IP Library Assignment 054372/0194
Patent Assignment
Reel/Frame 054372/0194

Release of Security Interest

Recorded: 2020-11-10 Pages: 75
Assignor
CPPIB CREDIT INVESTMENTS INC.
Executed: 2020-10-28
Assignee
CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
515 LEGGET DRIVE, SUITE 704, OTTAWA, K2K 3G4, CANADA
Covered Properties (68)
Transistor Having Enhanced Metal Silicide and a Self-Aligned Gate Electrode
Patent: 6,410,967 →
Application: 09/173,273 →
Method and Test Structure for Low-Temperature Integration of High Dielectric Constant Gate Dielectrics into Self-Aligned Semiconductor Devices
Patent: 6,210,999 →
Application: 09/205,047 →
Sacrificial Tin Arc Layer for Increased Pad Etch Throughput
Patent: 7,071,101 →
Application: 09/208,325 →
Dual Damascene Arrangement for Metal Interconnection with Oxide Dielectric Layer and Low K Dielectric Constant Layer
Patent: 6,380,091 →
Application: 09/238,050 →
Aluminum Disposable Spacer to Reduce Mask Count in Cmos Transistor Formation
Patent: 6,265,253 →
Application: 09/305,098 →
Phosphoric Acid Process for Removal of Contact Barc Layer
Patent: 6,127,259 →
Application: 09/372,443 →
Method of fabricating a deep source/drain
Patent: 6,358,803 →
Application: 09/489,369 →
Delay Locking High Speed Clock Synchronization Method And Circuit
Patent: 6,310,822 →
Application: 09/498,739 →
Semiconductor memory having segmented row repair
Patent: 6,314,030 →
Application: 09/594,442 →
Nickel Silicide Process Using Non-Reactive Spacer
Patent: 6,724,051 →
Application: 09/679,877 →
Slotted Trench Dual Inlaid Structure and Method of Forming Thereof
Patent: 6,524,947 →
Application: 09/774,800 →
Recessed Source Drains to Reduce Fringing Capacitance
Patent: 6,531,347 →
Application: 09/776,713 →
Fabrication of P-Channel Field Effect Transistor with Minimized Degradation of Metal Oxide Gate
Patent: 6,365,450 →
Application: 09/809,706 →
Method of Forming Semiconductor Devices with Differently Composed Metal-Based Gate Electrodes
Patent: 6,518,154 →
Application: 09/813,310 →
Semiconductor Device with Variable Composition Low-K Inter-Layer Dielectric and Method of Making
Patent: 6,518,646 →
Application: 09/819,615 →
Method of Fabricating a Semiconductor Device Having a Mos Transistor with a High Dielectric Constant Material
Patent: 6,686,248 →
Application: 09/825,658 →
Method of Strengthening Photoresist to Prevent Pattern Collapse
Patent: 6,635,409 →
Application: 09/902,568 →
Gradated Barrier Layer in Integrated Circuit Interconnects
Patent: 6,462,416 →
Application: 09/905,469 →
Semiconductor Memory Having Segmented Row Repair
Patent: 6,442,084 →
Application: 09/928,404 →
Publication: US 2001/0053101
Anneal Hillock Suppression Method in Integrated Circuit Interconnects
Patent: 6,500,754 →
Application: 09/999,661 →
Method for Lateral Trimming of Spacers
Patent: 6,821,713 →
Application: 10/085,242 →
Erase Block Architecture for Non-Volatile Memory
Patent: 6,587,383 →
Application: 10/100,856 →
Synchronous Dram with Selectable Internal Prefetch Size
Patent: 6,895,474 →
Application: 10/133,386 →
Publication: US 2003/0204674
Circuit, System and Method for Selectively Turning Off Internal Clock Drivers
Patent: 7,089,438 →
Application: 10/179,882 →
Publication: US 2003/0235103
Contiguous Block Addressing Scheme
Patent: 7,123,512 →
Application: 10/199,725 →
Publication: US 2004/0015674
Methods for Improving Carrier Mobility of Pmos and Nmos Devices
Patent: 6,573,172 →
Application: 10/244,439 →
Double Gate Semiconductor Device Having Separate Gates
Patent: 6,611,029 →
Application: 10/290,158 →
Method of Controlling the Chemical Mechanical Polishing of Stacked Layers Having a Surface Topology
Patent: 6,936,480 →
Application: 10/304,573 →
Publication: US 2004/0023490
Method of Manufacturing Semiconductor Devices
Patent: 7,022,599 →
Application: 10/306,335 →
Publication: US 2003/0119302
Method for Repairing a Semiconductor Memory
