Semiconductor package and method therefor
In one embodiment, a semiconductor package is formed to include a tamper barrier that is positioned between at least a portion of the connection terminals of the semiconductor package and an edge of the semiconductor package.
1. A semiconductor package comprising:
a package body having a first surface, the first surface having a first edge and a second edge;
a first plurality of connection terminals on a first surface of the package body and configured to be coupled to a second plurality of connection points on a semiconductor die that is within the package body; and
a conductor on the first surface of the package body and positioned between at least a portion of the first plurality of connection terminals and a first edge of the first surface of the package body wherein the conductor is approximately a first distance from the portion of the first plurality of connection terminals, the conductor configured to be electrically coupled to a common voltage potential external to the package body and configured to be electrically disconnected from the semiconductor die.
2. The semiconductor package of claim 1 wherein the first distance is small enough to prevent inserting an electrical probe under the package body and making electrical contact between the electrical probe and the portion of the first plurality of connection terminals without making electrical contact between the electrical probe and the conductor.
3. The semiconductor package of claim 1 wherein the first distance is no greater than approximately 0.1 mm.
4. The semiconductor package of claim 1 wherein the first distance is no greater than approximately 0.06 mm.
5. The semiconductor package of claim 1 wherein the first distance is approximately 0.05 to 0.06 mm.
6. The semiconductor package of claim 1 wherein the conductor is a metal strip extending adjacent the first edge.
7. The semiconductor package of claim 1 wherein the conductor is a plurality of metal elements with each metal element having a geometric shape extending adjacent the first edge.
8. The semiconductor package of claim 7 wherein the plurality of metal elements have a geometric shape that is substantially similar to a shape of the portion of the first plurality of connection terminals.
9. The semiconductor package of claim 1 wherein the semiconductor package is a BCC type of laminate package.