Terahertz scanning reflectometer
View Patent ↗A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.
1. A terahertz scanning reflectometer for direct measurement of diffusion kinetics and concentration gradient of a substrate, comprising:
a platform configured to hold the substrate;
a continuous wave terahertz source configured to generate terahertz radiation;
an off-axis parabolic reflector configured to focus the terahertz radiation at a surface of the substrate;
a beam splitter configured to direct a reflected beam from the substrate to a detection system; and
a motion controller configured to move the platform,
wherein on a condition that the motion controller adjusts a location of a focal point inside the substrate, a reflectance measurement is performed across a thickness of the substrate, wherein a concentration gradient is determined from a blank substrate measurement and a substance loaded substrate measurement, and
wherein on a condition that the motion controller locks the focal point at the surface of the substrate, a real time reflectance measurement is performable upon placement of the substance on the substrate.
2. The terahertz scanning reflectometer of claim 1 , wherein the substrate is stratum corneum.
3. The terahertz scanning reflectometer of claim 1 , wherein the substance is an analyte.
4. The terahertz scanning reflectometer of claim 1 , wherein the substance is a solvent.
5. The terahertz scanning reflectometer of claim 1 , wherein the substance is selected from the group of permeation enhancers and retardants.
6. The terahertz scanning reflectometer of claim 1 , wherein the terahertz source and the detection system are an integrated system.
7. A terahertz dynamic reflectometer for high speed kinetics measurements of a target, comprising:
a continuous wave terahertz source configured to generate terahertz radiation toward the target; and
a detection system for measuring a transient reflective beam from the target upon impact by a ballistic, wherein the terahertz source and the detection system are angularly positioned outside of a ballistic trajectory.
8. The terahertz dynamic reflectometer of claim 7 , wherein the transient corresponds to deformation characteristics.
9. The terahertz dynamic reflectometer of claim 7 , wherein a terahertz kinetics spectrum quantifies delamination of different layers within the target.
10. The terahertz dynamic reflectometer of claim 7 , wherein mass change is determinable from calibrated measurements versus a ballistic impacted target.
11. The terahertz dynamic reflectometer of claim 7 , wherein the detection system includes a reflective detection system and a transmission detection system.
12. The terahertz dynamic reflectometer of claim 11 , wherein a velocity profile is determined from a reflected kinetic spectrum and an effective mass of trauma generating volume is obtained from a transmission kinetic spectrum.
13. The terahertz dynamic reflectometer of claim 7 , wherein the direct detection system measures mass change.
14. A terahertz scanning reflectometer for diagnosing a disease condition of a sample, comprising:
a platform configured to hold the sample;
a continuous wave terahertz source configured to generate terahertz radiation;
an off-axis parabolic reflector configured to focus the terahertz radiation at a surface of the sample;
a beam splitter configured to direct a reflected beam from the sample to a detection system; and
a motion controller configured to move the platform,
wherein on a condition that the motion controller adjusts a location of a focal point inside the sample, a reflectance measurement is performed across a thickness of the sample, wherein a spectrum is generated at the focal point and compared against a healthy sample to diagnose the disease condition.
15. The terahertz scanning reflectometer of claim 14 , wherein the spectrum is used to generate a sample image at the focal point.
16. The terahertz scanning reflectometer of claim 14 , wherein the focal point is moved in multiple dimensions to generate at least one of surface or internal sample images.