IP Library Granted Patent US 9,059,199
Granted Patent B2
US 9,059,199 · App. 13/735,912 · Granted Jun 16, 2015

Method and system for a gallium nitride vertical transistor

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Quick Facts
Patent No.
US 9,059,199
App. No.
13/735,912
Granted
Jun 16, 2015
Kind
B2
Abstract

A vertical JFET includes a GaN substrate comprising a drain of the JFET and a plurality of patterned epitaxial layers coupled to the GaN substrate. A distal epitaxial layer comprises a first part of a source channel and adjacent patterned epitaxial layers are separated by a gap having a predetermined distance. The vertical JFET also includes a plurality of regrown epitaxial layers coupled to the distal epitaxial layer and disposed in at least a portion of the gap. A proximal regrown epitaxial layer comprises a second part of the source channel. The vertical JFET further includes a source contact passing through portions of a distal regrown epitaxial layer and in electrical contact with the source channel, a gate contact in electrical contact with a distal regrown epitaxial layer, and a drain contact in electrical contact with the GaN substrate.

Claims (15)

1. A vertical JFET comprising:

a GaN substrate comprising a drain of the JFET;

a plurality of patterned epitaxial layers coupled to the GaN substrate, wherein:

a distal epitaxial layer with respect to the GaN substrate comprises a first part of a source channel, and

portions of adjacent patterned epitaxial layers are separated by a gap having a predetermined distance;

a plurality of regrown epitaxial layers coupled to the distal epitaxial layer and disposed in at least a portion of the gap, wherein a proximal regrown epitaxial layer with respect to the GaN substrate comprises a second part of the source channel;

a source contact passing through portions of a distal regrown epitaxial layer with respect to the GaN substrate and in electrical contact with the source channel;

a gate contact in electrical contact with a distal regrown epitaxial layer with respect to the GaN substrate; and

a drain contact in electrical contact with the GaN substrate.

2. The vertical JFET of claim 1 further comprising a second gate contact in electrical contact with a proximal epitaxial layer with respect to the GaN substrate.

3. The vertical JFET of claim 1 wherein the plurality of patterned epitaxial layers are arrayed hexagonally.

4. The vertical JFET of claim 3 wherein each of the plurality of patterned epitaxial layers include sidewalls substantially aligned with respect to crystal planes of the GaN substrate.

5. The vertical JFET of claim 4 wherein the crystal planes are m-planes of the GaN substrate.

6. The vertical JFET of claim 4 wherein the proximal regrown epitaxial layer is regrown on the sidewalls.

7. The vertical JFET of claim 1 wherein the first part of the source channel is adjacent the source contact and the second part of the source channel is adjacent the proximal epitaxial layer.

Assignments (12)
NUNC PRO TUNC ASSIGNMENT Recorded Apr 24, 2024
From: NEXGEN POWER SYSTEMS, INC.
To: NEXGEN (ASSIGNMENT FOR THE BENEFIT OF CREDITORS), LLC
Reel/Frame 067852/0662 →
CORRECTIVE ASSIGNMENT TO CORRECT THE THE ASSIGNOR NAME PREVIOUSLY RECORDED AT REEL: 66783 FRAME: 161. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 24, 2024
From: NEXGEN (ASSIGNMENT FOR THE BENEFIT OF CREDITORS), LLC
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 067217/0886 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 19, 2024
From: NEXGEN POWER SYSTEMS, INC.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 067172/0711 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2024
From: NEXGEN POWER SYSTEMS, INC.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 066783/0161 →
RELEASE OF SECURITY INTEREST Recorded Jul 26, 2021
From: SOUTH LAKE ONE LLC
To: NEXGEN POWER SYSTEMS, INC.
Reel/Frame 056973/0477 →
SECURITY INTEREST Recorded Oct 23, 2020
From: NEXGEN POWER SYSTEMS, INC.
To: SOUTH LAKE ONE LLC
Reel/Frame 054244/0822 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2018
From: AVOGY, INC.
To: AVOGY (ABC), LLC
Reel/Frame 047951/0967 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR FROM AVOGY, INC. TO AVOGY (ABC), LLC PREVIOUSLY RECORDED ON REEL 045229 FRAME 0547. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Dec 13, 2018
From: AVOGY (ABC), LLC
To: NEXGEN POWER SYSTEMS, INC.
Reel/Frame 047827/0774 →
RELEASE OF SECURITY INTEREST Recorded Feb 13, 2018
From: SILICON VALLEY BANK
To: AVOGY, INC.
Reel/Frame 045317/0963 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2018
From: AVOGY, INC.
To: NEXGEN POWER SYSTEMS, INC.
Reel/Frame 045229/0547 →
SECURITY INTEREST Recorded Apr 1, 2014
From: AVOGY, INC.
To: SILICON VALLEY BANK
Reel/Frame 032611/0010 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2013
From: NIE, HUI; EDWARDS, ANDREW P.; KIZILYALLI, ISIK; BOUR, DAVID P.; PRUNTY, THOMAS R.; DIDUCK, QUENTIN
To: AVOGY, INC.
Reel/Frame 029633/0068 →