Reducing transistor junction capacitance by recessing drain and source regions
View Patent ↗By recessing portions of the drain and source areas on the basis of a spacer structure, the subsequent implantation process for forming the deep drain and source regions may result in a moderately high dopant concentration extending down to the buried insulating layer of an SOI transistor. Furthermore, the spacer structure maintains a significant amount of a strained semiconductor alloy with its original thickness, thereby providing an efficient strain-inducing mechanism. By using sophisticated anneal techniques, undue lateral diffusion may be avoided, thereby allowing a reduction of the lateral width of the respective spacers and thus a reduction of the length of the transistor devices. Hence, enhanced charge carrier mobility in combination with reduced junction capacitance may be accomplished on the basis of reduced lateral dimensions.
1. A method, comprising:
forming drain and source extension regions in a semiconductor region of a transistor by performing a first ion implantation process using a gate electrode structure of said transistor as an implantation mask;
forming a spacer structure at sidewalls of said gate electrode structure;
after forming said spacer structure, performing an etching process to thereby define a plurality of recesses only within the drain and source extension regions formed in said semiconductor region;
performing a second ion implantation process into said recesses for forming drain and source regions using said spacer structure as an implantation mask, said drain and source regions extending to a buried insulating layer located below said semiconductor region; and
performing an anneal process for activating dopants of said drain and source regions.
2. The method of claim 1 , wherein said etch process is performed as an an isotropic etch process.
3. The method of claim 1 , further comprising forming a strained semiconductor material in said semiconductor regions to induce a strain in a channel region of said transistor.
4. The method of claim 3 , wherein forming said strained semiconductor material comprises forming a compressively strained semiconductor material in said semiconductor region.
5. The method of claim 3 , wherein forming said strained semiconductor material comprises forming a tensile strained semiconductor material in said semiconductor region.
6. The method of claim 1 , wherein said anneal process comprises a radiation-based anneal step with an effective irradiation time of approximately one second and less.
7. The method of claim 1 , wherein said anneal process comprises an anneal step designed to adjust a lateral effective channel length of said transistor.
8. The method of claim 1 , further comprising performing an extension anneal process designed to anneal said drain and source extension regions prior to performing said second ion implantation process.
9. The method of claim 1 , further comprising forming a cap layer above a top surface of an electrode portion of said gate electrode structure and using said cap layer as an etch mask when recessing said semiconductor region.
10. A method, comprising:
forming drain and source extension regions in a semiconductor region of a transistor by performing a first ion implantation process using a gate electrode structure of said transistor as an implantation mask;
forming a spacer structure at sidewalls of said gate electrode structure;
after forming said spacer structure, performing an etching process to thereby define a plurality of recesses in said semiconductor region, wherein said etch process is performed as an isotropic etch process;
performing a second ion implantation process into said recesses for forming drain and source regions using said spacer structure as an implantation mask, said drain and source regions extending to a buried insulating layer located below said semiconductor region; and
performing an anneal process for activating dopants of said drain and source regions.
11. A method, comprising:
forming a first strained semiconductor alloy in a first semiconductor region of a first transistor, said first strained semiconductor alloy located at least partially in drain and source areas, and inducing a first type of strain in a channel region of said first transistor;
forming a recess only within the first strained semiconductor alloy; and
implanting a dopant species into said recess only within the first strained semiconductor alloy to form deep drain and source regions, said deep drain and source regions extending to a buried insulating layer on which is formed said first semiconductor region.
12. The method of claim 11 , further comprising forming a second strained semiconductor alloy in a second semiconductor region of a second transistor, said second strained semiconductor alloy located at least partially in drain and source areas of the second transistor and inducing a second type of strain in a channel region of said second transistor, said first type of strain being of opposite type compared to said second type of strain.
13. The method of claim 11 , further comprising forming drain and source extension regions in said first transistor prior to forming said recess in said first transistors.
14. The method of claim 13 , further comprising annealing said first transistor.
15. The method of claim 14 , wherein annealing said first transistor comprises annealing said first transistor by exposing said first transistor to a radiation for approximately one second and less.
16. The method of claim 14 , wherein annealing said first transistor comprises annealing said drain and source extension regions of said first transistor so as to adjust an effective channel length of said first transistor.
17. The method of claim 11 , wherein forming said recess comprises forming a cap layer above a gate electrode of said first transistor and a spacer structure at sidewalls of said gate electrode and performing an etch process using said cap layer and said spacer structure as an etch mask.
18. A method, comprising:
forming a first strained semiconductor alloy in a first semiconductor region of a first transistor, said first strained semiconductor alloy located at least partially in drain and source areas of the first transistor and inducing a first type of strain in a channel region of said first transistor;
forming a recess in a portion of each of said drain and source areas of the first transistor; and
implanting a dopant species into said recesses in said drain and source areas to form deep drain and source regions, said deep drain and source regions extending to a buried insulating layer on which is formed said first semiconductor region of the first transistor;
forming a second strained semiconductor alloy in a second semiconductor region of a second transistor, said second strained semiconductor alloy located at least partially in drain and source areas of the second semiconductor and inducing a second type of strain in a channel region of said second transistor, said first type of strain being of opposite type compared to said second type of strain; and
forming a recess in a portion of each of said drain and source areas of said second transistor and implanting a dopant species into said drain and source areas of the second transistor to form deep drain and source regions, said deep drain and source regions of the second transistor extending to said buried insulating layer.
19. A method, comprising:
forming a first strained semiconductor alloy in a first semiconductor region of a first transistor, said first strained semiconductor alloy located at least partially in drain and source areas, and inducing a first type of strain in a channel region of said first transistor;
forming a recess in a portion of each of said drain and source areas of the first transistor;
implanting a dopant species into said recess in said drain and source areas to form deep drain and source regions, said deep drain and source regions extending to a buried insulating layer on which is formed said first semiconductor region; and
incorporating a species into said first semiconductor region through said recess, said species substantially not extending to said buried insulating layer.