Temperature-independent, linear on-chip termination resistance
View Patent ↗In one embodiment, an integrated circuit, such as an FPGA, has one or more programmable termination schemes, each having a plurality of resistive termination legs connected in parallel, and a calibration circuit designed to control each termination scheme for process, voltage, and temperature (PVT) variations. A sense element in the calibration circuit and each resistive leg in each termination scheme has a transistor-based transmission gate connected in series with a non-silicided poly (NSP) resistor. The negative temperature coefficient of resistivity of each NSP resistor offsets the positive temperature coefficient of resistivity of the corresponding transmission gate to provide a temperature-independent sense element and temperature-independent termination legs. The temperature-independence and constant IV characteristic of the sense element and termination legs enable a single calibration circuit to simultaneously control multiple termination schemes operating at different termination voltage levels.
1. An integrated circuit comprising:
a termination scheme having a plurality of legs each comprising a first resistive element having a positive temperature coefficient of resistivity connected in series to a second resistive element having a negative temperature coefficient of resistivity, the legs connected in parallel between a termination voltage and a pad; and
a calibration circuit adapted to generate corresponding temperature-independent control signals for selectively turning on or off corresponding legs in the termination scheme to set a net resistance of the termination scheme;
wherein the calibration circuit is further adapted to generate a temperature-independent sense voltage, the calibration circuit including a plurality of comparators for comparing the sense voltage with different reference voltages to generate the corresponding temperature-independent control signals based on the relative levels of the sense voltage and each reference voltage.
2. The integrated circuit of claim 1 , wherein one of the first resistive element and second resistive element is a transistor-based gate adapted to be turned on or off by a temperature-independent control signal from the calibration circuit.
3. The integrated circuit of claim 1 , wherein the first resistive element is a transistor-based gate adapted to be turned on or off by a temperature-independent control signal from the calibration circuit.
4. The integrated circuit of claim 1 , wherein the second resistive element is a non-silicided poly (NSP) resistor.
5. The integrated circuit of claim 1 , wherein each of the legs has a substantially zero temperature coefficient of resistivity.
6. The integrated circuit of claim 1 , wherein the calibration circuit includes a first resistive element having a positive temperature coefficient of resistivity and a second resistive element having a negative coefficient of resistivity for generating the temperature-independent control signals.
7. An integrated circuit comprising:
a termination scheme having a plurality of legs, each leg having a substantially zero temperature coefficient of resistivity, the legs connected in parallel between a termination voltage and a pad; and
a calibration circuit adapted to generate corresponding temperature-independent control signals for selectively turning on or off corresponding legs in the termination scheme to set a net resistance of the termination scheme;
wherein the calibration circuit is further adapted to generate a temperature-independent sense voltage, the calibration circuit including a plurality of comparators for comparing the sense voltage with different reference voltages to generate the corresponding temperature-independent control signals based on the relative levels of the sense voltage and each reference voltage.
8. The integrated circuit of claim 7 , wherein each leg comprises a transistor-based gate having a positive temperature coefficient of resistivity connected in series to a resistor having a negative temperature coefficient of resistivity, the transistor-based gate adapted to be turned on or off by a temperature-independent control signal from the calibration circuit.
9. The integrated circuit of claim 7 , wherein the calibration circuit includes a sense element having a substantially zero temperature coefficient of resistivity for generating the temperature-independent control signals.
10. The integrated circuit of claim 9 , wherein the sense element comprises a first resistive element having a positive temperature coefficient of resistivity and a second resistive element having a negative coefficient of resistivity.
11. An integrated circuit comprising:
a termination scheme having a plurality of substantially temperature-independent resistive legs, the legs connected in parallel between a termination voltage and a pad; and
a calibration circuit adapted to generate corresponding temperature-independent control signals for selectively turning on or off corresponding legs in the termination scheme to set a net resistance of the termination scheme
wherein the calibration circuit is further adapted to generate a temperature-independent sense voltage, the calibration circuit including a plurality of comparators for comparing the sense voltage with different reference voltages to generate the corresponding temperature-independent control signals based on the relative levels of the sense voltage and each reference voltage.
12. The integrated circuit of claim 11 , wherein the calibration circuit includes a sense element having a substantially zero temperature coefficient of resistivity for generating the temperature-independent control signals.
13. The integrated circuit of claim 12 , wherein the sense element comprises a first resistive element having a positive temperature coefficient of resistivity and a second resistive element having a negative coefficient of resistivity.
14. An integrated circuit comprising:
a programmable termination scheme; and
a calibration circuit adapted to generate a temperature-independent control signal for configuring the termination scheme;
wherein the calibration circuit includes an on-chip sense element for generating a temperature-independent sense voltage for the temperature-independent control signal, the on-chip sense element including a first resistive element having a positive temperature coefficient of resistivity and a second resistive element having a negative coefficient of resistivity.
15. The integrated circuit of claim 14 , wherein the calibration circuit is adapted to generate a temperature-independent sense voltage, and the calibration circuit includes at least one comparator for comparing the temperature-independent sense voltage with a reference voltage to generate at least one temperature-independent control signal based on the relative levels of the temperature-independent sense voltage and the reference voltage.