Patent: 6,892,318 →
Application: 10/375,994 →
Publication: US 2003/0154422
Erase Block Architecture for Non-Volatile Memory
Patent: 6,724,663 →
Application: 10/376,936 →
Publication: US 2003/0179624
Method of Manufacturing Semiconductor Device Comprising Silicon-Rich Tasin Metal Gate Electrode
Patent: 6,861,350 →
Application: 10/464,508 →
Narrow Fins by Oxidation in Double-Gate Finfet
Patent: 6,812,119 →
Application: 10/614,052 →
Narrow Body Raised Source/Drain Metal Gate Mosfet
Patent: 7,034,361 →
Application: 10/653,234 →
Slurry-Less Polishing for Removal of Excess Interconnect Material During Fabrication of a Silicon Integrated Circuit
Patent: 7,141,502 →
Application: 10/673,597 →
Demonstration Control Adjunct Device for Printers
Patent: 7,081,966 →
Application: 10/731,764 →
Publication: US 2004/0120005
Technique for Forming Recessed Sidewall Spacers for a Polysilicon Line
Patent: 7,005,358 →
Application: 10/786,401 →
Publication: US 2005/0026380
Internal Power Management Scheme for a Memory Chip in Deep Power Down Mode
Patent: 7,031,219 →
Application: 10/861,157 →
Publication: US 2005/0270880
End-Of-Range Defect Minimization in Semiconductor Device
Patent: 7,091,097 →
Application: 10/933,424 →
Synchronous Dram with Selectable Internal Prefetch Size
Patent: 6,981,100 →
Application: 10/972,324 →
Publication: US 2005/0083758
Contiguous Block Addressing Scheme
Patent: 7,154,780 →
Application: 11/206,529 →
Publication: US 2005/0276130
Contiguous Block Addressing Scheme
Patent: 7,154,781 →
Application: 11/207,017 →
Publication: US 2005/0276121
Contiguous Block Addressing Scheme
Patent: 7,154,782 →
Application: 11/207,105 →
Publication: US 2005/0278481
Synchronous Dram with Selectable Internal Prefetch Size
Patent: 7,120,754 →
Application: 11/268,760 →
Publication: US 2006/0112231
Internal Power Management Scheme for a Memory Chip in Deep Power Down Mode
Patent: 7,292,494 →
Application: 11/339,624 →
Publication: US 2006/0146636
Providing Stress Uniformity in a Semiconductor Device
Patent: 7,473,623 →
Application: 11/428,022 →
Publication: US 2008/0003789
Circuit, System and Method for Selectively Turning Off Internal Clock Drivers
Patent: 7,669,068 →
Application: 11/449,499 →
Publication: US 2006/0230303
Soi Semiconductor Components and Methods for Their Fabrication
Patent: 7,531,403 →
Application: 11/538,001 →
Publication: US 2008/0079074
Technique for Providing Stress Sources in Transistors in Close Proximity to a Channel Region by Recessing Drain and Source Regions
Patent: 7,696,052 →
Application: 11/558,006 →
Publication: US 2007/0228482
Non-Volatile Memory Devices and Control and Operation Thereof
Patent: 7,546,440 →
Application: 11/581,887 →
Publication: US 2007/0038800
Methods for Fabricating an Integrated Circuit
Patent: 7,504,287 →
Application: 11/689,764 →
Publication: US 2008/0233738
Conductor Bump Method and Apparatus
Patent: 7,906,424 →
Application: 11/832,486 →
Publication: US 2009/0032940
Reducing Transistor Junction Capacitance by Recessing Drain and Source Regions
Patent: 7,754,556 →
Application: 12/027,583 →
Publication: US 2009/0001484
Method of Forming a Semiconductor Structure Comprising an Implantation of Ions of a Non-Doping Element
Patent: 7,816,199 →
Application: 12/037,533 →
Publication: US 2009/0035924
Memory Device and Method for Repairing a Semiconductor Memory
Patent: 7,870,435 →
Application: 12/336,371 →
Publication: US 2009/0100291
Non-Volatile Memory Devices and Control and Operation Thereof
Patent: 7,908,427 →
Application: 12/387,058 →
Publication: US 2010/0030949
Soi Semiconductor Components and Methods for Their Fabrication
Patent: 7,986,008 →
Application: 12/413,185 →
Publication: US 2009/0184372
Contacts and Vias of a Semiconductor Device Formed by a Hard Mask and Double Exposure
Patent: 8,318,598 →
Application: 12/537,321 →
Publication: US 2010/0078823
