IP Library Granted Patent US 8,298,866
Granted Patent B1
US 8,298,866 · App. 13/358,947 · Granted Oct 30, 2012

Wafer level package and fabrication method

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Quick Facts
Patent No.
US 8,298,866
App. No.
13/358,947
Granted
Oct 30, 2012
Kind
B1
Abstract

A method of forming an electronic component package includes coupling a first surface of an electronic component to a first surface of a first dielectric strip, the electronic component comprising bond pads on the first surface; forming first via apertures through the first dielectric strip to expose the bond pads; and filling the first via apertures with an electrically conductive material to form first vias electrically coupled to the bond pads. The bond pads are directly connected to the corresponding first vias without the use of a solder and without the need to form a solder wetting layer on the bond pads.

Claims (34)

1. A method of forming an electronic component package comprising:

forming an assembly, the assembly comprising:

an electronic component comprising a first surface comprising bond pads thereon;

an encapsulant encapsulating the entire electronic component except the first surface of the electronic component; and

a dielectric strip comprising a first surface coupled to the first surface of the electronic component;

forming via apertures through the dielectric strip to expose the bond pads subsequent to the forming an assembly; and

filling the via apertures with an electrically conductive material to form vias electrically coupled to the bond pads, wherein excess electrically conductive material is formed on a second surface of the dielectric strip.

2. The method of claim 1 wherein the encapsulant provides rigidity and support for the assembly.

3. The method of claim 1 further comprising forming traces electrically coupled to the vias.

4. The method of claim 3 wherein the traces are on the second surface of the dielectric strip.

5. The method of claim 3 wherein the vias and the traces are formed at the same time.

6. The method of claim 3 wherein the vias and the traces are formed using a single plating operation.

7. The method of claim 3 wherein at least one of the traces is in a fan-in configuration.

8. The method of claim 3 wherein at least one of the traces is in a fan-out configuration.

9. The method of claim 1 wherein the electrically conductive material is selected from the group consisting a metal, a metal containing material, an electrically conductive adhesive, and a solder paste.

10. The method of claim 1 wherein the filling the via apertures with an electrically conductive material comprises plating copper or a copper containing material in the via apertures.

11. The method of claim 1 further comprising etching the excess electrically conductive material on the second surface of the dielectric strip.

12. A method of forming an electronic component package comprising:

encapsulating sides of an electronic component in an encapsulant, the electronic component comprising a first surface comprising bond pads thereon;

coupling a first surface of a dielectric strip to the first surface of the electronic component;

forming via apertures through the dielectric strip to expose the bond pads subsequent to the coupling a first surface of a dielectric strip; and

forming vias and traces coupled to the dielectric strip, the vias being electrically coupled to the bond pads.

13. The method of claim 12 wherein the encapsulant provides rigidity and support.

14. The method of claim 12 wherein the encapsulating further comprises encapsulating a second surface of the electronic component in the encapsulant.

15. The method of claim 12 wherein the coupling a first surface of a dielectric strip is performed prior to the encapsulating.

16. The method of claim 12 further comprising forming lands coupled to the traces.

17. The method of claim 16 further comprising applying solder on paste (SOP) to the lands.

18. The method of claim 17 further comprising reflowing the SOP to form solder lands.

19. An electronic component package comprising:

an encapsulant encapsulating sides of an electronic component, the electronic component comprising a first surface comprising bond pads thereon;

a dielectric strip comprising a first surface coupled to the first surface of the electronic component;

via apertures through the dielectric strip to expose the bond pads; and

vias and traces coupled to the dielectric strip, the vias being electrically coupled to the bond pads, the vias completely filling the via apertures except that the vias are recessed below a second surface of the dielectric strip.

20. The electronic component package of claim 19 wherein the encapsulant further encapsulates a second surface of the electronic component.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2024
From: HUEMOELLER, RONALD PATRICK; RUSLI, SUKIANTO; RAZU, DAVID
To: AMKOR TECHNOLOGY, INC.
Reel/Frame 066078/0770 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 9, 2020
From: AMKOR TECHNOLOGY, INC.
To: AMKOR TECHNOLOGY SINGAPORE HOLDING PTE.LTD.
Reel/Frame 054067/0135 →
SECURITY INTEREST Recorded Aug 1, 2018
From: AMKOR TECHNOLOGY, INC.
To: BANK OF AMERICA, N.A., AS AGENT
Reel/Frame 046683/0139 →
PATENT SECURITY AGREEMENT Recorded May 7, 2015
From: AMKOR TECHNOLOGY, INC.
To: BANK OF AMERICA, N.A.
Reel/Frame 035613/0592 →