Systems and methods for minimizing static leakage of an integrated circuit
View Patent ↗A leakage manager system for adequately minimizing static leakage of an integrated circuit is disclosed. The leakage manager system includes a generator configured to generate a control signal to be applied to a sleep transistor. A monitor is configured to determine whether to adjust the control signal to adequately minimize the static leakage. In some embodiments, the monitor includes an emulated sleep transistor. A regulator is configured to adjust the control signal depending on the determination.
1. An integrated circuit comprising:
two power supply terminals configured to power the integrated circuit, said power supply terminals including a V dd positive supply terminal and a V SS ground terminal together defining a range of logic levels;
a logic component, said logic component being a selected one of a logic gate and a storage cell, and said logic component including a sleep transistor in series with an electrical connection to one of said power supply terminals;
a voltage generator configured to selectively generate a voltage outside said range of logic levels;
circuitry configured to apply said voltage outside the range of logic levels to said sleep transistor to minimize leakage current through the sleep transistor during a power down mode and to apply another voltage outside the range of logic levels to said sleep transistor when in a mode other than said power down mode; and
a voltage regulator configured to control said voltage generator to adequately minimize leakage current through said sleep transistor during said power down mode.
2. The integrated circuit as claimed in claim 1 wherein said one of said power supply terminals is the V SS terminal, said voltage outside the range of logic levels is a voltage lower than V SS , and said sleep transistor is an n-channel transistor.
3. The integrated circuit as claimed in claim 2 wherein said circuitry applies a voltage greater than V dd to said sleep transistor when in the mode other than said power down mode.
4. The integrated circuit as claimed in claim 1 wherein said logic gate is an inverter.
5. The integrated circuit as claimed in claim 1 wherein said storage cell is a flip-flop.
6. The integrated circuit as claimed in claim 1 wherein said voltage generator comprises a charge pump circuit.
7. The integrated circuit as claimed in claim 6 wherein said voltage regulator enables said charge pump circuit when the magnitude of said voltage outside the range of logic levels is insufficient to adequately minimize leakage through said sleep transistor, and disables said charge pump circuit when the magnitude of said voltage outside the range of logic levels is enough to adequately minimize leakage through said sleep transistor.
8. The integrated circuit as claimed in claim 1 wherein said voltage regulator includes an emulated sleep transistor.
9. The integrated circuit as claimed in claim 1 wherein said voltage regulator includes an emulated sleep transistor configured to be biased at said voltage outside the range of logic levels and another emulated sleep transistor configured to be biased at said voltage outside the range of logic levels with a voltage offset.
10. The integrated circuit as claimed in claim 9 wherein said voltage regulator is configured to adjust said voltage outside the range of logic levels to equalize a voltage drop on said emulated sleep transistors.
11. The integrated circuit as claimed in claim 1 wherein said voltage regulator includes an emulated sleep transistor configured to be biased at said voltage outside the range of logic levels and a capacitor configured to be charged to said one of the power supply terminals and discharged to the other of said power supply terminals through said emulated sleep transistor.
12. The integrated circuit as claimed in claim 11 wherein said voltage regulator is configured to adjust said voltage outside the range of logic levels to a level that maximizes the amount of time required to discharge said capacitor through said emulated sleep transistor.
13. The integrated circuit as claimed in claim 1 wherein said sleep transistor has a similar threshold voltage as other transistors in said logic components.
14. The integrated circuit as claimed in claim 13 wherein said sleep transistor is a low threshold voltage transistor.
15. The integrated circuit as claimed in claim 1 further comprising plural logic components, each of said logic components including a sleep transistor in series with an electrical connection to one of said power supply terminals.
16. An integrated circuit comprising:
two power supply terminals configured to power the integrated circuit, said power supply terminals including a V dd positive supply terminal and a V ss ground terminal;
a logic component, said logic component being a selected one of a logic gate and a storage cell, and said logic component including a sleep transistor in series with an electrical connection to one of said power supply terminals;
a charge pump configured to selectively generate a negative voltage;
circuitry configured to apply said negative voltage to said sleep transistor during a power down mode and to apply a voltage greater than V dd to said sleep transistor when in a mode other than said power down mode; and
a voltage regulator configured to control said charge pump to adequately minimize leakage current through said sleep transistor during said power down mode.
17. The integrated circuit as claimed in claim 16 wherein said voltage regulator enables said charge pump circuit when the magnitude of said negative voltage is insufficient to adequately minimize leakage through said sleep transistor, and disables said charge pump circuit when the magnitude of said negative voltage is enough to adequately minimize leakage through said sleep transistor.
18. The integrated circuit as claimed in claim 16 wherein said sleep transistor has a similar threshold voltage as other transistors in said logic components.
19. The integrated circuit as claimed in claim 16 further comprising plural logic components, each of said logic components including a sleep transistor in series with an electrical connection to one of said power supply terminals.
20. An integrated circuit comprising:
two power supply terminals configured to power the integrated circuit, said power supply terminals including a V dd positive supply terminal and a V ss ground terminal;
logic components, each said logic component being a selected one of a logic gate and a storage cell, and each said logic component including a sleep transistor in series with each electrical connection to one of said power supply terminals;
a charge pump configured to generate a negative voltage;
circuitry configured to apply said negative voltage to said sleep transistor during a power down mode; and
a voltage regulator configured to control said charge pump to adequately minimize leakage current through said sleep transistor during said power down mode, said voltage regulator including an emulated sleep transistor.