Circuit, System and Method for Selectively Turning Off Internal Clock Drivers
Patent: 8,412,968 →
Application: 12/652,897 →
Publication: US 2010/0174932
Technique for Providing Stress Sources in Transistors in Close Proximity to a Channel Region by Recessing Drain and Source Regions
Patent: 8,274,120 →
Application: 12/710,744 →
Publication: US 2010/0155850
Reducing Transistor Junction Capacitance by Recessing Drain and Source Regions
Patent: 8,183,605 →
Application: 12/791,290 →
Publication: US 2010/0237431
Conductor Bump Method and Apparatus
Patent: 8,294,266 →
Application: 13/027,076 →
Publication: US 2011/0133338
Non-Volatile Memory Devices and Control and Operation Thereof
Patent: 8,145,832 →
Application: 13/035,580 →
Publication: US 2011/0238894
Non-Volatile Memory Devices and Control and Operation Thereof
Patent: 9,213,630 →
Application: 13/399,587 →
Publication: US 2012/0215967
Circuit, System and Method for Selectively Turning Off Internal Clock Drivers
Patent: 9,003,214 →
Application: 13/796,677 →
Publication: US 2013/0275799
Synthetic Barcode Payment System and Method
Patent: 9,239,979 →
Application: 14/598,219 →
Circuit, System and Method for Selectively Turning Off Internal Clock Drivers
Patent: 9,201,489 →
Application: 14/659,934 →
Publication: US 2015/0192982
Hybrid Wireless Short Range Payment System and Method
Patent: 9,489,670 →
Application: 14/836,456 →
Publication: US 2016/0210613
Related Assignments (14)
Other recorded transfers of the patents in this record — the chain of ownership.
U.S. Intellectual Property Security Agreement (for Non-U.S. Grantors) - Short Form Jan 10, 2012
From: 658276 N.B. LTD.; 658868 N.B. INC.; MOSAID TECHNOLOGIES INCORPORATED
To: ROYAL BANK OF CANADA
Reel/Frame 027512/0196 →
Change of Name Mar 13, 2014
From: MOSAID TECHNOLOGIES INCORPORATED
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 032439/0638 →
Release of Security Interest Aug 7, 2014
From: ROYAL BANK OF CANADA
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.; CONVERSANT IP N.B. 868 INC.; CONVERSANT IP N.B. 276 INC.
Reel/Frame 033484/0344 →
Change of Address Sep 3, 2014
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 033678/0096 →
U.S. Patent Security Agreement (for Non-U.S. Grantors) Sep 9, 2014
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: CPPIB CREDIT INVESTMENTS INC., AS LENDER; ROYAL BANK OF CANADA, AS LENDER
Reel/Frame 033706/0367 →
Assignment of Assignor's Interest Feb 22, 2016
From: ADVANCED MICRO DEVICES, INC.
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 037876/0790 →
Amended and Restated U.S. Patent Security Agreement (for Non-U.S. Grantors) Aug 22, 2018
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: CPPIB CREDIT INVESTMENTS, INC.
Reel/Frame 046900/0136 →
Release of U.S. Patent Agreement (for Non-U.S. Grantors) Oct 12, 2018
From: ROYAL BANK OF CANADA, AS LENDER
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 047645/0424 →
Change of Name Sep 9, 2021
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 057709/0853 →
Change of Name Sep 9, 2021
From: CONVERSANT INTELLECTUAL PROPERTY INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 057448/0207 →
Change of Name Nov 3, 2021
From: CONVERSANT INTELLECTUAL PROPERTY INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 058796/0572 →
Change of Name Nov 3, 2021
From: CONVERSANT INTELLECTUAL PROPERTY INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 058793/0720 →
Corrective Assignment to Correct the Conveying Party's Name Previously Recorded at Reel: 058796 Frame: 0572. Assignor(S) Hereby Confirms the Change of Name. Aug 16, 2023
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 064608/0757 →
Corrective Assignment to Correct the Conveying Party's Name Previously Recorded at Reel: 057448 Frame: 0207. Assignor(S) Hereby Confirms the Change of Name. Aug 30, 2023
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 064783/0033 →