Semiconductor device package and method of the same
The invention proposes a semiconductor device package structure, comprising a substrate, an adhesive layer and a die. The substrate has electrical through-holes to inter-connect a first and second wiring circuit on a top surface and a bottom surface of the substrate respectively, wherein a contact conductive bump is formed on the first wiring circuit. The under-fill adhesive layer is formed on the top surface and the first wiring circuit of the substrate except the area of the die. The die has a bump structure on the bonding pads of the die, wherein the bump structure of the die is electrically connected to the contact conductive bump of the first wiring circuit of the substrate.
1. A semiconductor device package, comprising:
a first substrate with a die receiving opening and a first wiring circuit on a top surface of said substrate and a second wiring circuit on a bottom surface of said substrate, wherein a first contact conductive bump is formed on said first wiring circuit;
a die with at least one bump structure on at least one of bonding pads formed on a bottom surface of said die, wherein said bump structure of said die is electrically connected to said first contact conductive bump of said first wiring circuit of said first substrate;
a first adhesive layer on said bottom surface of said first substrate and said die, and filled into the gap between said die and said first substrate for adhering said die and said first substrate; and
a second substrate with a die opening window and a third wiring circuit on a top surface of said second substrate and a fourth wiring circuit on a bottom surface of said second substrate, wherein a second contact conductive bump is formed on said fourth wiring circuit; and
wherein said second contact conductive bump of said second substrate is electrically connected to said first contact conductive bump of said first wiring circuit of said first substrate;
a second adhesive layer formed under said second substrate except said die opening window for adhering said die and said second substrate.
2. The package of claim 1 , wherein a size of said die opening window of said second substrate is smaller than that of said die receiving opening of said first substrate, wherein the thickness of said bump structure and the first contact conductive bump is smaller than 75 micrometers, the thickness of said second contact conductive bump and said first contact conductive bump is smaller than 75 micrometers.
3. The package of claim 1 , wherein said die is a MEMS sensor device, an image sensor chip, a navigate sensor chip, a pressure sensor chip, a CDR sensor (fluidic sensor) chip, a voice sensor chip, or a bio-chip sensor.