IP Library Granted Patent US 8,568,856
Granted Patent B2
US 8,568,856 · App. 11/992,209 · Granted Oct 29, 2013

Two-layer flexible substrate

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Quick Facts
Patent No.
US 8,568,856
App. No.
11/992,209
Granted
Oct 29, 2013
Kind
B2
Abstract

The invention provides a two-layer flexible substrate free of surface defects and having excellent etching characteristics and adherence to a resist. The two-layer flexible substrate has a copper layer provided on one or both faces of an insulator film without using an adhesive, wherein the surface roughness (Ra) of the copper layer is 0.10 to 0.25 μm, and wherein the average crystal grain size [of copper] is no greater than 0.8 μm at 1 μm from the insulator film in the cross-section of the copper layer. Preferably, the insulator film is a polyimide film.

Claims (6)

1. A layered flexible substrate comprising a copper layer provided on one or both faces of an insulator film without using an adhesive, wherein the surface roughness (Ra) of the copper layer is 0.10 to 0.25 μm and the average crystal grain size of the copper is no greater than 0.8 μm up to a position of 1 μm from the insulator film in the cross-section of the copper layer and the copper layer has a glossy surface and is free of surface defects.

2. The layered flexible substrate according to claim 1 , wherein the insulator film is a polyimide film.

3. The layered flexible substrate according to claim 1 , wherein the average crystal grain size of copper is from 0.2 to 0.7 μm at a distance less than 1 μm from the insulator film.

4. The layered flexible substrate according to claim 1 , wherein the surface roughness (Ra) of the copper layer is from 0.12 to 0.24 μm and the average crystal grain size of the copper is from 0.2 to 0.7 μm at 1 μm from the insulator film in the cross-section of the copper layer.

5. The layered flexible substrate according to claim 1 , wherein the insulator film is a polyester film.

6. The layered flexible substrate according to claim 1 , consisting of the insulator film, an underlying metal layer formed on the insulator film and the copper layer formed on the underlying metal layer.

Assignments (5)
CHANGE OF ADDRESS Recorded Aug 11, 2021
From: JX NIPPON MINING & METALS CORPORATION
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 057160/0114 →
CHANGE OF ADDRESS Recorded Feb 7, 2017
From: JX NIPPON MINING & METALS CORPORATION
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 041649/0733 →
CHANGE OF NAME Recorded Jun 12, 2014
From: NIPPON MINING HOLDINGS, INC.
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 033091/0316 →
MERGER AND CHANGE OF NAME Recorded May 29, 2014
From: NIPPON MINING & METALS CO., LTD.; NIPPON MINING HOLDINGS INC.
To: NIPPON MINING HOLDINGS INC.
Reel/Frame 033053/0755 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 11, 2008
From: TSUCHIDA, KATSUYUKI; KOBAYASHI, HIRONORI; MURAKAMI, RYU; KUMAGAI, MASASHI
To: NIPPON MINING & METALS CO., LTD.
Reel/Frame 021964/0259 →