IP Library Granted Patent US 9,269,582
Granted Patent B2
US 9,269,582 · App. 14/006,662 · Granted Feb 23, 2016

Cluster ion implantation of arsenic and phosphorus

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Quick Facts
Patent No.
US 9,269,582
App. No.
14/006,662
Granted
Feb 23, 2016
Kind
B2
Abstract

An ion implantation method, in which a dopant source composition is ionized to form dopant ions, and the dopant ions are implanted in a substrate. The dopant source composition includes cluster phosphorus or cluster arsenic compounds, for achieving P- and/or As-doping, in the production of doped articles of manufacture, e.g., silicon wafers or precursor structures for manufacturing microelectronic devices.

Claims (43)

1. An on implantation method, comprising ionizing a dopant source composition to form dopant ions, and implanting the dopant ions in a substrate, wherein the dopant source composition comprises a composition selected from the group consisting of:

(i) diphosphorus oxyhalides;

(ii) diarsenic halides and oxyhalides;

(iii) substituted phosphanes of the formula P n H x R y , wherein R is selected from alkyl, alkoxy, O, NR and other functional groups containing H, C, O and N atoms, n is an integer having a value of from 2 to 22, x is an integer having a value of from 2 to 22, and y is an integer having a value of from 1 to 22;

(iv) substituted arsines of the formula As n H x R y , wherein R is selected from alkyl, O, NR and other functional groups containing H, C, O and N atoms, n is an integer having a value of from 2 to 22, x is an integer having a value of from 2 to 22, and y is an integer having a value of from 1 to 22;

(v) diphosphanes of the formula R 2 P—PR′ 2 wherein R 2 and R′ 2 are each independently selected from C 1-6 alkyls, aryls, and other functional groups containing H, C, O and N atoms;

(vi) diarsanes of the formula R 2 As—AsR′ 2 wherein R 2 and R′ 2 are each independently selected from C 1-6 alkyls, aryls, and other functional groups containing H, C, O and N atoms;

(vii) phosphorus source compounds with P—P bonds, produced as reaction products of phosphorus halides and phosphorus hydrides; and

(vii) arsenic source compounds with As—As bonds, produced as reaction products of arsenic halides and arsenic hydrides.

2. The ion implantation method of claim 1 , wherein the dopant source composition comprises a composition selected from the group consisting of diphosphorus oxyhalides.

3. The ion implantation method of claim 1 , wherein the dopant source composition comprises a composition selected from the group consisting of diarsenic halides and oxyhalides.

4. The ion implantation method of claim 1 , wherein the dopant source composition comprises a composition selected from the group consisting of substituted phosphanes of the formula P n H x R y , wherein R is selected from alkyl, alkoxy, O, NR and other functional groups containing H, C, O and N atoms, n is an integer having a value of from 2 to 22, x is an integer having a value of from 2 to 22, and y is an integer having a value of from 1 to 22.

5. The ion implantation method of claim 1 , wherein the dopant source composition comprises a composition selected from the group consisting of substituted arsines of the formula As n H x R y , wherein R is selected from alkyl, O, NR and other functional groups containing H, C, O and N atoms, n is an integer having a value of from 2 to 22, x is an integer having a value of from 2 to 22, and y is an integer having a value of from 1 to 22.

6. The ion implantation method of claim 1 , wherein the dopant source composition comprises a composition selected from the group consisting of diphosphanes of the formula R 2 P—PR′ 2 wherein R 2 and R′ 2 are each independently selected from C 16 alkyls, aryls, and other functional groups containing H, C, O and N atoms.

7. The ion implantation method of claim 1 , wherein the dopant source composition comprises a composition selected from the group consisting of diarsanes of the formula R 2 As—AsR′ 2 wherein R 2 and R′ 2 are each independently selected from C 16 alkyls, aryls, and other functional groups containing H, C, O and N atoms.

8. The ion implantation method of claim 1 , wherein the dopant source composition comprises a composition selected from the group consisting of phosphorus source compounds with P—P bonds, produced as reaction products of phosphorus halides and phosphorus hydrides.

9. The ion implantation method of claim 1 , wherein the dopant source composition comprises a composition selected from the group consisting of arsenic source compounds with As—As bonds, produces reaction products of arsenic halides and arsenic hydrides.

10. The ion implantation of claim 1 , wherein the dopant source composition comprises a composition selected from the group consisting of As 2 I 4 and As 2 F 4 .

11. The ion implantation method of claim 1 , wherein the dopant source composition comprises As 2 Cl 2 F 2 .

12. The ion implantation method of claim 1 , wherein the dopant source composition is ionized under ionizing conditions forming an ion beam, and the ion beam is accelerated toward the substrate.

13. The ion implantation method of claim 1 , wherein the dopant source composition is flowed to an ion source for said ionizing, in a carrier gas comprising a gas selected from the group consisting of argon, xenon, and helium.

