Semiconductor electronic components with integrated current limiters
An electronic component includes a high-voltage depletion-mode transistor and a low-voltage enhancement-mode transistor. A source electrode of the high-voltage depletion-mode transistor is electrically connected to a drain electrode of the low-voltage enhancement-mode transistor, and a gate electrode of the high-voltage depletion-mode transistor is electrically coupled to the source electrode of the low-voltage enhancement-mode transistor. The on-resistance of the enhancement-mode transistor is less than the on-resistance of the depletion-mode transistor, and the maximum current level of the enhancement-mode transistor is smaller than the maximum current level of the depletion-mode transistor.
1. An electronic component, comprising:
a depletion-mode transistor having a first breakdown voltage and a first maximum current level, the depletion-mode transistor comprising a source electrode, a gate electrode, a drain electrode, a semiconductor material layer, and a channel in the semiconductor material layer; and
an enhancement-mode transistor having a second breakdown voltage and a second maximum current level, the enhancement-mode transistor comprising a source electrode, a gate electrode, and a drain electrode; wherein
the source electrode of the depletion-mode transistor is electrically connected to the drain electrode of the enhancement-mode transistor and the gate electrode of the depletion-mode transistor is electrically coupled to the source electrode of the enhancement-mode transistor; and
the semiconductor material layer of the depletion-mode transistor includes a recess in a gate region of the depletion-mode transistor, the recess causing a conductivity or charge density of the channel to be smaller in the gate region than in an access region of the depletion-mode transistor when 0V is applied to the gate electrode of the depletion-mode transistor relative to the source electrode of the depletion-mode transistor, the recess further causing the first maximum current level to be smaller than the second maximum current level.
2. The electronic component of claim 1 , wherein the second breakdown voltage is smaller than the first breakdown voltage.
3. The electronic component of claim 1 , wherein the depletion-mode transistor is a III-N device.
4. The electronic component of claim 3 , wherein the enhancement-mode transistor is a Silicon device or a III-N device.
5. The electronic component of claim 1 , wherein the gate electrode of the depletion-mode transistor is electrically connected to the source electrode of the enhancement-mode transistor.
6. The electronic component of claim 1 , wherein the recess extends through the channel.
7. The electronic component of claim 1 , further comprising an insulating material between the gate electrode and the semiconductor material layer.
8. The electronic component of claim 7 , wherein the insulating material prevents the gate electrode from directly contacting the semiconductor material layer.
9. A method of operating an electronic component, the electronic component comprising:
a depletion-mode transistor having a first breakdown voltage and a first maximum current level, the depletion-mode transistor comprising a source electrode, a gate electrode, a drain electrode, a semiconductor material layer, and a channel in the semiconductor material layer, a conductivity or charge density of the channel being smaller in a gate region of the depletion-mode transistor than in an access region of the depletion-mode transistor when OV is applied to the gate electrode of the depletion-mode transistor relative to the source electrode of the depletion-mode transistor; and
an enhancement-mode transistor having a second breakdown voltage and a second maximum current level, the enhancement-mode transistor comprising a source electrode, a gate electrode, and a drain electrode, the source electrode of the depletion-mode transistor being electrically connected to the drain electrode of the enhancement-mode transistor and the gate electrode of the depletion-mode transistor being electrically coupled to the source electrode of the enhancement-mode transistor;
the method comprising applying a positive voltage to the gate electrode of the enhancement-mode transistor relative to the source electrode of the enhancement-mode transistor, and applying a substantial positive voltage to the drain electrode of the depletion-mode transistor relative to the source electrode of the enhancement-mode transistor, causing a maximum current level of the electronic component to flow between the source electrode of the enhancement-mode transistor and the drain electrode of the depletion-mode transistor, wherein the maximum current level of the electronic component is smaller than or equal to the first maximum current level, and the first maximum current level is smaller than the second maximum current level.
10. The method of claim 9 , wherein the second breakdown voltage is smaller than the first breakdown voltage.
11. The method of claim 9 , wherein the depletion-mode transistor is a III-N device.
12. The method of claim 11 , wherein the enhancement-mode transistor is a Silicon device or a III-N device.
13. The method of claim 9 , wherein the gate electrode of the depletion-mode transistor is electrically connected to the source electrode of the enhancement-mode transistor.