IP Library Granted Patent US 8,179,156
Granted Patent B2
US 8,179,156 · App. 12/621,951 · Granted May 15, 2012

Capacitor test method and circuit therefor

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Quick Facts
Patent No.
US 8,179,156
App. No.
12/621,951
Granted
May 15, 2012
Kind
B2
Abstract

In one embodiment, a closed loop control system is caused to operate in an open loop configuration. At some time while operating in the open loop configuration the system detected the presence or absence of a.c. signals in an output signal of the system in order to detect the presence or absence of a failure of a control loop element, such as an output capacitor.

Claims (35)

1. A voltage regulator having a component test circuit comprsing:

the voltage regulator configured to receive an input voltage and form an output current to charge an output capacitor in order to form an output voltage on an output of the voltage regulator, the voltage regulator having a normal operating mode and a open loop operating mode;

an error amplifier coupled to receive a feedback voltage that is representative of the output voltage and form an error signal on an output of the error amplifier, the voltage regulator configured to regulate the output voltage responsively to the feedback voltage during the normal operating mode;

a current control circuit configured to receive the error signal from the error amplifier and store a value of the error signal during the normal operating mode, the current control circuit configured to form an output signal that is representative of the stored value of the error signal during the open loop operating mode;

an output circuit configured to receive the output signal from the current control circuit during the open loop operating mode and form the output current to be representative of the output signal;

a first circuit configured to receive the output voltage and detect a.c. signals on d.c. value of the output voltage, the first circuit configured to form a first control signal indicating detection of the a.c. signals; and

a logic circuit coupled to receive the first control signal and to use the first control signal to assert a second control signal and set the operating mode of the voltage regulator to the open loop operating mode, the logic circuit configured to use the first control signal to detect a component failure and responsively assert a third control signal after detecting the component failure.

2. The voltage regulator of claim 1 wherein the voltage regulator regulates the output voltage as a linear voltage regulator that regulates the output voltage in a linear manner and wherein the voltage regulator is not a switching regulator that switches the output current between an on state and an off state in order to regulate the value of the output voltage during the normal operating mode.

3. The voltage regulator of claim 1 wherein the current control circuit includes a storage capacitor coupled to store a voltage that is representative of the error signal of the error amplifier, a switch to decouple the storage capacitor from the output of the error amplifier responsively to operating in the open loop operating mode, and a voltage to current conversion circuit that forms the output signal of the current control circuit as a substantially constant current on the output of the current control circuit.

4. The voltage regulator of claim 1 wherein the logic circuit sets the operating mode to the open loop operating mode and asserts the second control signal if the a.c. signals continue for at least time interval during the normal operating mode.

5. The voltage regulator of claim 4 wherein the logic circuit is configured to receive the first control signal and if the first control signal remains asserted for the time interval then responsively assert the second control signal and set the voltage regulator to operate in the open loop operating mode.

6. The voltage regulator of claim 1 wherein the logic circuit is configured to detect the component failure and assert the third control signal responsively to an absence of a.c. signals for a time interval during the open loop operating mode.

7. The voltage regulator of claim 1 further including an under-voltage detector circuit and an over-voltage detector circuit wherein the logic circuit is configured to detect a missing connection between the output capacitor and the output of the voltage regulator responsively to receiving an over-voltage or an under-voltage detection while operating in the open loop operating mode.

8. A method of forming a voltage regulator having a component test circuit comprising:

configuring the voltage regulator to receive an input voltage and form an output current to charge a capacitor in order to regulate an output voltage on an output of the voltage regulator, the voltage regulator having a normal operating mode and a open loop operating mode;

configuring the voltage regulator to receive a feedback signal that is representative of the output voltage and regulate the output voltage responsively to the feedback signal during the normal operating mode;

configuring a first circuit to detect a.c. signals of the output voltage;

configuring a second circuit to set the voltage regulator to operate in the open loop operating mode responsively to the first circuit detecting the a.c. signals on the output voltage for a first time interval; and

configuring the second circuit to detect a component failure responsively to the first circuit not detecting a.c. signals on the output voltage responsively to the voltage regulator operating in the open loop operating mode and to detect an absence of the component failure responsively to the first circuit detecting a presence of a.c. signals on the output voltage while operating in the open loop operating mode.

