Use of beam scanning to improve uniformity and productivity of a 2D mechanical scan implantation system
View Patent ↗An ion implantation system includes a beamline configured to direct an ion beam toward an end station configured to hold or support a workpiece, and a scanning system. The scanning system is configured to scan the end station past the ion beam in a two-dimensional fashion comprising a first scan axis along a first direction and a second scan axis along a second direction that is different than the first direction. The system further includes a supplemental scanning component operably associated with the scanning system, and configured to effectuate a scanning of the ion beam with respect to the end station along a third scan axis having a third direction that is different than the first direction.
1. An ion implantation system, comprising:
a beamline configured to direct an ion beam toward an end station configured to hold or support a workpiece;
a scanning system configured to scan the end station configured to hold or support the workpiece past the ion beam in a two-dimensional fashion comprising a first scan axis along a first direction and a second scan axis along a second direction that is different than the first direction; and
a supplemental scanning component operably associated with the scanning system, and configured to effectuate a scanning of the ion beam with respect to the end station along a third scan axis having a third direction that is different than the first direction,
wherein the supplemental scanning component is configured to selectively scan the ion beam along the third scan axis with one of a linear scan waveform or a non-linear scan waveform as a function of an indicated width of the scanning along the third scan axis.
2. The ion implantation system of claim 1 , wherein the supplemental scanning component comprises an electrostatic scanner configured to move the ion beam back and forth along the third scan axis in response to a time-varying electrostatic field.
3. The ion implantation system of claim 1 , wherein the supplemental scanning component comprises a magnetic scanner configured to move the ion beam back and forth along the third scan axis in response to a time-varying magnetic field.
4. The ion implantation system of claim 1 , wherein the supplemental scanning component is configured to dither the ion beam back and forth along the third scan axis, wherein the third scan axis crosses the first scan axis.
5. The ion implantation system of claim 4 , wherein a scan frequency of the scanning system along the first scan axis is a first frequency, and a dither frequency of the ion beam dither along the third scan axis is a second frequency, and wherein the second frequency is greater than the first frequency.
6. The ion implantation system of claim 1 , wherein the first and second directions are orthogonal to one another.