IP Library Granted Patent US 8,659,146
Granted Patent B2
US 8,659,146 · App. 12/813,903 · Granted Feb 25, 2014

Lead frame based, over-molded semiconductor package with integrated through hole technology (THT) heat spreader pin(s) and associated method of manufacturing

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Quick Facts
Patent No.
US 8,659,146
App. No.
12/813,903
Granted
Feb 25, 2014
Kind
B2
Abstract

A method and apparatus are provided for manufacturing a lead frame based, over-molded semiconductor package ( 7 ) with an exposed pad or power die flag ( 70 ) having multiple integrated THT heat spreader pins ( 71 ) configured for insertion into one or more vias ( 77 ) formed in a printed circuit board ( 78 ). The through hole heat spreader pins ( 71 ) may be formed as an integral part of the exposed pad ( 52 ) or may be solidly connected with the exposed pad ( 62 ).

Claims (29)

1. A lead frame-based, over-molded semiconductor package comprising an exposed pad formed with a single, thermally conductive material and a plurality of THT heat spreader pins formed with the thermally conductive material and configured for insertion into corresponding vias formed in a printed circuit board.

2. The semiconductor package of claim 1 , further comprising a plurality of input/output (I/O) pads disposed within the mold structure having exposed I/O pad surfaces.

3. The semiconductor package of claim 1 , where said plurality of THT heat spreader pins are formed as an integral part of the exposed pad.

4. The semiconductor package of claim 1 , where said plurality of THT heat spreader pins are formed separately from the exposed pad and are attached to the exposed pad.

5. The semiconductor package of claim 1 , where the over-molded semiconductor package comprises a PQFN, QFN, HSOP, SOIC, QFP, TQFP or MO-188 package.

6. The semiconductor package of claim 1 , where said exposed pad and THT heat spreader pins are formed with copper.

7. An electronic device comprising a package structure comprising:

a mold structure comprising a first exposed surface;

a die disposed within the mold structure; and

a plurality of input/output (I/O) pads disposed within the mold structure being exposed on the first exposed surface;

a die attach pad coupled to the die, said die attach pad comprising a first surface exposed from the mold structure and a first plurality of through hole technology heat spreader pins protruding from the first surface and past the plurality of I/O pads.

8. The electronic device of claim 7 , where the first plurality of through hole technology heat spreader pins and the first surface of the die attach pad are exposed from the first exposed surface of the mold structure.

9. The electronic device of claim 7 , further comprising a heat sink disposed in thermal communication with the first plurality of through hole technology heat spreader pins of the die attach pad.

10. The electronic device of claim 7 , where the first plurality of through hole technology heat spreader pins is inserted into the die attach pad.

11. The electronic device of claim 7 , where the first plurality of through hole technology heat spreader pin is formed as an integral part of the die attach pad.

12. A semiconductor package, comprising:

a die pad comprising first and second opposite surfaces with one or more through hole technology (THT) heat spreader structures protruding through the first surface of the die pad by a first distance;

an integrated circuit die affixed to the second surface of the die pad;

a mold compound encasing the integrated circuit die and die pad, leaving exposed the first surface of the die pad and a plurality of THT heat spreader structures; and

a plurality of input/output (I/O) pads disposed within the mold compound and having exposed I/O pad surfaces such that the plurality of THT heat spreader structures extend from the mold compound and past the exposed I/O pad surfaces.

13. The semiconductor package of claim 12 , where the plurality of THT heat spreader structures are positioned and disposed for attachment to a printed circuit board.

14. The semiconductor package of claim 13 , where the plurality of THT heat spreader structures are positioned and disposed for insertion through a plurality of vias formed in the printed circuit board.

15. The semiconductor package of claim 12 , where the plurality of THT heat spreader structures are formed as an integral part of the die pad.

16. The semiconductor package of claim 12 , where the plurality of THT heat spreader structures are formed as an integral part of the die pad by etching, milling, punching or machining a lead frame.

17. The semiconductor package of claim 12 , where the die pad comprises:

a pad having a plurality of mounting holes formed in the first surface;

a plurality of THT heat spreader pins affixed into the plurality of mounting holes of the pad so that the plurality of THT heat spreader pins protrude from the pad.

18. The semiconductor package of claim 17 , where the plurality of THT heat spreader pins are affixed by press fitting, cold welding or inserting the plurality of THT heat spreader pins into the plurality of mounting holes.

19. The semiconductor package of claim 12 , where the plurality of THT heat spreader pins comprise copper.

Assignments (22)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2024
From: NXP USA, INC.
To: CHIP PACKAGING TECHNOLOGIES, LLC
Reel/Frame 068541/0903 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0387 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0285 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0334 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027621/0928 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027622/0477 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027622/0075 →