IP Library Granted Patent US 8,358,526
Granted Patent B2
US 8,358,526 · App. 12/395,071 · Granted Jan 22, 2013

Diagonal connection storage array

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,358,526
App. No.
12/395,071
Granted
Jan 22, 2013
Kind
B2
Abstract

In one aspect, an electronic memory array includes overlapping, generally parallel sets of conductors, and includes storage elements near each point of overlap. One set of conductors has a non-negligible resistance. An address path for each storage element traverses a portion of one each of the first and second sets of conductors and a selectable resistance element. All storage element address paths have substantially equivalent voltage drops across the corresponding storage elements.

Claims (33)

1. An electronic memory array comprising:

a first plurality of generally parallel conductors each having a non-negligible resistance;

a second plurality of generally parallel conductors, each having a non-negligible resistance, overlapping the first plurality of generally parallel conductors;

a plurality of storage elements each disposed proximate a point of overlap between the first and second pluralities of generally parallel conductors;

one or more first power busses (i) generally parallel to the second plurality of generally parallel conductors and (ii) each having a non-negligible resistance; and

one or more second power busses (i) generally parallel to the first plurality of generally parallel conductors and (ii) each having a non-negligible resistance

wherein an address path for each storage element (i) is unique and (ii) traverses at least a portion of one of the first plurality of generally parallel conductors, at least a portion of one of the second plurality of generally parallel conductors, at least a portion of one of the first power busses, and at least a portion of one of the second power busses, and all storage element address paths have substantially equivalent voltage drops across the corresponding storage elements.

2. The electronic memory array of claim 1 , wherein each first power bus receives, at one end only, voltage from a first voltage source, a voltage potential on the first power bus decreasing with increasing distance from the first voltage source, and wherein the first power bus supplies power to the first plurality of generally parallel conductors.

3. The electronic memory array of claim 2 , wherein each second power bus receives, at one end only, voltage from a second voltage source, a voltage potential on the second power bus decreasing with decreasing distance from the second voltage source, and wherein the second power bus supplies power to the second plurality of generally parallel conductors.

4. The electronic memory array of claim 3 , wherein first and second voltage sources are disposed at diagonally opposite corners of the electronic memory array.

5. The electronic memory array of claim 1 , wherein the storage element is at least one of a fuse, an antifuse, a phase change material, and a programmable field-emitter element.

6. The electronic memory array of claim 2 , further comprising a first driver for receiving power from the first power bus and supplying power to one of the first plurality of generally parallel conductors.

7. The electronic memory array of claim 6 , wherein the first driver comprises a field-effect transistor.

8. The electronic memory array of claim 3 , further comprising a second driver for receiving power from the second power bus and supplying power to one of the second plurality of generally parallel conductors.

9. The electronic memory array of claim 8 , wherein the second driver comprises a field-effect transistor and a signal sense circuit.

10. The electronic memory array of claim 9 , wherein the signal sense circuit determines a state of the storage element at by sensing at least one of a current through and a voltage on the storage element.

11. The electronic memory array of claim 3 , further comprising a first driver on a first side of the electronic memory array and a second driver on a second, opposite side of the electronic memory array, the first and second drivers providing power to the first plurality of generally parallel conductors, wherein the second voltage source is connected to a first end of the second power bus when the first driver is active and to a second end of the second power bus when the second driver is active.

12. The electronic memory array of claim 2 , further comprising a first driver on a first side of the electronic memory array and a second driver on a second, opposite side of the electronic memory array, the first and second drivers providing power to the second plurality of generally parallel conductors, wherein the first voltage source is connected to a first end of the first power bus when the first driver is active and to a second end of the first power bus when the second driver is active.

13. The electronic memory array of claim 2 , wherein the first power bus has a resistivity per unit length approximately equal to that of one of the second plurality of generally parallel conductors.

14. The electronic memory array of claim 3 , wherein the second power bus has a resistivity per unit length approximately equal to that of one of the first plurality of generally parallel conductors.

15. A method for addressing a storage element in an electronic memory array, the method comprising:

selecting one of a first plurality of generally parallel conductors each having a non-negligible resistance;

selecting one of a second plurality of generally parallel conductors, each having a non-negligible resistance, overlapping the first plurality of generally parallel conductors;

supplying power to the first plurality of generally parallel conductors with one or more first power busses;

supplying power to the second plurality of generally parallel conductors with one or more second power busses; and

addressing one of a plurality of storage elements each disposed proximate a point of overlap between the first and second pluralities of generally parallel conductors,

wherein an address path for each storage element (i) is unique and (ii) traverses at least a portion of one of the first plurality of generally parallel conductors, at least a portion of one of the second plurality of generally parallel conductors, at least a portion of one of the first power busses, and at least a portion of one of the second power busses, and all storage element address paths have substantially equivalent voltage drops across the corresponding storage elements.

16. The method of claim 15 , wherein each first power bus receives, at one end only, voltage from a first voltage source, a voltage potential on the first power bus decreasing with increasing distance from the first voltage source.

