Alignment apparatus, substrates stacking apparatus, stacked substrates manufacturing apparatus, exposure apparatus and alignment method

1. A substrate stacking apparatus comprising:

a first aligner that aligns a first substrate to a first substrate reference position and a second substrate to a second substrate reference position;

a first table that receives and has the first substrate that has been aligned by the first aligner placed thereon;

a second table that receives and has the second substrate that has been aligned by the first aligner placed thereon so as to oppose the first substrate, the second table being movable relative to the first table; and

a second aligner that aligns, to a first substrate holder reference position, a first substrate holder adapted to hold the first substrate that has been aligned by the first aligner and aligns, to a second substrate holder reference position, a second substrate holder adapted to hold the second substrate that has been aligned by the first aligner, wherein

the substrate stacking apparatus aligns, relative to each other, the first substrate and the second substrate while the first substrate is on the first table and the second substrate is on the second table and then stacks the first substrate and the second substrate on one another, and

at least one of the first aligner and the second aligner performs alignment such that a positional relation between the first substrate and the first substrate holder and a positional relation between the second substrate and the second substrate holder fall in a predetermined range.

2. The substrate stacking apparatus as set forth in claim 1 , wherein

the first substrate is aligned with reference to a position of a reference mark of the first substrate holder that has the first substrate loaded thereon, and

the second substrate is aligned with reference to a position of an alignment mark of the second substrate.

3. The substrate stacking apparatus as set forth in claim 1 , wherein

the first substrate is aligned with reference to a position of a reference mark of the first substrate holder that has the first substrate loaded thereon, and

the second substrate is aligned with reference to an amount of movement of a stage that supports the second substrate and the second substrate holder that holds the second substrate.

4. A multilayered substrate manufacturing apparatus comprising:

the substrate stacking apparatus as set forth in claim 1 ; and

a pressurizing section that applies a pressure to the first and second substrates that have been stacked on one another to permanently bond the first and second substrates to each other.

5. The substrate stacking apparatus as set forth in claim 1 , further comprising

a transporter that transports onto the first table the first substrate holder that has been aligned by the second aligner and transports onto the second table the second substrate holder that has been aligned by the second aligner.

6. A substrate stacking apparatus as set forth in claim 1 , wherein

the second aligner aligns the first substrate holder while no substrate is held by the substrate holder,

the substrate stacking apparatus further comprises a position detector that detects a position of an alignment mark of the first substrate while the first substrate is held by the first substrate holder, and

the position detector observes a reference mark formed on the first substrate holder that is capable of being observed from front and back sides of the first substrate holder.

7. The substrate stacking apparatus as set forth in claim 1 , wherein

the second aligner aligns the first substrate holder while the first substrate is not held by the first substrate holder, and

the substrate stacking apparatus further comprises a position detector that detects a position of an alignment mark of the first substrate while the first substrate is held by the first substrate holder.

8. The substrate stacking apparatus as set forth in claim 1 , further comprising

a transporter that transports the first and second substrate holders onto the first and second tables, wherein

the position detector detects positions of alignment marks of the first and second substrates while the first and second substrates are held by the first and second substrate holders and the first and second substrate holders are on the first and second tables.

9. The substrate stacking apparatus as set forth in claim 1 , wherein

the position detector detects a relative position of one of the first and second substrates with respect to the position detector and a relative position of another of the first and second substrates with respect to the position detector.

10. The substrate stacking apparatus as set forth in claim 1 , wherein

the first substrate reference position is the same as the second substrate reference position, and the first substrate holder reference position is the same as the second substrate holder reference position.

11. The substrate stacking apparatus as set forth in claim 1 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

12. The substrate stacking apparatus as set forth in claim 1 , further comprising

a detector that detects an alignment mark of the first substrate that has been aligned by the first aligner and an alignment mark of the second substrate that has been aligned by the first aligner, wherein

the first aligner aligns the first substrate and the second substrate in such a manner that the alignment marks of the first and second substrates are arranged within a detectable region of the detector.

13. The substrate stacking apparatus as set forth in claim 8 , wherein

the transporter transports each of the first and second substrate holders with a corresponding one of the first and second substrates being held thereon.

