Die stack address bus having a programmable width
The dies of a stacked die integrated circuit (IC) employ the address bus to indicate the particular die, or set of dies, targeted by data on a data bus. During manufacture of the stacked die IC, the IC is programmed with information indicating a width of the address bus. During operation, each die addresses the other dies with addresses having the corresponding width based on this programmed information.
1. An integrated circuit device, comprising:
a die address bus;
a plurality of dies arranged in a stacked die integrated circuit, the plurality of dies comprising a first die including:
a storage location configured to store information indicating a width of the die address bus; and
an interface configured to receive a die address via the die address bus based on the information.
2. The integrated circuit device of claim 1 , wherein the first die comprises:
a first set of through-silicon vias (TSVs) forming a first portion of a data bus of the stacked die integrated circuit, the first set of TSVs coupled to a functional module of the first die; and
a second set of TSVs forming a second portion of the data bus, the second set of TSVs not coupled to the functional module of the first die.
3. The integrated circuit device of claim 2 , wherein the first set of TSVs and the second set of TSVs are disposed symmetrically about a first centerline of a face of the first die.
4. The integrated circuit device of claim 3 , wherein the first die comprises:
a third set of TSVs forming a third portion of the data bus of the stacked die integrated circuit, the third set of TSVs not coupled to a functional module of the first die; and
wherein the third set of TSVs is disposed symmetrically with the first set of TSVs about a second centerline of the face of the first die.
5. The integrated circuit device of claim 4 , wherein the first die comprises:
a fourth set of TSVs forming a fourth portion of the data bus, the second set of TSVs not coupled to the functional module of the first die; and
wherein the fourth set of TSVs is disposed symmetrically with the first set of TSVs about the first centerline and disposed symmetrically with the second set of TSVs about the second centerline of the face of the first die.
6. The integrated circuit device of claim 2 , wherein the plurality of dies comprises a second die, the second die comprising:
a third set of TSVs aligned with the first set of TSVs forming the first portion of the data bus, the third set of TSVs not coupled to a functional module of the second die; and
a fourth set of TSVs aligned with the second set of TSVs forming the second portion of the data bus, the fourth set of TSVs coupled to the functional module of the second die.
7. The integrated circuit device of claim 6 , wherein the first die and the second die are programmed to have the same die address.
8. The integrated circuit device of claim 6 , wherein the first die is stacked on the second die with the second die in a first position, and fourth set of TSVs is disposed such that the fourth set of TSVs align with the first set of TSVs when the first die is stacked on the second die with the second die in a flipped position relative to the first position.
9. The integrated circuit device of claim 1 , wherein the interface is configured to select a number of signal lines of the die address bus based on the information indicating the width of the die address bus, and configured to identify the received die address by reading the selected signal lines.
10. An integrated circuit device, comprising:
a plurality of stacked die comprising a first die and a second die; and
a data bus having a width based on the first die being disposed on the stack in a first orientation of a plurality of possible orientations and the second die being disposed on the stack in a second orientation of the plurality of orientations.
11. An integrated circuit device, comprising:
a die address bus;
a plurality of dies arranged in a stacked die integrated circuit, each of the plurality of dies including:
a storage location configured to store information indicating a width of the die address bus; and
an interface configured to receive a die address via the die address bus and identify an address width of the die address based on the information.