System for testing semiconductors

1. A probing system for a device under test comprising:

(a) an objective lens sensing said device under test through a single optical path;

(b) a first imaging device sensing a first video sequence of said device under test at a first magnification from said single optical path;

(c) a second imaging device sensing a second video sequence of said device under test at a second magnification from said single optical path;

(d) a third imaging device sensing a third video sequence of said device under test at a third magnification from said single optical path;

(e) providing a video signal to a display that simultaneously presents said first video signal, said second video signal, and said third video signal to a monitor.

2. The probing system of claim 1 wherein said first video signal is presented in a first window, said second video signal is presented in a second window, and said third video signal is presented in a third window.

3. A probing system for a device under test comprising:

(a) an objective lens sensing said device under test through a single optical path;

(b) a first imaging device sensing a first video sequence of said device under test at a first magnification from said single optical path;

(c) a second imaging device sensing a second video sequence of said device under test at a second magnification from said single optical path;

(d) simultaneously providing said first video sequence, and said second video sequence, to a display;

(e) wherein the magnification of said first video signal is selectable and the magnification of said second video signal is selectable.

4. The probing system of claim 3 wherein said magnification of said first video signal includes a range of at least 5% of the total range of magnification that is not selectable by said user.

5. A probing system for a device under test comprising:

(a) an objective lens sensing said device under test through a single optical path;

(b) an imaging device sensing a video sequence of said device under test at a first magnification from said single optical path;

(c) a display displaying the video sequence in a first window; said display displaying a region of said first video sequence in a second window.

6. The probing system of claim 5 wherein said video displayed in said second window is from another imaging device at a second magnification from said single optical path.

7. A method for displaying video for a probing system comprising:

(a) receiving a video signal of a device under test;

(b) presenting said video signal in a first window on a display;

(c) simultaneously presenting a first portion of said video signal in a second window on a portion of said display; and

(d) simultaneously presenting a second portion of said video signal in a third window on a portion of said display;

(e) wherein a part of said video signal comprising the first portion and a part of said video signal comprising said second portion are selectable by an operator.

8. The method of claim 7 further comprising a third portion of said video signal presented in a fourth window, a fourth portion of said video signal presented in a fifth window, a fifth portion of said video signal presented in a sixth window, and a sixth portion of said video signal presented in a seventh window.

9. The method of claim 8 wherein said second, third, fourth, fifth, sixth, and seventh windows are arranged in a 2×3 format.

10. The method of claim 8 wherein said second, third, fourth, fifth, sixth, and seventh windows are arranged in a 3×2 format.