High concentration nitrogen-containing germanium telluride based memory devices and processes of making
View Patent ↗A PCM device has the composition GexTeyNzAm deposited onto a substrate, where x is about 40% to about 60%, y is about 30% to about 49%, and z is about 5% to about 20% and more preferably about 5% to about 40%. The component represented as A is optional and representative of an element of Sb, Sn, In, Ga, or Zn, and m is up to about 15%. The composition is in the form of a film, and the nitrogen allows for the substantially conformal deposition of the film onto the substrate. A CVD process for depositing the PCM comprises delivering a Ge-based precursor and a Te-based precursor in vapor form to a CVD chamber, heating and pressurizing the chamber, and depositing the film onto a substrate. In making a phase change device using this process, the film is annealed and polished.
1. A phase change memory device, comprising:
a phase change memory material comprising GST and nitrogen, wherein the phase change memory material includes from about 40 to about 60 atomic percent germanium, up to about 15 atomic percent antimony, from about 30 atomic percent to about 49 atomic percent tellurium, and from about 5 to about 15 atomic percent nitrogen, wherein the phase change memory material is conformally deposited on a topographical feature of the substrate.
2. The phase change memory device of claim 1 , wherein the phase change memory material includes about 40 atomic percent germanium, and about 49 atomic percent tellurium.
3. The phase change memory device of claim 1 , wherein the phase change memory material has resistivity of less than 0.1 ohm-centimeters in the crystalline phase, and resistivity greater than about 10 ohm-centimeters in the amorphous state.
4. The phase change memory device of claim 1 , wherein the topographical feature of the substrate comprises a feature selected from the group consisting of holes, vias, and trenches.
5. The phase change memory device of claim 1 , wherein the phase change memory material is void free.
6. The phase change memory device of claim 1 , having device dimensions below 20 nm.
7. The phase change memory device of claim 1 , having device dimensions below 10 nm.
8. The phase change memory device of claim 1 , wherein the phase change memory material has a composition of 50.9% germanium, 9.7% antimony and 39.4% tellurium.
9. The phase change memory device of claim 1 , wherein the phase change memory material has a composition of 49% germanium, 9% antimony and 41% tellurium.
10. The phase change memory device of claim 1 , characterized by an endurance of greater than about 10 7 write cycles.
11. A method of forming a phase change memory device, comprising vapor depositing a phase change memory material comprising GST and nitrogen on a substrate in amorphous form, wherein the phase change memory material includes from about 40 to about 60 atomic percent germanium, up to about 15 atomic percent antimony, from about 30 atomic percent to about 49 atomic percent tellurium, and from about 5 to about 15 atomic percent nitrogen.
12. The method of claim 11 , wherein germanium in said phase change memory material is deposited using a germanium precursor comprising germanium bis(n-butyl,N,N-diisopropylamidinate).
13. The method of claim 11 , wherein tellurium in said phase change memory material is deposited using a tellurium precursor comprising di-tert-butyl telluride.
14. The method of claim 11 , wherein antimony in said phase change memory material is deposited using an antimony precursor comprising tris(dimethylamido)antimony.
15. The method of claim 11 , wherein the phase change memory material is deposited using a germanium precursor comprising germanium bis(n-butyl,N,N-diisopropylamidinate), an antimony precursor comprising tris(dimethylamido)antimony, and a tellurium precursor comprising di-tert-butyl telluride.
16. A process for fabricating a phase change device, said process comprising the steps of: depositing a phase change material on a substrate via a chemical vapor deposition (CVD) process, said phase change material comprising Ge x Te y N z in the form of a film, where x is about 40% to about 60%, y is about 30% to about 49%, and z is about 5% to about 40%, wherein said phase change material is substantially conformally deposited with regard to a topographical feature of said substrate to form a void free phase change material structure; annealing said deposited film, wherein said annealing reduces an amount of nitrogen in said film and transforms said Ge x Te y N z to an alloy of Ge x Te y′ N z — and GeN; and providing a chemical mechanical polish to said deposited film after annealing said film.
17. The process of claim 16 , wherein said Ge x Te y N z further comprises A m , wherein A is at least one of Sb, Sn, In, Ga, or Zn and m is up to about 15%.
18. The process of claim 16 , wherein said Ge x Te y N z further comprises antimony in an amount of up to 15%.
19. The process of claim 17 , wherein the phase change material includes about 40 atomic percent germanium, and about 49 atomic percent tellurium.
20. The phase change memory device of claim 1 , wherein the phase change memory material is conformally deposited in amorphous form.