IP Library Granted Patent US 7,699,965
Granted Patent B2
US 7,699,965 · App. 12/282,933 · Granted Apr 20, 2010

Zinc oxide-based transparent conductor and sputtering target for forming the transparent conductor

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,699,965
App. No.
12/282,933
Granted
Apr 20, 2010
Kind
B2
Abstract

Proposed is a zinc oxide-based transparent conductor characterized in having zinc oxide as its primary component, containing an element at 1 to 10 atomic % which has a smaller ion radius than zinc in the zinc oxide and serves as an n-type dopant for the zinc oxide, and containing nitrogen in which the atomicity ratio of nitrogen in relation to the n-type dopant (nitrogen/n-type dopant) is 0.3 to 0.6. In the development of a transparent conductor that does not contain In, which is an expensive raw material with concern of resource depletion, the limit of the conventional development technique known as the single-dopant method is exceeded, a guide to dopant selection as a specific means for realizing the co-doping theory is indicated, and a transparent conductor having low resistivity is provided.

Claims (18)

1. A sputtering target for forming a zinc oxide-based transparent conductor comprising zinc oxide as its primary component, an element at 1 to 10 atomic % which has a smaller ion radius than zinc in the zinc oxide and serves as an n-type dopant for the zinc oxide, and containing nitrogen in which the atomicity ratio of nitrogen in relation to the n-type dopant (nitrogen/n-type dopant) is 0.3 to 0.6, and wherein the nitrogen is contained as gallium nitride.

2. The sputtering target for forming a zinc oxide-based transparent conductor according to claim 1 , wherein the element to serve as the n-type dopant is contained at 2 atomic % to 8 atomic %.

3. The sputtering target for forming a zinc oxide-based transparent conductor according to claim 2 , wherein the n-type dopant is gallium and/or aluminum.

4. The sputtering target for forming a zinc oxide-based transparent conductor according to claim 1 , wherein the n-type dopant is gallium or aluminum, or gallium and aluminum.

5. The sputtering target for forming a zinc oxide-based transparent conductor according to claim 1 , wherein the element to serve as the n-type dopant is contained at 2 atomic % to 8 atomic %.

6. The sputtering target for forming a zinc oxide-based transparent conductor according to claim 5 , wherein the n-type dopant is gallium or aluminum, or gallium and aluminum.

7. The sputtering target for forming a zinc oxide-based transparent conductor according to claim 1 , wherein the n-type dopant is gallium or aluminum, or gallium and aluminum.

8. A sputtering target for forming a transparent conductor, consisting of a sputtering target body consisting of zinc oxide as its primary component, 1 to 10 atomic % of an element which has a smaller ion radius than zinc in the zinc oxide and serves as an n-type dopant for the zinc oxide, and nitrogen in which the atomicity ratio of nitrogen in relation to the n-type dopant (number of atoms of nitrogen/number of atoms of the n-type dopant) is 0.3 to 0.6.

9. A sputtering target according to claim 8 , wherein the n-type dopant is gallium.

10. A sputtering target according to claim 9 , wherein nitrogen is contained as gallium nitride.

11. A sputtering target according to claim 10 , wherein the sputtering target body consists of a hot-pressed mixture of ZnO, Ga 2 O 3 and GaN powders.

12. A sputtering target according to claim 11 , wherein said sputtering target body is such that, when subjected to sputter-deposition, material deposited from said sputtering target body forms an n-type zinc oxide-based transparent conductor of low resistivity within a range of 0.18 to 0.85 mΩcm and of high transmittance of 90% or higher of light in the visible light region.

13. A sputtering target according to claim 8 , wherein the n-type dopant is aluminum.

14. A sputtering target according to claim 8 , wherein the n-type dopant is gallium and aluminum.

15. A sputtering target according to claim 14 , wherein nitrogen is contained as gallium nitride.

16. A sputtering target according to claim 15 , wherein the sputtering target body consists of a hot-pressed mixture of ZnO, Al 2 O 3 and GaN powders.

17. A sputtering target according to claim 16 , wherein said sputtering target body is such that, when subjected to sputter-deposition, material deposited from said sputtering target body forms an n-type zinc oxide-based transparent conductor of low resistivity within a range of 0.17 to 0.83 mΩcm and of high transmittance of 90% or higher of light in the visible light region.

18. A sputtering target according to claim 8 , wherein the element to serve as the n-type dopant is contained at 2 atomic % to 8 atomic %.

Assignments (3)
CHANGE OF ADDRESS Recorded Aug 11, 2021
From: JX NIPPON MINING & METALS CORPORATION
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 057160/0114 →
CHANGE OF ADDRESS Recorded Feb 7, 2017
From: JX NIPPON MINING & METALS CORPORATION
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 041649/0733 →
CHANGE OF NAME/MERGER Recorded Jun 9, 2011
From: NIPPON MINING & METALS CO., LTD.
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 026417/0023 →