14. The substrate stacking apparatus as set forth in claim 8 , wherein

the position detector includes a camera that observes the substrate on the first table and a camera that observes the substrate on the second table.

15. The substrate stacking apparatus as set forth in claim 9 , wherein

the position detector includes a microscope and detects a positional relation between each of the first and second substrates and a mark arranged within a field of view of the microscope.

16. The substrate stacking apparatus as set forth in claim 10 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

17. The substrate stacking apparatus as set forth in claim 11 , wherein

the position measuring section is an interferometer.

18. The substrate stacking apparatus as set forth in claim 16 , wherein

the position measuring section is an interferometer.

19. The substrate stacking apparatus as set forth in claim 12 , wherein

the detector detects the alignment mark of the first substrate while the first substrate is held on the first substrate holder and the first substrate holder is on the first table and the alignment mark of the second substrate while the second substrate is held on the second substrate holder and the second substrate holder is on the second table.

20. The substrate stacking apparatus as set forth in claim 12 , wherein

the detector detects a relative position of the first substrate with respect to the detector and a relative position of the second substrate with respect to the detector.

21. The substrate stacking apparatus as set forth in claim 12 , wherein

the detector includes a microscope and the detectable region is a field of view of the microscope.

22. The substrate stacking apparatus as set forth in claim 20 , wherein

the detector includes a microscope and detects a positional relation between a mark arranged within a field of view of the microscope and each of the first and second substrates.

23. A substrate stacking apparatus comprising:

an aligner that aligns a first substrate to a first substrate reference position and a second substrate to a second substrate reference position;

a first table that receives and has the first substrate that has been aligned by the aligner placed thereon; and

a second table that receives and has the second substrate that has been aligned by the aligner placed thereon so as to oppose the first substrate, the second table being movable relative to the first table, wherein

the substrate stacking apparatus aligns, relative to each other, the first substrate and the second substrate while the first substrate is on the first table and the second substrate is on the second table and then stacks the first substrate and the second substrate on one another, and

the aligner aligns the first substrate and the second substrate in such a manner that a difference between a relative position of the first substrate with respect to the first substrate reference position and a relative position of the second substrate with respect to the second substrate reference position falls in a predetermined range.

24. The substrate stacking apparatus as set forth in claim 23 , wherein

the first substrate reference position is the same as the second substrate reference position.

25. The substrate stacking apparatus as set forth in claim 23 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

26. The substrate stacking apparatus as set forth in claim 23 , further comprising:

a detector that detects an alignment mark of the first substrate that has been aligned by the aligner and an alignment mark of the second substrate that has been aligned by the aligner, wherein

the aligner aligns the first substrate and the second substrate in such a manner that the alignment marks of the first and second substrates are arranged within a detectable region of the detector.

27. The substrate stacking apparatus as set forth in claim 24 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

28. A substrate stacking apparatus comprising:

a first aligner that aligns a first substrate to a first substrate reference position and a second substrate to a second substrate reference position;

a second aligner that aligns, to a first substrate holder reference position, a first substrate holder adapted to hold the first substrate that has been aligned by the first aligner and aligns, to a second substrate holder reference position, a second substrate holder adapted to hold the second substrate that has been aligned by the first aligner, wherein

the substrate stacking apparatus aligns, relative to each other, the first substrate and the second substrate and then stacks the first substrate and the second substrate on one another, and

at least one of the first aligner and the second aligner performs alignment such that a positional relation between the first substrate and the first substrate holder and a positional relation between the second substrate and the second substrate holder fall in a predetermined range.

29. The substrate stacking apparatus as set forth in claim 28 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

30. The substrate stacking apparatus as set forth in claim 28 , further comprising:

a detector that detects an alignment mark of the first substrate that has been aligned by the first aligner and an alignment mark of the second substrate that has been aligned by the first aligner, wherein

the first aligner aligns the first substrate and the second substrate in such a manner that the alignment marks of the first and second substrates are arranged within a detectable region of the detector.

31. The substrate stacking apparatus as set forth in claim 28 , wherein

the first substrate reference position is the same as the second substrate reference position, and the first substrate holder reference position is the same as the second substrate holder reference position.

