IP Library Granted Patent US 8,937,317
Granted Patent B2
US 8,937,317 · App. 13/730,619 · Granted Jan 20, 2015

Method and system for co-packaging gallium nitride electronics

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Quick Facts
Patent No.
US 8,937,317
App. No.
13/730,619
Granted
Jan 20, 2015
Kind
B2
Abstract

An electronic package includes a leadframe, a plurality of pins, a gallium-nitride (GaN) transistor, and a GaN diode. The GaN transistor includes a drain region, a drift region, a source region, and a gate region; the drain region includes a GaN substrate and a drain contact, the drift region includes a first GaN epitaxial layer coupled to the GaN substrate, the source region includes a source contact and is separated from the GaN substrate by the drift region, and the gate region includes a second GaN epitaxial layer and a gate contact. The GaN diode includes an anode region and a cathode region, the cathode region including the GaN substrate and a cathode contact, and the anode region including a third GaN epitaxial layer coupled to the GaN substrate and an anode contact. The drain contact and the anode contact are electrically connected to the leadframe.

Claims (26)

1. An electronic package comprising:

a leadframe;

a plurality of pins;

a gallium nitride (GaN) transistor comprising a drain region, a drift region, a source region, and a gate region, wherein:

the drain region comprises a GaN substrate and a drain contact;

the drift region comprises a first GaN epitaxial layer coupled to the GaN substrate;

the source region is separated from the GaN substrate by the drift region and comprises a source contact;

the gate region comprises a second GaN epitaxial layer coupled to the first GaN epitaxial layer and a gate contact;

a GaN diode comprising an anode region and a cathode region, wherein:

the cathode region comprises the GaN substrate and a cathode contact; and

the anode region comprises a third GaN epitaxial layer coupled to the GaN substrate and an anode contact;

wherein the drain contact and the anode contact are electrically connected to the leadframe.

2. The electronic package of claim 1 wherein:

the cathode contact is electrically connected to a first pin of the plurality of pins;

the source contact is electrically connected to a second pin in the plurality of pins; and

the gate contact is electrically connected to a third pin in the plurality of pins.

3. The electronic package of claim 2 wherein:

the electrical connections of the cathode contact, the source contact, and the gate contact comprises at least one of wire bonds, ribbon bonds, or copper clips.

4. The electronic package of claim 3 wherein the electrical connection of the cathode contact is connected to the first pin and an additional one or more pins of the plurality of pins.

5. The electronic package of claim 1 wherein the electrical connection between the drain contact and the leadframe comprises at least one of epoxy, eutectic, sintering, or solder.

6. The electronic package of claim 2 wherein the electrical connection between the anode contact and the leadframe comprises at least one of epoxy, eutectic, sintering, or solder.

7. The electronic package of claim 1 wherein the gallium nitride-based electronics package is electrically coupled and attached to a circuit board, wherein the leadframe is configured to conduct current from the drain region of the GaN transistor and the anode region of the GaN diode directly to the circuit board.

8. The electronic package of claim 1 further comprising one or more heat sinks attached to the leadframe.

9. The electronic package of claim 1 further comprising a solderable metal stack on the drain contact and a bondable metal stack on each of the source contact and gate contact.

10. The electronic package of claim 9 further comprising a second solderable metal stack on the anode contact and a second bondable metal stack on the cathode contact.

11. The electronic package of claim 1 wherein the leadframe comprises a bond pad, and further wherein the drain contact and the anode contact are electrically connected to the leadframe via the bond pad.

Assignments (12)
NUNC PRO TUNC ASSIGNMENT Recorded Apr 24, 2024
From: NEXGEN POWER SYSTEMS, INC.
To: NEXGEN (ASSIGNMENT FOR THE BENEFIT OF CREDITORS), LLC
Reel/Frame 067852/0662 →
CORRECTIVE ASSIGNMENT TO CORRECT THE THE ASSIGNOR NAME PREVIOUSLY RECORDED AT REEL: 66783 FRAME: 161. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 24, 2024
From: NEXGEN (ASSIGNMENT FOR THE BENEFIT OF CREDITORS), LLC
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 067217/0886 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 19, 2024
From: NEXGEN POWER SYSTEMS, INC.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 067172/0711 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2024
From: NEXGEN POWER SYSTEMS, INC.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 066783/0161 →
RELEASE OF SECURITY INTEREST Recorded Jul 26, 2021
From: SOUTH LAKE ONE LLC
To: NEXGEN POWER SYSTEMS, INC.
Reel/Frame 056973/0477 →
SECURITY INTEREST Recorded Oct 23, 2020
From: NEXGEN POWER SYSTEMS, INC.
To: SOUTH LAKE ONE LLC
Reel/Frame 054244/0822 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2018
From: AVOGY, INC.
To: AVOGY (ABC), LLC
Reel/Frame 047951/0967 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR FROM AVOGY, INC. TO AVOGY (ABC), LLC PREVIOUSLY RECORDED ON REEL 045229 FRAME 0547. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Dec 13, 2018
From: AVOGY (ABC), LLC
To: NEXGEN POWER SYSTEMS, INC.
Reel/Frame 047827/0774 →
RELEASE OF SECURITY INTEREST Recorded Feb 13, 2018
From: SILICON VALLEY BANK
To: AVOGY, INC.
Reel/Frame 045317/0963 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2018
From: AVOGY, INC.
To: NEXGEN POWER SYSTEMS, INC.
Reel/Frame 045229/0547 →
SECURITY INTEREST Recorded Apr 1, 2014
From: AVOGY, INC.
To: SILICON VALLEY BANK
Reel/Frame 032611/0010 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2012
From: DISNEY, DONALD R.; SHAH, HEMAL N.
To: AVOGY, INC.
Reel/Frame 029546/0707 →