Embedded memory testing using back-to-back write/read operations
View Patent ↗In one embodiment, a BIST (built-in self-test) engine performs BIST testing of embedded memory in an integrated circuit device (e.g., an FPGA) via an (e.g., hard-wired, dedicated, low-latency) bus from the configuration bitstream engine. During BIST testing, data is written into the embedded memory at-speed, which may require the bitstream engine to produce a higher frequency than originally used for configuration. Between consecutive write operations, the BIST engine is capable of reading the previously written set of data from the embedded memory and comparing that read-back data with the corresponding original set of data to determine whether a BIST error has occurred. By performing back-to-back write/read-back operations faster than the configuration speed and using a dedicated W/RB bus, BIST testing can be optimally performed without false-positive-invoking delays and undesirable resource utilization.
1. A method for testing embedded memory in a field-programmable gate array (FPGA) device, the embedded memory having an at-speed configuration frequency, the method comprising:
(a) performing a number of write operations to write sets of configuration data into the embedded memory to configure the FPGA device;
(b) performing at least one read operation after each write operation to read back the previous written set of configuration data from the embedded memory as read-back data, wherein each of the write and read operations are performed at a frequency greater than the at-speed configuration frequency;
(c) comparing the read-back data to the configuration data to detect an embedded memory testing error;
wherein the method is performed by a memory-testing engine of the FPGA separate from the embedded memory, separate from a programmable logic fabric of the FPGA, and connected to the embedded memory by a hardwired data bus; and
wherein the memory-testing engine is implemented in a configuration bitstream engine of the FPGA device.
2. The method of claim 1 , wherein step (b) comprises performing only one read operation between consecutive write operations.
3. The method of claim 1 , wherein step (b) comprises performing two or more read operations between consecutive write operations.
4. The method of claim 1 , wherein:
each write operation is based on an address value stored in an address register for the embedded memory; and
after each write operation, the at least one read operation is performed without changing the address value stored in the address register from the address value used during the previous write operation.
5. A field-programmable gate array (FPGA) device comprising:
a programmable logic fabric;
an embedded memory having an at-speed configuration frequency;
a memory-testing engine separate from the embedded memory and the programmable logic fabric;
a hardwired data bus connecting the memory-testing engine to the embedded memory, wherein the memory-testing engine is configured to:
(a) perform a number of write operations to write sets of configuration data into the embedded memory to configure the FPGA device;
(b) perform at least one read operation after each write operation to read back the previous written set of configuration data from the embedded memory as read-back data, wherein each of the write and read operations are performed at a frequency greater than the at-speed configuration frequency; and
(c) compare the read-back data to the configuration data to detect a memory testing error; and
wherein the memory-testing engine is implemented in a configuration bitstream engine of the FPGA device.
6. The FPGA device of claim 5 , wherein the memory-testing engine is configured to perform only one read operation between consecutive write operations.
7. The FPGA device of claim 5 , wherein the memory-testing engine is configured to perform two or more read operations between consecutive write operations.
8. The FPGA device of claim 5 , wherein:
each write operation is based on an address value stored in an address register for the embedded memory; and
after each write operation, the memory-testing engine is configured to perform the at least one read operation without changing the address value stored in the address register from the address value used during the previous write operation.
9. The FPGA device of claim 5 , wherein the memory-testing engine comprises:
a memory-testing controller configured to control operations of the memory-testing engine;
a comparator configured to compare the read-back data to the configuration original data to detect the memory testing error; and
an error counter configured to count each memory testing error.
10. The FPGA device of claim 9 , wherein the memory-testing engine further comprises:
an address generator configured to generate memory address values for the write operations; and
a data generator configured to generate the sets of configuration data.