Scalable electrically eraseable and programmable memory
View Patent ↗A non-volatile memory including one or more EEPROM cell pairs. Each EEPROM cell pair includes three transistors and stores two data bits, effectively providing a 1.5 transistor EEPROM cell. An EEPROM cell pair includes a first non-volatile memory transistor, a second non-volatile memory transistor and a source access transistor. The source access transistor includes: a first source region continuous with a source region of the first non-volatile memory transistor; a second source region continuous with a source region of the second non-volatile memory transistor, and a third source region continuous with source regions of other non-volatile memory transistors located in the same row as the EEPROM cell pair.
1. A non-volatile memory array comprising:
one or more electrically erasable and programmable memory (EEPROM) cell pairs, each configured to store two data bits, and including:
a first non-volatile memory transistor having a floating gate structure separated from a control gate structure by an inter-gate dielectric layer;
a second non-volatile memory transistor having a floating gate structure separated from a control gate structure by an inter-gate dielectric layer; and
a source access transistor having a floating gate structure electrically connected with a control gate structure, the source access transistor located in a first well region and having a first diffusion region continuous with a source of the first non-volatile memory transistor, and having a second diffusion region continuous with a source of the second non-volatile memory transistor, wherein first well region is located in a second well region.
2. The non-volatile memory array of claim 1 , further comprising a tunnel gate dielectric layer separating the floating gate structures of the first non-volatile memory transistor, the second non-volatile memory transistor and the source access transistor from the first well region.
3. The non-volatile memory array of claim 1 , further comprising a bit line coupled to a drain of the first non-volatile memory transistor and a drain of the second non-volatile memory transistor.
4. The non-volatile memory array of claim 1 , further comprising:
a first word line coupled to the control gate structure of the first non-volatile memory transistor; and
a second word line coupled to the control gate structure of the second non-volatile memory transistor; and
a source select line coupled to the control gate structure of the source access transistor.
5. The non-volatile memory array of claim 4 , wherein the first word line, the second word line and the source select line extend in parallel along a first axis.
6. The non-volatile memory array of claim 1 , wherein the only transistors in each EEPROM cell pair are the first non-volatile memory transistor, the second non-volatile memory transistor and the source access transistor.
7. A non-volatile memory array comprising:
one or more electrically erasable and programmable memory (EEPROM) cell pairs, each configured to store two data bits, and including:
a first non-volatile memory transistor having a floating gate structure separated from a control gate structure by an inter-gate dielectric layer;
a second non-volatile memory transistor having a floating gate structure separated from a control gate structure by an inter-gate dielectric layer; and
a source access transistor having a floating gate structure electrically connected with a control gate structure, the source access transistor located in a first well region and coupled to a source of the first non-volatile memory transistor and a source of the second non-volatile memory transistor, wherein first well region is located in a second well region,
wherein the one or more electrically erasable and programmable memory (EEPROM) cell pairs are arranged in a plurality of rows and columns, wherein a first one of said columns is configured such that the first non-volatile memory transistor and the second non-volatile memory transistor of each EEPROM cell pair in the first one of said columns are in a permanently conductive state.
8. The non-volatile memory array of claim 1 , further comprising an inter-gate dielectric layer located between portions of the floating gate structure of the source access transistor and the control gate structure of the source access transistor.
9. The non-volatile memory array of claim 1 , wherein the floating gate structure of the source access transistor is continuous along an entire row of the non-volatile memory array.
10. A non-volatile memory array comprising:
a first row comprising a first plurality of non-volatile memory transistors;
a second row comprising a second plurality of non-volatile memory transistors;
a plurality of source access transistors, each having a first diffusion region continuous with a source region of a corresponding one of the first plurality of non-volatile memory transistors in the first row, and each having a second diffusion region continuous with a source region of a corresponding one of the second plurality of non-volatile memory transistors in the second row, wherein the plurality of source access transistors comprise a floating gate structure and a control gate structure, wherein the floating gate structure is electrically connected to the control gate structure.
11. The non-volatile memory array of claim 10 , wherein the floating gate structure is continuous along the plurality of source access transistors.
12. The non-volatile memory array of claim 10 , further comprising an inter-gate dielectric layer located between portions of the floating gate structure and the control gate structure.
13. The non-volatile memory array of claim 10 , wherein the first plurality of non-volatile memory transistors includes a first plurality of floating gate structures, and the second plurality of non-volatile memory transistors includes a second plurality of floating gate structures, wherein a tunnel gate dielectric layer is located below the floating gate structures of the first and second pluralities of non-volatile memory transistors and the floating gate structure of the source access transistors.
14. The non-volatile memory array of claim 10 , wherein the plurality of source access transistors are located in a first well region, wherein the first well region is located in a second well region.
15. A non-volatile memory array comprising:
a first row comprising a first plurality of non-volatile memory transistors;
a second row comprising a second plurality of non-volatile memory transistors;
a plurality of source access transistors, each coupled to a source region of a corresponding one of the first plurality of non volatile memory transistors in the first row, and each coupled to a source region of a corresponding one of the second plurality of non-volatile memory transistors in the second row, wherein the plurality of source access transistors comprise a floating gate structure and a control gate structure, wherein the floating gate structure is electrically connected to the control gate structure, and wherein the first plurality of non-volatile memory transistors includes a first permanently conductive non-volatile memory transistor located at a first end of the first row.
16. The non-volatile memory array of claim 15 , wherein the second plurality of non-volatile memory transistors includes a second permanently conductive non-volatile memory transistor located at a first end of the second row, adjacent to the first permanently conductive non-volatile memory transistor.
17. The non-volatile memory array of claim 15 , wherein the first plurality of non-volatile memory transistors further includes a third permanently conductive non-volatile memory transistor located at a second end of the first row, and the second plurality of non-volatile memory transistors includes a fourth permanently conductive non-volatile memory transistor located at a second end of the second row, adjacent to the third permanently conductive non-volatile memory transistor.