IP Library Granted Patent US 9,112,068
Granted Patent B2
US 9,112,068 · App. 13/646,120 · Granted Aug 18, 2015

Laser doping of crystalline semiconductors using a dopant-containing amorphous silicon stack for dopant source and passivation

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Quick Facts
Patent No.
US 9,112,068
App. No.
13/646,120
Granted
Aug 18, 2015
Kind
B2
Abstract

Techniques and structures for laser doping of crystalline semiconductors using a dopant-containing amorphous silicon stack for dopant source and passivation. A structure includes a crystalline semiconductor having at least one surface, a doped crystalline region disposed in at least one selected area of the semiconductor surface, and a dopant-containing amorphous silicon layer stack containing a same dopant as present in the doped crystalline region on at least a portion of the semiconductor surface outside the selected area, wherein the dopant-containing amorphous silicon layer stack passivates the portion of the semiconductor surface on which it is disposed.

Claims (21)

1. A structure, comprising:

a crystalline semiconductor having at least one surface;

a doped crystalline region disposed in at least one selected area of the semiconductor surface;

a dopant-containing amorphous silicon layer stack containing a same dopant as present in the doped crystalline region on at least a portion of the semiconductor surface outside the selected area, wherein the dopant-containing amorphous silicon layer stack passivates the portion of the semiconductor surface on which it is disposed; and

a patterned overlayer stack disposed on the dopant-containing amorphous silicon layer stack, wherein the patterned overlayer stack is patterned with at least one opening over the doped crystalline region to physically expose one or more portions of the doped crystalline region to an outside environment.

2. The structure of claim 1 , further comprising:

a blanket layer of a metallic conductor disposed on the dopant-containing amorphous silicon layer stack and the doped crystalline region.

3. The structure of claim 2 , wherein the structure comprises one face of a solar cell structure.

4. The structure of claim 1 , further comprising:

a blanket layer of a transparent conductor disposed on the dopant-containing amorphous silicon layer stack and the doped crystalline region; and

a metallic conductor layer disposed on the blanket layer of transparent conductor wherein the metallic conductor layer has a grid pattern or a blanket pattern.

5. The structure of claim 4 , wherein the structure comprises one face of a solar cell structure.

6. The structure of claim 1 , further comprising:

a metallic conductor layer disposed over said patterned overlayer stack and doped crystalline region.

7. The structure of claim 6 , wherein the overlayer stack comprises at least one of a single or multilayer dielectric coating, a back reflector, a diffusion barrier, a transparent conductor, and a metallic conductor.

8. The structure of claim 6 , wherein the structure comprises one face of a solar cell structure.

9. The structure of claim 1 , wherein the dopant-containing amorphous silicon layer stack comprises an i-aSiH-bottom/doped-aSiH-top layer on the at least one surface of the crystalline semiconductor layer.

10. The structure of claim 1 , wherein the dopant-containing amorphous silicon layer stack comprises (i) a lower layer of undoped amorphous silicon providing a passivating function and (ii) an upper layer of doped amorphous silicon providing a dopant source function.

11. The structure of claim 10 , wherein the layer of undoped amorphous silicon and/or the layer of doped amorphous silicon comprise one of (i) a-SiH, (ii) a-Si(Ge)H, (iii) a-Ge(Si)H, and (iv) a-GeH.

12. The structure of claim 11 , wherein H content varies from approximately 5% to approximately 50% atomic percent.

13. The structure of claim 10 , wherein the layer of undoped amorphous silicon and/or the layer of doped amorphous silicon further comprises carbon (C) and/or a dopant selected from a group including boron (B), phosphorous (P), arsenic (As), antimony (Sb), nitrogen (N), gallium (Ga), indium (In), and aluminum (Al).

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 27, 2019
From: GLOBALFOUNDRIES INC.
To: ALSEPHINA INNOVATIONS INC.
Reel/Frame 049612/0211 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2015
From: GLOBALFOUNDRIES U.S. 2 LLC; GLOBALFOUNDRIES U.S. INC.
To: GLOBALFOUNDRIES INC.
Reel/Frame 036779/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2015
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: GLOBALFOUNDRIES U.S. 2 LLC
Reel/Frame 036550/0001 →