IP Library › Granted Patent US 9,147,665
Granted Patent B2
US 9,147,665 · App. 12/887,821 · Granted Sep 29, 2015

High bond line thickness for semiconductor devices

Inventors: Zhengyu Zhu (Suzhou, CN); Yi Li (Suzhou, CN); FangFang Yang (Suzhou, CN)
Assignee: Fairchild Semiconductor Corporation
H01L24/32B81B7/0048H01L23/49513H01L24/83H01L24/97H01L24/29H01L24/48H01L2224/26175H01L2224/27013H01L2224/291H01L2224/2919H01L2224/29111H01L2224/29116H01L2224/29139H01L2224/29144H01L2224/29339H01L2224/32225H01L2224/48247H01L2224/83051H01L2224/8385H01L2224/92H01L2224/92247H01L2224/97H01L2924/014H01L2924/01005H01L2924/0105H01L2924/01006H01L2924/01013H01L2924/01029H01L2924/0132H01L2924/0133H01L2924/01033H01L2924/01047H01L2924/01068H01L2924/01075H01L2924/01078H01L2924/01079H01L2924/01082H01L2924/0665H01L2924/078H01L2924/0781H01L2924/07802H01L2924/10329H01L2924/14H01L2924/1461H01L2924/15747H01L2924/19107
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Quick Facts
Patent No.
US 9,147,665
App. No.
12/887,821
Granted
Sep 29, 2015
Kind
B2
Abstract

Die attach methods used in making semiconductor devices and the semiconductor devices resulting from those methods are described. The methods include providing a leadframe with a die attach pad, using a boundary feature(s) containing a bond wire to define a perimeter on the die attach pad, depositing a conductive material (such as solder) within the perimeter, and then attaching a die containing an integrated circuit device to the die attach pad by using the conductive material. The boundary feature(s) allow an increased thickness of conductive material to be used, resulting in increased bond line thickness and increasing the durability and performance of the resulting semiconductor package. Other embodiments are described.

Claims (12)

1. A semiconductor device, the comprising:

a leadframe containing a die attach pad;

a conductive layer on a portion of the die attach pad, wherein the conductive layer has a thickness ranging up to about 30 mil;

a boundary feature comprising a bond wire partially surrounding and contacting the conductive layer, wherein both ends of the bond wires are attached to the die attach pad; and

a die on the conductive layer.

2. The device of claim 1 , wherein the boundary feature completely surrounds the conductive layer.

3. The device of claim 1 , wherein the boundary feature surrounds at least half of the conductive layer.

4. The device of claim 1 , wherein the conductive layer has a thickness ranging from about 4 mil to about 30 mil.

5. The device of claim 1 , wherein the conductive layer is substantially free of voids between the die and the die attach pad.

6. The device of claim 1 , wherein both ends of the bond wire have been attached to the die attach pad using a wedge or stitch bond.

7. The device of claim 6 , wherein the bond wire has been attached to the die attach pad at more than two locations.

8. The device of claim 1 , wherein four bond wires are used to make the boundary feature and both ends of each bond wire are attached to the die attach pad.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 058871, FRAME 0799 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 065653/0001 →
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 040075, FRAME 0644 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0536 →
SECURITY INTEREST Recorded Nov 12, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 058871/0799 →
RELEASE OF SECURITY INTEREST Recorded Oct 28, 2021
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 057969/0206 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 3, 2021
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 057694/0374 →
PATENT SECURITY AGREEMENT Recorded Sep 19, 2016
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 040075/0644 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 3, 2010
From: ZHU, ZHENGYU; LI, YI; YANG, FANGFANG
To: FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 025240/0285 →
Continuity (2)
Continuation In Part 11935915 · Nov 6, 2007
Related Publication 20110037153A1 · Feb 17, 2011