTAL) Recorded Nov 14, 2024
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 069411/0208 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 11, 2024
From: SANDISK TECHNOLOGIES, INC.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 069168/0273 →
PATENT COLLATERAL AGREEMENT Recorded Aug 23, 2024
From: SANDISK TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS THE AGENT
Reel/Frame 068762/0494 →
CHANGE OF NAME Recorded Jun 27, 2024
From: SANDISK TECHNOLOGIES, INC.
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 067982/0032 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 29, 2024
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 067567/0682 →
PATENT COLLATERAL AGREEMENT - DDTL LOAN AGREEMENT Recorded Aug 21, 2023
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 067045/0156 →
PATENT COLLATERAL AGREEMENT - A&R LOAN AGREEMENT Recorded Aug 21, 2023
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 064715/0001 →
RELEASE OF SECURITY INTEREST AT REEL 052915 FRAME 0566 Recorded Feb 8, 2022
From: JPMORGAN CHASE BANK, N.A.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 059127/0001 →
SECURITY INTEREST Recorded Feb 6, 2020
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS AGENT
Reel/Frame 052915/0566 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2016
From: HGST NETHERLANDS B.V.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 040826/0821 →
CHANGE OF NAME Recorded Oct 25, 2012
From: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
To: HGST NETHERLANDS B.V.
Reel/Frame 029341/0777 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 16, 2007
From: HELLWIG, OLAV; TERRIS, BRUCE D.; THIELE, JAN-ULRICH
To: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS, B.V.
Reel/Frame 020266/0598 →