17. The method of claim 16 , wherein each second power bus receives, at one end only, voltage from a second voltage source, a voltage potential on the second power bus decreasing with decreasing distance from the second voltage source.

18. The method of claim 17 , wherein first and second voltage sources are disposed at diagonally opposite corners of the electronic memory array.

19. The method of claim 15 , wherein the storage element is at least one of a fuse, an antifuse, a phase change material, and a programmable field-emitter element.

20. The method of claim 16 , further comprising switching the voltage received from the first voltage source from a first end of the first power bus to a second end of the first power bus based on a received column address.

21. The method of claim 17 , further comprising switching the voltage received from the second voltage source from a first end of the second power bus to a second end of the second power bus based on a received row address.

Assignments (17)
CHANGE OF NAME Recorded Jun 27, 2024
From: SANDISK TECHNOLOGIES, INC.
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 067982/0032 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 29, 2024
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 067567/0682 →
PATENT COLLATERAL AGREEMENT - A&R LOAN AGREEMENT Recorded Aug 21, 2023
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 064715/0001 →
PATENT COLLATERAL AGREEMENT - DDTL LOAN AGREEMENT Recorded Aug 21, 2023
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 067045/0156 →
RELEASE OF SECURITY INTEREST AT REEL 039389 FRAME 0684 Recorded Feb 8, 2022
From: JPMORGAN CHASE BANK, N.A.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 058965/0535 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2018
From: HGST, INC.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 046939/0587 →
RELEASE OF SECURITY INTEREST Recorded Aug 16, 2016
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: HGST, INC.
Reel/Frame 039689/0950 →
SECURITY AGREEMENT Recorded Jul 19, 2016
From: HGST, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 039389/0684 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NAME AND ADDRESS OF THE ASSIGNEE PREVIOUSLY RECORDED ON REEL 035748 FRAME 0909. ASSIGNOR(S) HEREBY CONFIRMS THE NAME AND ADDRESS OF THE ASSIGNEE SI HGST, INC.,3403 YERBA BUENA ROAD,SAN JOSE, CA 95135. Recorded Jun 2, 2015
From: CONTOUR SEMICONDUCTOR, INC.
To: HGST, INC.
Reel/Frame 035831/0594 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 21, 2015
From: CONTOUR SEMICONDUCTOR, INC.
To: HGST NETHERLANDS B.V.
Reel/Frame 035748/0909 →
RELEASE OF SECURITY INTEREST Recorded May 20, 2015
From: AMERICAN CAPITAL, LTD.; STILL RIVER FUND III, LIMITED PARTNERSHIP; SARAH G. KURZON 2001 REVOCABLE TRUST; OVONYX, INC.; PERRIN, DONALD; RUNNING DEER FOUNDATION; RUNNING DEER TRUST
To: CONTOUR SEMICONDUCTOR, INC.
Reel/Frame 035749/0956 →
RELEASE OF SECURITY INTEREST Recorded May 15, 2015
From: AMERICAN CAPITAL, LTD.; STILL RIVER FUND III, LIMITED PARTNERSHIP; SARAH G. KURZON 2001 REVOCABLE TRUST; OVONYX, INC.; PERRIN, DONALD; RUNNING DEER FOUNDATION; RUNNING DEER TRUST
To: CONTOUR SEMICONDUCTOR, INC.
Reel/Frame 035685/0571 →
RELEASE OF SECURITY INTEREST Recorded Jun 24, 2014
From: AMERICAN CAPITAL, LTD.
To: CONTOUR SEMICONDUCTOR, INC.
Reel/Frame 033225/0330 →
SECURITY INTEREST Recorded Jun 20, 2014
From: CONTOUR SEMICONDUCTOR, INC.
To: AMERICAN CAPITAL, LTD.; STILL RIVER FUND III, LIMITED PARTNERSHIP; SARAH G. KURZON 2001 REVOCABLE TRUST; OVONYX, INC.; PERRIN, DONALD; RUNNING DEER FOUNDATION; RUNNING DEER TRUST
Reel/Frame 033204/0428 →
SECURITY INTEREST Recorded May 30, 2014
From: CONTOUR SEMICONDUCTOR, INC.
To: AMERICAN CAPITAL, LTD.
Reel/Frame 033063/0617 →
SECURITY AGREEMENT Recorded Jan 18, 2013
From: CONTOUR SEMICONDUCTOR, INC.
To: AMERICAN CAPITAL, LTD.; STILL RIVER FUND III, LIMITED PARTNERSHIP; RUNNING DEER TRUST; RUNNING DEER FOUNDATION; SARAH G. KURZON 2001 REVOCABLE TRUST; PERRIN, DONALD
Reel/Frame 029659/0615 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2009
From: SHEPARD, DANIEL R.
To: CONTOUR SEMICONDUCTOR, INC.
Reel/Frame 022599/0511 →