IP Library Granted Patent US 9,337,143
Granted Patent B2
US 9,337,143 · App. 14/165,039 · Granted May 10, 2016

E-fuse structure with methods of fusing the same and monitoring material leakage

Inventors: O Sung Kwon (Wappingers Falls, NY); Dan Moy (Bethel, CT); Kihwang Son (Schenectady, NY); Xiaoqiang Zhang (Rexford, NY)
Assignees: GlobalFoundries Inc.; Samsung Electronics Co., Ltd.; International Business Machines Corporation
H01L23/5256H01L21/321H01L22/34H01L23/3677G01R31/2858H01L22/12H01L23/53228H01L2924/0002
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Quick Facts
Patent No.
US 9,337,143
App. No.
14/165,039
Granted
May 10, 2016
Kind
B2
Abstract

The present disclosure generally provides for an e-fuse structure and corresponding method for fusing the same and monitoring material leakage. The e-fuse structure can include a metal dummy structure and an electrical fuse link substantially aligned with a portion of the metal dummy structure, wherein the metal dummy structure cools at least part of the electrical fuse link in response to an electric current passing through the electrical fuse link.

Claims (8)

1. A method of fusing an e-fuse, the method comprising:

Obtaining a metal dummy structure in substantial vertical alignment with a portion of an electrical fuse link of the e-fuse, wherein the electrical fuse link joins two electrodes of the e-fuse, wherein the metal dummy structure is positioned laterally between the two electrodes of the e-fuse; and

creating a void in a further portion of the electrical fuse link not substantially vertically aligned with the metal dummy structure by directing an electric current through the electrical fuse link, wherein the metal dummy structure absorbs heat from the portion of the electrical fuse link substantially aligned with the metal dummy structure.

2. The method of claim 1 , wherein the aligning further comprises placing the metal dummy structure in physical contact with the electrical fuse link.

3. The method of claim 1 , wherein the directing of the electric current includes directing the electric current over a period of approximately ten microseconds and raising a temperature of the further portion of the electrical fuse link to at least approximately 800° C.

4. The method of claim 1 , further comprising placing the electrical fuse link and the metal dummy structure within a back end metal layer of a semiconductor.

5. The method of claim 1 , wherein the directed electric current comprises a fusing current.

6. The method of claim 1 , further comprising electrically coupling the electrical fuse link to at least one via.

Assignments (10)
RELEASE OF SECURITY INTEREST Recorded Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 16, 2020
From: CAVIUM INTERNATIONAL
To: MARVELL ASIA PTE, LTD.
Reel/Frame 053475/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 20, 2020
From: MARVELL INTERNATIONAL LTD.
To: CAVIUM INTERNATIONAL
Reel/Frame 052918/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 20, 2019
From: GLOBALFOUNDRIES U.S. INC.
To: MARVELL INTERNATIONAL LTD.
Reel/Frame 051070/0625 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 21, 2019
From: GLOBALFOUNDRIES INC.
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 050122/0001 →
SECURITY AGREEMENT Recorded Nov 29, 2018
From: GLOBALFOUNDRIES INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 049490/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2016
From: KWON, O SUNG; ZHANG, XIAOQIANG
To: GLOBALFOUNDRIES INC.
Reel/Frame 038004/0179 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 27, 2014
From: O SUNG, KWON; ZHANG, XIAOQIANG
To: GLOBALFOUNDRIES, INC.
Reel/Frame 032054/0264 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 27, 2014
From: SON, KIHWANG
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 032054/0187 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 27, 2014
From: MOY, DAN
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 032054/0123 →
Continuity (1)
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