32. The substrate stacking apparatus as set forth in claim 31 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

33. A substrate stacking apparatus comprising:

an aligner that aligns, in a first alignment action, a first substrate to a first substrate reference position and a second substrate to a second substrate reference position, wherein

the substrate stacking apparatus aligns, separately and/or after the first alignment action, the first substrate and the second substrate relative to each other while the first substrate is on a first table and the second substrate is on a second table and then stacks the first substrate and the second substrate on one another, and

the aligner aligns, in the first alignment action, the first substrate and the second substrate in such a manner that a difference between a relative position of the first substrate with respect to the first substrate reference position and a relative position of the second substrate with respect to the second substrate reference position falls in a predetermined range.

34. The substrate stacking apparatus as set forth in claim 33 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

35. The substrate stacking apparatus as set forth in claim 33 , further comprising:

a detector that detects an alignment mark of the first substrate that has been aligned by the aligner and an alignment mark of the second substrate that has been aligned by the aligner, wherein

the aligner aligns the first substrate and the second substrate in such a manner that the alignment marks of the first and second substrates are arranged within a detectable region of the detector.

36. The substrate stacking apparatus as set forth in claim 33 , wherein

the first substrate reference position is the same as the second substrate reference position.

37. The substrate stacking apparatus as set forth in claim 36 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

38. A substrate stacking apparatus comprising:

an aligner that aligns a first substrate to a first substrate reference position and a second substrate to a second substrate reference position;

a first table that receives and has the first substrate that has been aligned by the aligner placed thereon; and

a second table that receives and has the second substrate that has been aligned by the aligner placed thereon so as to oppose the first substrate, the second table being movable relative to the first table, wherein

the substrate stacking apparatus aligns, relative to each other, the first substrate and the second substrate while the first substrate is on the first table and the second substrate is on the second table and then stacks the first substrate and the second substrate on one another, and

the aligner aligns the first substrate with respect to the first substrate reference position and aligns the second substrate with respect to the second substrate reference position in such a manner that a difference between the positions of the first substrate and the second substrate falls in a predetermined range.

39. The substrate stacking apparatus as set forth in claim 38 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

40. The substrate stacking apparatus as set forth in claim 38 , further comprising:

a detector that detects an alignment mark of the first substrate that has been aligned by the aligner and an alignment mark of the second substrate that has been aligned by the aligner, wherein

the aligner aligns the first substrate and the second substrate in such a manner that the alignment marks of the first and second substrates are arranged within a detectable region of the detector.

41. The substrate stacking apparatus as set forth in claim 38 , wherein

the first substrate reference position is the same as the second substrate reference position.

42. The substrate stacking apparatus as set forth in claim 41 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

43. A substrate stacking apparatus comprising:

an aligner that aligns, in a first alignment action, a first substrate to a first substrate reference position and a second substrate to a second substrate reference position, wherein

the substrate stacking apparatus aligns, separately and/or after the first alignment action, the first substrate and the second substrate relative to each other while the first substrate is on a first table and the second substrate is on a second table and then stacks the first substrate and the second substrate on one another, and

the aligner aligns, in the first alignment action, the first substrate with respect to the first substrate reference position and aligns the second substrate with respect to the second substrate reference position in such a manner that a difference between the positions of the first substrate and the second substrate falls in a predetermined range.

44. The substrate stacking apparatus as set forth in claim 43 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.

45. The substrate stacking apparatus as set forth in claim 43 , further comprising:

a detector that detects an alignment mark of the first substrate that has been aligned by the aligner and an alignment mark of the second substrate that has been aligned by the aligner, wherein

the aligner aligns the first substrate and the second substrate in such a manner that the alignment marks of the first and second substrates are arranged within a detectable region of the detector.

46. The substrate stacking apparatus as set forth in claim 43 , wherein

the first substrate reference position is the same as the second substrate reference position.

47. The substrate stacking apparatus as set forth in claim 46 , further comprising:

an actuating section that moves the first table and the second table relative to each other; and

a position measuring section that measures a positional relation between the first table and the second table, wherein

the predetermined range is set so as to allow the position measuring section to measure the positional relation when the first table and the second table are moved by the actuating section.