Integrated circuit that stores defective memory cell addresses

1. An integrated circuit comprising:

an array of memory cells;

volatile storage configured to store identified addresses of defective memory cells, wherein each entry in the volatile storage includes one of the identified addresses and a volatile storage master bit;

non-volatile storage configured to store the identified addresses, wherein each entry in the non-volatile storage includes one of the identified addresses and a non-volatile storage master bit; and

a circuit configured to detect defective memory cells in the array of memory cells and provide captured addresses of detected defective memory cells, wherein the circuit retrieves the identified addresses from the volatile storage and compares each captured address of the captured addresses to retrieved identified addresses, and the circuit does not store a compared captured address into the volatile storage if the compared captured address matches one of the retrieved identified addresses and the circuit stores the compared captured address into the volatile storage if the compared captured address does not match one of the retrieved identified addresses, and each stored compared captured address in the volatile storage is stored into the non-volatile storage.

2. The integrated circuit of claim 1 , wherein the array of memory cells includes banks of memory cells and the volatile storage includes sets of volatile storage elements, wherein each of the banks of memory cells is electrically coupled to a different one of the sets of volatile storage elements.

3. The integrated circuit of claim 2 , wherein the non-volatile storage includes sets of non-volatile storage elements, wherein each of the sets of non-volatile storage elements corresponds to a different one of the banks of memory cells.

4. The integrated circuit of claim 2 , wherein the circuit provides a repair status flag that indicates all of the volatile storage master bits in one of the sets of volatile storage elements are used.

5. The integrated circuit of claim 2 , wherein the circuit is configured to provide bank addresses of the defective memory cells and each entry in the volatile storage includes a bank address.

6. The integrated circuit of claim 1 , wherein the volatile storage includes sets of volatile storage elements and the non-volatile storage includes sets of non-volatile storage elements and each of the sets of non-volatile storage elements corresponds to one of the sets of volatile storage elements.

7. The integrated circuit of claim 6 , wherein each of the sets of non-volatile storage elements is programmed via the corresponding one of the sets of volatile storage elements.

8. The integrated circuit of claim 1 , wherein the non-volatile storage includes at least one of electrical fuses, flash memory, electrically programmable read only memory, and electrically erasable programmable read only memory.

9. The integrated circuit of claim 1 , comprising:

a built-in-self-test circuit configured to test the array of memory cells.

10. A memory device comprising:

banks of memory cells;

volatile storage configured to store identified addresses of defective memory cells and including sets of volatile storage elements; and

non-volatile storage configured to store the identified addresses and including sets of non-volatile storage elements, wherein each of the banks of memory cells is electrically coupled to a different one of the sets of volatile storage elements and each of the sets of non-volatile storage elements corresponds to a different one of the banks of memory cells and to a different set of the sets of volatile storage elements; and

a circuit configured to detect defective memory cells in the banks of memory cells and provide captured addresses of detected defective memory cells, wherein the circuit retrieves the identified addresses from the volatile storage and compares each captured address of the captured addresses to retrieved identified addresses, and the circuit does not store a compared captured address into the volatile storage if the compared captured address matches one of the retrieved identified addresses and the circuit stores the compared captured address into the volatile storage if the compared captured address does not match one of the retrieved identified addresses, and each stored compared captured address in the volatile storage is stored into the non-volatile storage via programming each of the sets of non-volatile storage elements with the corresponding different set of the sets of volatile storage elements.

11. The memory device of claim 10 , wherein the circuit provides row and column addresses of the defective memory cells and each entry in the volatile storage includes one of the row and column addresses and a volatile storage master bit.

12. The memory device of claim 11 , wherein each entry in the non-volatile storage includes one of the row and column addresses and a non-volatile storage master bit.

13. The memory device of claim 11 , wherein the circuit provides a repair status flag that indicates all of the volatile storage master bits in one of the sets of volatile storage elements are used.

14. The memory device of claim 10 , wherein the circuit is configured to provide bank addresses of the defective memory cells and each entry in the volatile storage includes a bank address.

15. A method of repairing a memory, comprising:

storing identified row and column addresses of defective memory cells in volatile storage;

storing the identified row and column addresses in non-volatile storage;

storing one of the identified row and column addresses and a volatile storage master bit in each entry in the volatile storage;

storing one of the identified row and column addresses and a non-volatile storage master bit in each entry in the non-volatile storage;

detecting defective memory cells in an array of memory cells;

providing captured row and column addresses of detected defective memory cells:

retrieving the identified row and column addresses from the volatile storage;

comparing each captured row and column address of the captured addresses to retrieved identified row and column addresses;

discarding a compared captured row and column address without storing the compared captured row and column address into the volatile storage if the compared captured row and column address matches one of the retrieved identified row and column addresses;

storing the compared captured row and column address into the volatile storage if the compared captured row and column address does not match one of the retrieved identified row and column addresses; and

storing each stored compared captured row and column address in the volatile storage into the non-volatile storage.

16. The method of claim 15 , wherein:

storing the identified row and column addresses of defective memory cells in volatile storage includes storing the identified row and column addresses in sets of volatile storage elements; and

detecting includes detecting defective memory cells in banks of memory cells that are each electrically coupled to a different one of the sets of volatile storage elements.

17. The method of claim 16 , wherein:

storing the identified row and column addresses in non-volatile storage includes storing the identified row and column addresses in sets of non-volatile storage elements that each correspond to one of the banks of memory cells.

18. The method of claim 16 , comprising:

providing a repair status flag that indicates all of the volatile storage master bits in one of the sets of volatile storage elements are used.

19. A method of repairing a memory, comprising:

storing identified addresses of defective memory cells in sets of volatile storage elements that are each electrically coupled to a different one of banks of memory cells;

storing the identified addresses in sets of non-volatile storage elements that each correspond to a different one of the banks of memory cells;

detecting defective memory cells in the banks of memory cells;

providing captured addresses of detected defective memory cells;

retrieving the identified addresses from the volatile storage;

comparing each captured address of the captured addresses to retrieved identified addresses;

discarding a compared captured address without storing the compared captured address into the volatile storage if the compared captured address matches one of the retrieved identified addresses;

storing the compared captured address into the volatile storage if the compared captured address does not match one of the retrieved identified addresses; and

storing each stored compared captured address in the volatile storage into the non-volatile storage.

20. The method of claim 19 , wherein:

providing captured addresses includes providing captured row and column addresses of the detected defective memory cells; and

storing the compared captured address includes storing one of the captured row and column addresses and a volatile storage master bit into the volatile storage.