IP Library › Granted Patent US 8,525,637
Granted Patent B2
US 8,525,637 · App. 13/493,402 · Granted Sep 3, 2013

Resistor with temperature coefficient of resistance (TCR) compensation

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Quick Facts
Patent No.
US 8,525,637
App. No.
13/493,402
Granted
Sep 3, 2013
Kind
B2
Abstract

A current sense resistor and a method of manufacturing a current sensing resistor with temperature coefficient of resistance (TCR) compensation are disclosed. The resistor has a resistive strip disposed between two conductive strips. A pair of main terminals and a pair of voltage sense terminals are formed in the conductive strips. A pair of rough TCR calibration slots is located between the main terminals and the voltage sense terminals, each of the rough TCR calibration slots have a depth selected to obtain a negative starting TCR value observed at the voltage sense terminals. A fine TCR calibration slot is formed between the pair of voltage sense terminals.

Claims (22)

1. A resistor with temperature coefficient of resistance (TCR) compensation, the resistor comprising:

a resistive strip disposed between two conductive strips;

first and second main terminals and first and second voltage sense terminals formed in the conductive strips;

a first pair of slots positioned between at least a portion of the first and second main terminals and at least a portion of the first and second voltage sense terminals; and

a TCR calibration slot formed between the two conductive strips, wherein the TCR calibration slot has a depth selected to obtain a TCR value observed at the voltage sense terminals that approaches zero.

2. The resistor of claim 1 , wherein each of the first pair of slots has a depth selected to obtain a negative starting TCR value observed at the voltage sense terminals.

3. The resistor of claim 1 , wherein the TCR calibration slot is formed between the first and second voltage sense terminals.

4. The resistor of claim 1 , wherein the TCR calibration slot is formed in the resistive strip.

5. The resistor of claim 1 , wherein the TCR calibration slot is formed in the resistive strip and at least one of the terminals.

6. The resistor of claim 1 , further comprising a resistance calibration slot formed between the first and second main terminals, wherein the resistance calibration slot has a depth selected to calibrate a resistance value of the resistor.

7. The resistor of claim 6 , wherein the resistance calibration slot is formed in the resistive strip.

8. A method of manufacturing a resistor with temperature coefficient of resistance (TCR) compensation, the method comprising:

disposing a resistive strip between two conductive strips;

forming first and second main terminals and first and second voltage sense terminals in the conductive strips;

forming a first pair of slots between at least a portion of the main terminals and at least a portion of the voltage sense terminals; and

forming a TCR calibration slot between the conductive strips, wherein the TCR calibration slot has a depth selected to obtain a TCR value observed at the voltage sense terminals that approaches zero.

9. The method of claim 8 , wherein each of the first pair of slots are formed having a depth selected to obtain a negative starting TCR value observed at the voltage sense terminals.

10. The method of claim 8 , wherein the TCR calibration slot is formed between the first and second voltage sense terminals.

11. The method of claim 8 , wherein the TCR calibration slot is formed in the resistive strip.

12. The method of claim 8 , wherein the TCR calibration slot is formed in the resistive strip and at least one of the terminals.

13. The method of claim 8 , further comprising a resistance calibration slot formed between the first and second main terminals, wherein the resistance calibration slot has a depth selected to calibrate a resistance value of the resistor.

14. The method of claim 13 , wherein the resistance calibration slot is formed in the resistive strip.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Jul 17, 2019
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: VISHAY DALE ELECTRONICS, INC.; DALE ELECTRONICS, INC.; VISHAY DALE ELECTRONICS, LLC; VISHAY-DALE
Reel/Frame 049772/0898 →
RELEASE OF SECURITY INTEREST Recorded Jul 17, 2019
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: VISHAY DALE ELECTRONICS, INC.; VISHAY INTERTECHNOLOGY, INC.; SILICONIX INCORPORATED
Reel/Frame 049785/0771 →
SECURITY INTEREST Recorded Jun 12, 2019
From: VISHAY DALE ELECTRONICS, INC.; DALE ELECTRONICS, INC.; VISHAY DALE ELECTRONICS, LLC; VISHAY-DALE, INC.; VISHAY INTERTECHNOLOGY, INC.; SILICONIX INCORPORATED; VISHAY-SILICONIX, INC.; VISHAY-SILICONIX; VISHAY SPRAGUE, INC.; VISHAY EFI, INC.; SPRAGUE ELECTRIC COMPANY; VISHAY GENERAL SEMICONDUCTOR, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 049440/0876 →
SECURITY AGREEMENT Recorded Dec 10, 2015
From: VISHAY DALE ELECTRONICS, LLC
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 037261/0616 →
SECURITY AGREEMENT Recorded Sep 5, 2013
From: VISHAY INTERTECHNOLOGY, INC.; VISHAY DALE ELECTRONICS, INC.; SILICONIX INCORPORATED
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 031170/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 11, 2012
From: SMITH, CLARK L.; BERTSCH, THOMAS L.; WYATT, TODD L.; VEIK, THOMAS L.
To: VISHAY DALE ELECTRONICS,INC.
Reel/Frame 028353/0375 →