Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
View Patent ↗In a method and a device for testing a test substrate under defined thermal conditions, a substrate that is to be tested is held by a temperature-controllable chuck and is set to a defined temperature; the test substrate is positioned relative to test probes by at least one positioning device; and the test probes make contact with the test substrate for testing purposes. At least one component of the positioning device that is present in the vicinity of the temperature-controlled test substrate is set to a temperature that is independent of the temperature of the test substrate by a temperature-controlling device, and this temperature is held constant.
1. A prober that is configured to test a test substrate, the prober comprising:
a temperature-controlled chuck that is configured to support the test substrate and to control a temperature of the test substrate;
a plurality of test probes that are configured to electrically contact the test substrate;
a positioning device that is configured to position the test substrate relative to the plurality of test probes; and
a viewing unit that is configured to view the test substrate during the test, wherein the viewing unit includes:
(i) a drive that is configured to position the viewing unit relative to the test substrate; and
(ii) a temperature control device that is configured to maintain the temperature of the drive at a desired temperature that is independent of the temperature of the test substrate.
2. The prober of claim 1 , wherein the viewing unit further includes a microscope.
3. The prober of claim 1 , wherein the viewing unit further includes a camera.
4. A method of testing a test substrate under defined thermal conditions, the method comprising:
locating the test substrate on a temperature-controlled chuck that is configured to support the test substrate and to control the temperature of the test substrate to a test temperature;
orienting a viewing unit relative to the test substrate with a drive;
viewing the test substrate with the viewing unit; and
maintaining the drive at a desired temperature that is independent of the temperature of the test substrate.
5. The method of claim 4 , wherein the test temperature is a first temperature, wherein the method further includes changing the temperature of the test substrate to a second temperature that is different from the first temperature, and further wherein the maintaining includes maintaining the drive at the desired temperature during the changing.
6. The method of claim 4 , wherein the method further includes contacting the test substrate with a plurality of test probes.
7. The method of claim 6 , wherein the viewing further includes viewing at least a portion of the plurality of test probes.
8. The method of claim 4 , wherein the viewing unit includes a microscope.
9. The method of claim 4 , wherein the viewing unit includes a camera.