IP Library Granted Patent US 9,165,886
Granted Patent B2
US 9,165,886 · App. 14/151,305 · Granted Oct 20, 2015

Sensor packaging method and sensor packages

Inventors: Philip H. Bowles (Gilbert, AZ); Paige M. Holm (Phoenix, AZ); Stephen R. Hooper (Mesa, AZ); Raymond M. Roop (Scottsdale, AZ)
Assignee: FREESCALE SEMICONDUCTOR,INC
H01L23/528B81C1/0023B81C1/00238B81C2201/019B81C2203/0792H01L2224/48091H01L2924/1461
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Quick Facts
Patent No.
US 9,165,886
App. No.
14/151,305
Granted
Oct 20, 2015
Kind
B2
Abstract

A method ( 80 ) entails providing ( 82 ) a structure ( 117 ), providing ( 100 ) a controller element ( 102, 24 ), and bonding ( 116 ) the controller element to an outer surface ( 52, 64 ) of the structure. The structure includes a sensor wafer ( 92 ) and a cap wafer ( 94 ) Inner surfaces ( 34, 36 ) of the wafers ( 92, 94 ) are coupled together, with sensors ( 30 ) interposed between the wafers. One wafer ( 94, 92 ) includes a substrate portion ( 40, 76 ) with bond pads ( 42 ) formed on its inner surface ( 34, 36 ). The other wafer ( 94, 92 ) conceals the substrate portion ( 40, 76 ). After bonding, methodology ( 80 ) entails forming ( 120 ) conductive elements ( 60 ) on the element ( 102, 24 ), removing ( 126 ) material sections ( 96, 98, 107 ) from the wafers to expose the bond pads, forming ( 130 ) electrical interconnects ( 56 ), applying ( 134 ) packaging material ( 64 ), and singulating ( 138 ) to produce sensor packages ( 20, 70 ).

Claims (29)

1. A sensor package comprising:

a sensor structure having a sensor die and a cap, said sensor die including a sensor, a first inner surface of said cap being coupled to a second inner surface of said sensor die, one of said cap and said sensor die including a substrate portion with first bond pads located on a corresponding one of said first and second inner surfaces, and a material section of the other one of said cap and sensor die being absent;

a controller die having a top side and a bottom side opposing said top side, said top side including control circuitry and second bond pads, said bottom side being bonded to an outer surface of said sensor structure to form a stacked structure;

a second sensor located at said top side of said controller die; and

electrical interconnects attached between corresponding ones of said first bond pads and said second bond pads, said electrical interconnects being routed at least through a region where said material section is absent.

2. A sensor package as claimed in claim 1 wherein said outer surface of said sensor structure is a second outer surface of said sensor die, and said bottom side of said controller die is attached to said second outer surface of said sensor die to produce said stacked structure having said sensor die positioned between said cap and said controller die.

3. A sensor package as claimed in claim 2 wherein said cap includes said substrate portion with said first bond pads located on said first inner surface, and said first bond pads face in the same direction as said top side of said controller die.

4. A sensor package as claimed in claim 1 wherein said outer surface of said sensor structure is a first outer surface of said cap, and said bottom side of said controller die is attached to said first outer surface of said cap to produce said stacked structure having said cap positioned between said sensor die and said controller die.

5. A sensor package as claimed in claim 4 wherein said sensor die includes said substrate portion with said first bond pads located on said second inner surface, and said first bond pads face in the same direction as said top side of said controller die.

6. A sensor package as claimed in claim 1 further wherein said controller die includes bump pads formed on said top side of said controller die, and said sensor package further comprises conductive elements formed on and extending above said bump pads.

7. A sensor package as claimed in claim 1 further comprising a packaging material located over said top side of said controller die and encapsulating said control circuitry and said electrical interconnects.

8. A sensor package as claimed in claim 7 further comprising conductive elements extending above said top side of said controller die, said conductive elements being electrically connected with said controller die, and said conductive elements having a top surface that is exposed from said packaging material.

9. A sensor package comprising:

a sensor structure having a sensor die and a cap, said sensor die including a sensor, a first inner surface of said cap being coupled to a second inner surface of said sensor die, one of said cap and said sensor die including a substrate portion with first bond pads located on a corresponding one of said first and second inner surfaces, and a material section of the other one of said cap and sensor die being absent;

a controller die having a top side and a bottom side opposing said top side, said top side including control circuitry and second bond pads, said bottom side being bonded to an outer surface of said sensor structure to form a stacked structure;

an integral sensor formed within said controller die; and

electrical interconnects attached between corresponding ones of said first bond pads and said second bond pads, said electrical interconnects being routed at least through a region where said material section is absent.

10. A sensor package comprising:

a sensor structure having a sensor die and a cap, said sensor die including a sensor, a first inner surface of said cap being coupled to a second inner surface of said sensor die, one of said cap and said sensor die including a substrate portion with first bond pads located on a corresponding one of said first and second inner surfaces, and a material section of the other one of said cap and sensor die being absent;

a controller die having a top side and a bottom side opposing said top side, said top side including control circuitry and second bond pads, said bottom side being bonded to an outer surface of said sensor structure to form a stacked structure, said controller die including bump pads formed on said top side of said controller die;

conductive elements formed on said bump pads;

a second sensor located at said top side of said controller die; and

electrical interconnects attached between corresponding ones of said first bond pads and said second bond pads, said electrical interconnects being routed at least through a region where said material section is absent.

11. A sensor package as claimed in claim 10 wherein said outer surface of said sensor structure is a second outer surface of said sensor die, and said bottom side of said controller die is attached to said second outer surface of said sensor die to produce said stacked structure having said sensor die positioned between said cap and said controller die.

12. A sensor package as claimed in claim 11 wherein said cap includes said substrate portion with said first bond pads located on said first inner surface, and said first bond pads face in the same direction as said top side of said controller die.

13. A sensor package as claimed in claim 10 wherein said outer surface of said sensor structure is a first outer surface of said cap, and said bottom side of said controller die is attached to said first outer surface of said cap to produce said stacked structure having said cap positioned between said sensor die and said controller die.

14. A sensor package as claimed in claim 13 wherein said sensor die includes said substrate portion with said first bond pads located on said second inner surface, and said first bond pads face in the same direction as said top side of said controller die.

15. A sensor package as claimed in claim 10 further comprising an integral sensor formed within said controller die.

16. A sensor package as claimed in claim 10 further comprising a packaging material located over said top side of said controller die and encapsulating said control circuitry, said electrical interconnects, and said second sensor, said packaging material additionally encapsulating a portion of said conductive elements such that a top surface of said conductive elements is exposed from said packaging material.

Assignments (27)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 23, 2026
From: NXP USA, INC.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 075220/0239 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE APPLICATION NUMBERS PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0438. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded May 12, 2016
From: CITIBANK, NA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038665/0136 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT APPLICATION NUMBERS 12222918, 14185362, 14147598, 14185868 & 14196276 PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0479. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded May 12, 2016
From: CITIBANK, NA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038665/0498 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0479 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0438 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0763 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 032845/0497 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 032845/0522 →
SUPPLEMENT TO SECURITY AGREEMENT Recorded May 7, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 032845/0442 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 9, 2014
From: BOWLES, PHILIP H.; HOLM, PAIGE M.; HOOPER, STEPHEN R.; ROOP, RAYMOND M.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 031930/0679 →
Continuity (2)
Division 13597824 · Aug 29, 2012
Related Publication 20140124958A1 · May 8, 2014