14. An ion implantation method, comprising ionizing a dopant source composition to form dopant ions and implanting the dopant ions in a substrate, wherein the dopant source composition comprises a composition selected from the group consisting of:

(i) phosphorus hydrides of the formula P n H x wherein n is an integer having a value of from 2 to 22, x is an integer having a value of from 2 to 11, and x is not 5 when n is 2;

(ii) arsenic hydrides of the formula As n H y wherein n is an integer having a value of from 2 to 5, and y is an integer having a value of from 2 to 10;

(iii) phosphorus and diphosphorus halides and oxyhalides, excluding PF 3 ;

(iv) arsenic and diarsenic halides and oxyhalides, excluding AsF 5 ;

(v) substituted phosphanes of the formula P n H x R y , wherein R is selected from alkyl alkoxy, O, NR and other functional groups containing H, C, O and N atoms n is an integer having a value of from 2 to 22 x is an integer having a value of from 2 to 22 and y is an integer having a value of from 1 to 22;

(vi) substituted arsines of the formula As n H x R y , wherein R is selected from alkyl O, NR and other functional groups containing H, C, O and N atoms n is an integer having a value of from 2 to 22, x is an integer having a value of from 2 to 22, and y is an integer having a value of from 1 to 22;

(vii) of the formula R 2 P—PR′ 2 wherein R 2 and R′ 2 are each independently selected from C 1-6 alkyls, aryls, and other functional groups containing H, C, O and N atoms;

(viii) diarsanes of the formula R 2 As—AsR′ 2 wherein R 2 and R′ 2 are each independently selected from C 1-6 alkyls, aryls, and other functional groups containing H, C, O and N atoms;

(ix) phosphorus source compounds in combination with reducing agents that can induce in situ formation of product compounds with P—P bonds;

(x) source compounds in combination with reducing agents that can induce in situ formation of product compounds with As—As bonds;

(xi) phosphorus source compounds with P—P bonds produced as reaction products of phosphorus halides and phosphorus hydrides;

(xii) arsenic source compounds with As—As bonds, produces reaction products of arsenic halides and arsenic hydrides;

(xiii) poly-phosphorus 6- and 7-member ring compounds cluster halides and caged compounds; and

(xiv) poly-arsenic 6- and 7-member ring compounds, cluster halides and caged compounds wherein said dopant source composition is isotopically enriched beyond a natural abundance composition.

15. An ion implantation method, comprising ionizing a dopant source composition to form dopant ions, and implanting the dopant ions in a substrate, wherein the dopant source composition comprises a composition selected from the group consisting of:

substituted phosphanes of the formula P n H x R y , wherein R is selected from alkyl, alkoxy, O, NR and other functional groups containing H, C, O and N atoms, n is an integer having a value of from 2 to 22, x is an integer having a value of from 2 to 22, and y is an integer having a value of from 1 to 22;

substituted arsines of the formula As n H x R y , wherein R is selected from alkyl, O, NR and other functional groups containing H, C, O and N atoms, n is an integer having a value of from 2 to 22, x is an integer having a value of from 2 to 22, and y is an integer having a value of from 1 to 22;

diphosphanes of the formula R 2 P—PR′ 2 wherein R 2 and R′ 2 are each independently selected from C 1-6 alkyls, aryls, and other functional groups containing H, C, O and N atoms;

diarsanes of the formula R 2 As—AsR′ 2 wherein R 2 and R′ 2 are each independently selected from C 1-6 alkyls, aryls, and other functional groups containing H, C, O and N atoms;

phosphorus source compounds with P—P bonds, produced as reaction products of phosphorus halides and phosphorus hydrides; and

arsenic source compounds with As—As bonds, produced as reaction products of arsenic halides and arsenic hydrides.

Assignments (9)
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
ASSIGNMENT OF PATENT SECURITY INTEREST RECORDED AT REEL/FRAME 048811/0679 Recorded Nov 5, 2019
From: GOLDMAN SACHS BANK USA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 050965/0035 →
SECURITY INTEREST Recorded Nov 13, 2018
From: ENTEGRIS, INC.; SAES PURE GAS, INC.
To: GOLDMAN SACHS BANK USA
Reel/Frame 048811/0679 →
RELEASE OF SECURITY INTEREST Recorded Nov 8, 2018
From: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
To: ENTEGRIS, INC.; POCO GRAPHITE, INC.; ATMI, INC.; ATMI PACKAGING, INC.; ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 047477/0151 →
RELEASE OF SECURITY INTEREST Recorded Nov 8, 2018
From: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
To: ENTEGRIS, INC.; POCO GRAPHITE, INC.; ATMI, INC.; ATMI PACKAGING, INC.; ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 047477/0032 →
SECURITY INTEREST Recorded May 15, 2017
From: ENTEGRIS, INC.; POCO GRAPHITE, INC.
To: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
Reel/Frame 042375/0769 →
SECURITY INTEREST Recorded May 15, 2017
From: ENTEGRIS, INC.; POCO GRAPHITE, INC.
To: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
Reel/Frame 042375/0740 →
SECURITY INTEREST Recorded May 2, 2014
From: ENTEGRIS, INC.; POCO GRAPHITE, INC.; ATMI, INC.; ADVANCED TECHNOLOGY MATERIALS, INC.; ATMI PACKAGING, INC.
To: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
Reel/Frame 032812/0192 →
SECURITY INTEREST Recorded May 1, 2014
From: ENTEGRIS, INC.; POCO GRAPHITE, INC.; ATMI, INC.; ADVANCED TECHNOLOGY MATERIALS, INC.; ATMI PACKAGING, INC.
To: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
Reel/Frame 032815/0852 →