9. The method of claim 8 further including configuring an output circuit to use a signal derived from the feedback signal to regulate the output voltage responsively to operating in the normal operating mode and to use a control signal having a substantially fixed value to form the output voltage responsively to operating in the open loop operating mode.

10. The method of claim 8 wherein configuring the second circuit to set the voltage regulator to operate in the open loop operating mode includes configuring the second circuit to set the voltage regulator to operate in the open loop operating mode responsively to the first circuit detecting the a.c. signals for a time interval while operating in the normal operating mode.

11. The method of claim 10 wherein configuring the second circuit to set the voltage regulator to operate in the open loop operating mode responsively to the first circuit detecting the a.c. signals for the time interval while operating in the normal operating mode includes configuring the second circuit to receive a detected signal from the first circuit representing presence of the a.c. signals and to determine if the detected signal represents the presence of the a.c. signals for the time interval.

12. The method of claim 8 wherein configuring the second circuit to detect the component failure includes configuring the second circuit to determine the component failure responsively to the first circuit not detecting the a.c. signals for a time interval after operating in the open loop operating mode.

13. The method of claim 12 further including configuring the second circuit to assert a failed control signal responsively to determining the component failure.

14. The method of claim 8 further including configuring the second circuit to determine an absence of a connection between the capacitor and the output of the voltage regulator responsively to receiving an over-voltage or under-voltage condition while operating in the open loop operating mode.

15. A method of forming a test circuit comprising:

configuring an control circuit to operate in an analog mode to receive an input voltage and form an output current to charge an output capacitor in order to form an output signal on an output of the control circuit, the control circuit having a normal operating mode and a open loop operating mode;

configuring the control circuit to receive a feedback signal that is representative of the output signal and regulate the output signal responsively to the feedback signal during the normal operating mode;

configuring the control circuit to detect. a.c. signals on the output signal and responsively set the control circuit to operate in an open loop operating mode; and

configuring the control circuit to determine a component failure by determining if the a.c. signal discontinues while operating in the open loop operating mode.

16. The method of claim 15 wherein configuring the control circuit to detect a.c. signals in the output signal includes configuring the control circuit to set the control circuit to operate in the open loop operating mode responsively to detecting the a.c. signals for a first time interval while operating in the normal operating mode.

17. The method of claim 15 further including configuring the control circuit to determine an absence of the component failure by determining if the a.c. signals continue to be detected while operating in the open loop operating mode.

18. The method of claim 17 wherein configuring the control circuit to determine if the output capacitor is present includes configuring the control circuit to determine if the a.c. signals continue to be detected for a second time interval while operating in the open loop operating mode.

19. The method of claim 18 wherein configuring the control circuit to determine if the output capacitor is absence includes configuring the control circuit to determine if the a.c. signals are absent for the second time interval while operating in the open loop operating mode.

20. The method of claim 15 wherein configuring the control circuit to detect a.c. signals on the output signal and responsively set the control circuit to operate in the open loop operating mode includes configuring the control circuit to form an output current in the open loop operating mode responsively to a signal having a substantially fixed value and not to the feedback signal.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
RELEASE OF SECURITY INTEREST Recorded May 6, 2016
From: JPMORGAN CHASE BANK, N.A. (ON ITS BEHALF AND ON BEHALF OF ITS PREDECESSOR IN INTEREST, CHASE MANHATTAN BANK)
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 038632/0074 →
RELEASE OF SECURITY INTEREST Recorded May 6, 2016
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT AND COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 038631/0345 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
SECURITY AGREEMENT Recorded Mar 17, 2010
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024094/0429 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 19, 2009
From: HORSKY, PAVEL; KAMENICKY, PETR
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 023544/0377 →