21. A method for adequately minimizing static leakage of an integrated circuit having a logic component, the logic component being a selected one of a logic gate and a storage cell, and the logic component including a sleep transistor in series with an electrical connection to a V ss ground terminal, the method comprising:
generating a negative voltage to be applied to the sleep transistor;
determining whether to adjust the negative voltage to adequately minimize the static leakage by:
applying the negative voltage to a first emulated sleep transistor to result in a first current;
applying the negative voltage plus an offset voltage to a second emulated sleep transistor to result in a second current; and
comparing the first current to the second current; and
adjusting the negative voltage depending on the determination.
22. The method of claim 21 wherein determining whether to adjust the negative voltage and adjusting the negative voltage occur continuously.
23. The method of claim 21 wherein determining whether to adjust the negative voltage and adjusting the negative voltage occur periodically.
24. The method of claim 21 further comprising monitoring one or more parameters of the sleep transistor.
25. The method of claim 24 wherein the one or more parameters comprise a drain-source current.
26. The method of claim 21 wherein generating the negative voltage includes selectively generating the negative voltage.
27. An integrated circuit comprising:
two power supply terminals configured to power the integrated circuit, said power supply terminals including a V dd positive supply terminal and a V SS ground terminal together defining a range of logic levels;
logic components, each said logic component being a selected one of a logic gate and a storage cell, and each said logic component including a sleep transistor in series with each electrical connection to one of said power supply terminals;
a voltage generator configured to generate a voltage outside said range of logic levels;
circuitry configured to apply said voltage outside the range of logic levels to said sleep transistor during a power down mode; and
a voltage regulator configured to control said voltage generator to adequately minimize leakage current through said sleep transistor during said power down mode, said voltage regulator including an emulated sleep transistor.
28. The integrated circuit as claimed in claim 27 wherein said emulated sleep transistor is configured to be biased at said voltage outside the range of logic levels and another emulated sleep transistor is configured to be biased at said voltage outside the range of logic levels with a voltage offset.
29. The integrated circuit as claimed in claim 28 wherein said voltage regulator is configured to adjust said voltage outside the range of logic levels to equalize a voltage drop on said emulated sleep transistors.
30. The integrated circuit as claimed in claim 27 wherein said emulated sleep transistor is configured to be biased at said voltage outside the range of logic levels and a capacitor is configured to be charged to said one of the power supply terminals and discharged to the other of said power supply terminals through said emulated sleep transistor.
31. A method for adequately minimizing static leakage of an integrated circuit having logic components, each of the logic components being a selected one of a logic gate and a storage cell, and each of the logic components including a sleep transistor in series with each electrical connection to a V ss ground terminal, the method comprising:
generating a negative voltage to be applied to the sleep transistor;
monitoring one or more parameters of the sleep transistor, the one or more parameters comprising a drain-source current;
determining whether to adjust the negative voltage to adequately minimize the static leakage; and
adjusting the negative voltage depending on the determination.
32. The method of claim 31 wherein determining whether to adjust the negative voltage and adjusting the negative voltage occur continuously.
33. The method of claim 31 wherein determining whether to adjust the negative voltage and adjusting the negative voltage occur periodically.
34. The method of claim 31 wherein determining whether to adjust the negative voltage comprises:
applying the negative voltage to an emulated sleep transistor;
inducing a current through the emulated sleep transistor in proportion to the static leakage; and
determining whether to adjust the negative voltage depending on the amount of the current.
35. The method of claim 31 wherein determining whether to adjust the negative voltage comprises:
applying the negative voltage to a first emulated sleep transistor to result in a first current;
applying the negative voltage plus an offset voltage to a second emulated sleep transistor to result in a second current; and
comparing the first current to the second current.
36. The method of claim 31 wherein generating the negative voltage includes selectively generating the negative voltage.
37. A method for adequately minimizing static leakage of an integrated circuit having logic components, each of the logic components being a selected one of a logic gate and a storage cell, and each of the logic components including a sleep transistor in series with each electrical connection to a V ss ground terminal, the method comprising:
generating a negative voltage to be applied to the sleep transistor;
determining whether to adjust the negative voltage to adequately minimize the static leakage by comparing a drain-source current and a drain-gate current of the sleep transistor; and
adjusting the negative voltage depending on the determination.
38. The method of claim 37 wherein determining whether to adjust the negative voltage and adjusting the negative voltage occur continuously.
39. The method of claim 37 wherein determining whether to adjust the negative voltage and adjusting the negative voltage occur periodically.
40. The method of claim 37 further comprising monitoring one or more parameters of the sleep transistor.
41. The method of claim 40 wherein the one or more parameters comprise a drain-source current.
42. The method of claim 37 wherein generating the negative voltage includes selectively generating the negative voltage.
43. A method for adequately minimizing static leakage of an integrated circuit having a logic component, the logic component being a selected one of a logic gate and a storage cell, and the logic component including a sleep transistor in series with an electrical connection to a V ss ground terminal, the method comprising:
generating a negative voltage to be applied to the sleep transistor;
determining whether to adjust the negative voltage to adequately minimize the static leakage by:
applying the negative voltage to an emulated sleep transistor; and
inducing a current through the emulated sleep transistor in proportion to the static leakage; and
adjusting the negative voltage depending on the determination.
44. The method of claim 43 wherein determining whether to adjust the negative voltage and adjusting the negative voltage occur continuously.
45. The method of claim 43 wherein determining whether to adjust the negative voltage and adjusting the negative voltage occur periodically.
46. The method of claim 43 further comprising monitoring one or more parameters of the sleep transistor.
47. The method of claim 46 wherein the one or more parameters comprise a drain-source current.
48. The method of claim 43 wherein generating the negative voltage includes selectively generating the negative voltage.