IP Library Granted Patent US 8,269,356
Granted Patent B2
US 8,269,356 · App. 12/973,410 · Granted Sep 18, 2012

Wire bonding structure and method that eliminates special wire bondable finish and reduces bonding pitch on substrates

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Quick Facts
Patent No.
US 8,269,356
App. No.
12/973,410
Granted
Sep 18, 2012
Kind
B2
Abstract

A semiconductor package has a semiconductor die disposed on a substrate. A bond wire is connected between a first bonding site on the semiconductor die and a second bonding site on the substrate. The first bonding site is a die bond pad; the second bonding site is a stitch bond. The second bonding site has a bond finger formed on the substrate, a conductive layer in direct physical contact with the bond finger, and a bond stud coupled to the bond wire and in direct physical contact with the conductive layer to conduct an electrical signal from the semiconductor die to the bond finger. The bond finger is made of copper. The conductive layer is made of copper or gold. The bond stud is made of gold and overlies a side portion and top portion of the copper layer.

Claims (20)

1. A semiconductor package, comprising:

a substrate;

a semiconductor die disposed on the substrate; and

a bond wire connected between a first bonding site on the semiconductor die and a second bonding site on the substrate, the second bonding site including,

(a) a bond finger of a conductive layer made of copper formed on the substrate,

(b) a copper layer in contact with the bond finger; (c) a glass passivation coating made of indium tin oxide in direct physical contact with the bond finger, and

(d) a bond stud coupled to the bond wire and in direct physical contact with the glass passivation coating to conduct an electrical signal from the semiconductor die to the bond finger.

2. The semiconductor package of claim 1 , wherein the bond finger is made of copper.

3. The semiconductor package of claim 1 , wherein the bond stud is made of gold.

4. The semiconductor package of claim 1 , wherein the bond stud overlies a side portion and top portion of the glass passivation coating.

5. The semiconductor package of claim 1 , wherein the first bonding site includes a die bond pad.

6. The semiconductor package of claim 1 , wherein the second bonding site includes a stitch bond.

7. The semiconductor package of claim 1 , wherein the conductive layer is made of gold.

8. A method of making a semiconductor package, comprising:

forming a substrate;

disposing a semiconductor die on the substrate; and

connecting a bond wire between a first bonding site on the semiconductor die and a second bonding site on the substrate by,

(a) forming a bond finger of a conductive layer made of copper on the substrate,

(b) a copper layer in contact with the bond finger; (c) forming a glass passivation coating made of indium tin oxide in direct physical contact with the bond finger, and (d) forming a bond stud coupled to the bond wire and in direct physical contact with the conductive layer to conduct an electrical signal from the semiconductor die to the bond finger.

9. The method of claim 8 , wherein the conductive layer is made of gold.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE THE ASSIGNEE'S NAME PREVIOUSLY RECORDED AT REEL: 038378 FRAME: 0252. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Aug 31, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 065236/0784 →
RELEASE OF SECURITY INTEREST Recorded Jun 8, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052864/0057 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0252 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →