IP Library Granted Patent US 8,541,260
Granted Patent B1
US 8,541,260 · App. 13/864,750 · Granted Sep 24, 2013

Exposed die overmolded flip chip package and fabrication method

Inventors: Robert Francis Darveaux (Higley, AZ); Michael Barrow (Chandler, AZ); Miguel Angel Jimarez (Gilbert, AZ); Jae Dong Kim (Seoul, KR); Dae Keun Park (Seoul, KR); Ki Wook Lee (Seoul, KR); Ju Hoon Yoon (Seoul, KR)
Assignee: Amkor Technology, Inc.
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Quick Facts
Patent No.
US 8,541,260
App. No.
13/864,750
Granted
Sep 24, 2013
Kind
B1
Abstract

An exposed die overmolded flip chip package includes a substrate. A die is flip chip mounted to an upper surface of the substrate. The package further includes a mold cap filling a apace between an active surface of the die and the upper surface of the substrate. The mold cap includes a principal surface, sidewalls extending from the upper surface of the substrate to the principal surfaces, an annular surface coplanar with the inactive surface of the die and extending outward from a peripheral edge of the inactive surface of the die, and protruding surfaces extending between the principal surface and the annular surface. The mold cap does not cover the inactive surface of the die such that heat transfer from the die to the ambient environment is maximized and the package thickness is minimized.

Claims (46)

1. A method of fabricating an exposed die overmolded flip chip package comprising:

flip chip mounting a die to a first surface of a substrate, the die comprising:

an active surface;

an inactive surface opposite the active surface; and

bond pads on the active surface;

forming a mold cap, the inactive surface of the die being exposed from the mold cap, wherein the mold cap comprises:

a principal surface;

receding surfaces extending from the principal surface towards the substrate; and

an annular surface coplanar with the inactive surface of the die; and

forming electrically conductive vias extending through the mold cap, the vias extending from the substrate to the principal surface.

2. The method of claim 1 wherein the mold cap further comprises sidewalls extending from the first surface of the substrate to the principal surface of the mold cap.

3. The method of claim 2 wherein the principal surface extends inwards from the sidewalls to the receding surfaces.

4. The method of claim 1 wherein the receding surfaces extend between the principal surface and the annular surface.

5. A method of fabricating an exposed die overmolded flip chip package comprising:

flip chip mounting a die to a first surface of a substrate, the die comprising:

an active surface;

an inactive surface opposite the active surface; and

bond pads on the active surface;

forming a mold cap, the inactive surface of the die being exposed from the mold cap, wherein the mold cap comprises:

a principal surface; and

receding surfaces extending from the principal surface towards the substrate,

the receding surfaces extending directly on to the inactive surface of the die; and

forming electrically conductive vias extending through the mold cap, the vias extending from the substrate to the principal surface.

6. The method of claim 5 wherein the substrate comprises first traces on the first surface of the substrate electrically connected to the vias.

7. The method of claim 5 further comprising interconnection balls on the vias.

8. The method of claim 5 wherein the forming electrically conductive vias comprises forming openings within the mold cap.

9. The method of claim 8 wherein the forming electrically conductive vias further comprises filling the openings with an electrically conductive material.

10. The method of claim 8 wherein the openings are formed using laser ablation.

11. A method of fabricating an exposed die overmolded flip chip package comprising:

flip chip mounting a die to a first surface of a substrate, the die comprising:

an active surface;

an inactive surface opposite the active surface; and

bond pads on the active surface;

forming a mold cap comprising a principal surface spaced a first distance from the first surface of the substrate, the inactive surface being spaced a second distance from the first surface of the substrate, the second distance being less than the first distance, the inactive surface of the die being exposed from the mold cap; and

forming electrically conductive vias extending through the mold cap.

12. The method of claim 11 wherein the mold cap further comprises receding surfaces extending from the principal surface towards the substrate.

13. The method of claim 12 wherein the mold cap further comprises an annular surface coplanar with the inactive surface of the die, the receding surfaces extending between the principal surface and the annular surface.

14. The method of claim 13 wherein the entire inactive surface of the die is exposed from the mold cap.

15. The method of claim 12 wherein the receding surfaces extend directly on to the inactive surface of the die.

16. The method of claim 15 wherein a central region of the inactive surface of the die is exposed.

17. The method of claim 16 wherein a periphery of the inactive surface of the die is enclosed within the mold cap.

18. The method of claim 11 wherein the substrate further comprises first traces on the first surface of the substrate, the vias extending from the first traces to the principal surface.

19. The method of claim 11 wherein the vias extend from a second surface of the substrate through the substrate and the mold cap to the principal surface.

20. The method of claim 19 wherein the forming electrically conductive vias comprises:

forming openings through both the mold cap and the substrate; and

filling the openings with an electrically conductive material.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 16, 2024
From: DARVEAUX, ROBERT FRANCIS; BARROW, MICHAEL; JIMAREZ, MIGUEL ANGEL; KIM, JAE DONG; PARK, DAE KEUN; LEE, KI WOOK; YOON, JU HOON
To: AMKOR TECHNOLOGY, INC.
Reel/Frame 066137/0326 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 9, 2020
From: AMKOR TECHNOLOGY, INC.
To: AMKOR TECHNOLOGY SINGAPORE HOLDING PTE.LTD.
Reel/Frame 054067/0135 →
SECURITY INTEREST Recorded Aug 1, 2018
From: AMKOR TECHNOLOGY, INC.
To: BANK OF AMERICA, N.A., AS AGENT
Reel/Frame 046683/0139 →
PATENT SECURITY AGREEMENT Recorded May 7, 2015
From: AMKOR TECHNOLOGY, INC.
To: BANK OF AMERICA, N.A.
Reel/Frame 035613/0592 →
Continuity (4)
Continuation 13665295 · Oct 31, 2012
Continuation 13487713 · Jun 4, 2012
Division 12931326 · Jan 27, 2011
Continuation 11592889 · Nov 2, 2006