Semiconductor device comprising circuit substrate with inspection connection pads and manufacturing method thereof

1. A semiconductor device comprising:

a first circuit substrate having a plurality of lower wiring lines and a plurality of upper wiring lines on a lower surface side and an upper surface side thereof, respectively;

a second circuit substrate provided on a lower side of the first circuit substrate, wherein the second circuit substrate has an opening which exposes a part of the first circuit substrate, and the second circuit substrate also has, on a lower surface side thereof, a plurality of external-connection connection pads and a plurality of test connection pads connected to the lower wiring lines;

a first semiconductor construct which is disposed on the lower side of the first circuit substrate within the opening of the second circuit substrate, the first semiconductor construct having a plurality of external connection electrodes connected to lower wiring lines of the first circuit substrate;

a third circuit substrate provided on an upper side of the first circuit substrate and having a plurality of lower wiring lines connected to the upper wiring lines of the first circuit substrate; and

at least one of an electronic component and a second semiconductor construct which is provided on the third circuit substrate and which is connected to a plurality of upper wiring lines of the third circuit substrate,

wherein said plurality of test connection pads include at least a first inspection connection pad which is configured to inspect the first semiconductor construct.

2. The semiconductor device according to claim 1 , wherein:

the first semiconductor construct includes a semiconductor substrate provided with an integrated circuit unit, and a plurality of connection pads provided on the semiconductor substrate, and

the test connection pads of the second circuit substrate include at least a second inspection connection pad to inspect the integrated circuit unit of the semiconductor substrate.

3. The semiconductor device according to claim 1 , wherein:

the first semiconductor construct has a semiconductor substrate provided with an integrated circuit unit, and a plurality of connection pads provided on the semiconductor substrate, and

at least said first inspection connection pad inspects the integrated circuit unit of the semiconductor substrate.

4. The semiconductor device according to claim 1 , wherein:

the first semiconductor construct includes a semiconductor substrate provided with an integrated circuit unit, and a plurality of connection pads which are provided on the semiconductor substrate and which configure the external connection electrodes, and

the plurality of test connection pads of the second circuit substrate include at least one mounting inspection connection pad to inspect a mounting state of the first circuit substrate and the first semiconductor construct and a mounting state of the first circuit substrate and the second circuit substrate, and wherein at least said first inspection connection pad inspects the integrated circuit unit of the semiconductor substrate.

5. The semiconductor device according to claim 1 , wherein the external connection electrodes provided on an upper side of the first semiconductor construct are connected to the lower wiring lines of the first circuit substrate such that the external connection electrodes are installed face down under the first circuit substrate.

6. The semiconductor device according to claim 1 , further comprising an underfill material provided between the first semiconductor construct and the first circuit substrate.

7. The semiconductor device according to claim 1 , wherein a lower surface of the second circuit substrate is located at a position projecting further than a lower surface of the first semiconductor construct.

8. The semiconductor device according to claim 7 , wherein a sealing film covering the first semiconductor construct is provided under the first circuit substrate within the opening of the second circuit substrate so that a lower surface of the sealing film is flush with or located at a position recessed relative to the lower surface of the second circuit substrate.

9. The semiconductor device according to claim 1 , wherein the second circuit substrate has a lower overcoat film having openings in parts corresponding to the external-connection connection pads and the test connection pads.

10. The semiconductor device according to claim 9 , wherein solder balls are provided in and under some of the openings of the lower overcoat film so that the solder balls are connected to the external-connection connection pads.

11. The semiconductor device according to claim 1 , wherein the electronic component is provided on the third circuit substrate so that the electronic component is connected to the upper wiring lines of the third circuit substrate.

12. The semiconductor device according to claim 11 , wherein the test connection pads of the second circuit substrate include at least second inspection connection pads to inspect a mounting state of the third circuit substrate and the electronic component, a mounting state of the third circuit substrate and the first circuit substrate and a mounting state of the first circuit substrate and the second circuit substrate.

13. The semiconductor device according to claim 11 , wherein the third circuit substrate has a multilayer wiring structure.

14. The semiconductor device according to claim 11 , wherein the test connection pads of the second circuit substrate include test connection pads to inspect a mounting state of the third circuit substrate and the second semiconductor construct, a mounting state of the third circuit substrate and the first circuit substrate and a mounting state of the first circuit substrate and the second circuit substrate.

15. The semiconductor device according to claim 14 , wherein the test connection pads of the second circuit substrate include inspection test connection pads to inspect an integrated circuit unit of the second semiconductor construct.

16. The semiconductor device according to claim 14 , wherein the test connection pads include inspection test connection pads to inspect an integrated circuit unit of the first semiconductor construct.

17. The semiconductor device according to claim 11 , wherein the first semiconductor construct configures a digital circuit unit, and the electronic component configures an analog circuit unit.

18. The semiconductor device according to claim 17 , wherein a shield cover covering the electronic component is provided over the third circuit substrate.

19. The semiconductor device according to claim 17 , wherein a shield cover covering the third circuit substrate and the electronic component is provided over the first circuit substrate.

20. A semiconductor device comprising:

a first circuit substrate having a plurality of lower wiring lines with connection pad portions and a plurality of upper wiring lines;

a first semiconductor construct having an integrated circuit unit, and a plurality of external connection electrodes connected to connection pad portions of lower wiring lines of the first circuit substrate;

a second circuit substrate provided under the first circuit substrate, wherein the second circuit substrate has an opening which receives the first semiconductor construct, and the second circuit substrate has a plurality of external-connection connection pads and a plurality of test connection pads connected to the lower wiring lines;

a third circuit substrate provided over the first circuit substrate, wherein the third circuit substrate has an integrated circuit unit, a plurality of upper wiring lines and a plurality of lower wiring lines connected to the upper wiring lines of the first circuit substrate; and

a second semiconductor construct provided on the third circuit substrate and having a plurality of wiring lines connected to the upper wiring lines of the third circuit substrate,

wherein the test connection pads of the second circuit substrate include first inspection connection pads which are configured to inspect operation of the integrated circuit unit of the first semiconductor construct, and second inspection connection pads which are configured to inspect operation of an integrated circuit unit of the second semiconductor construct.

21. The semiconductor device according to claim 20 , wherein the test connection pads of the second circuit substrate include at least one mounting inspection connection pad to inspect a mounting state of the second circuit substrate mounted on the first circuit substrate, at least one mounting inspection connection pad to inspect a mounting state of the third circuit substrate mounted on the first circuit substrate, and at least one inspection test connection pad to inspect a mounting state of the second semiconductor construct mounted on the third circuit substrate.

22. The semiconductor device according to claim 20 , further comprising at least one electronic component mounted on the third circuit substrate and connected to upper wiring lines of the third circuit substrate, and wherein the test connection pads of the second circuit substrate include at least one mounting inspection connection pad to inspect a mounting state of the electronic component mounted on the third circuit substrate.