High-frequency VLSI interconnect and intentional inductor impedance extraction in the presence of a multi-layer conductive substrate
Embodiments of methods, apparatus, and systems for extracting impedance for a circuit design are disclosed herein. Some of the disclosed embodiments are computationally efficient and can accurately compute the frequency-dependent impedance of VLSI interconnects and/or intentional inductors in the presence of multi-layer conductive substrates. In certain embodiments, the resulting accuracy and CPU time reduction are a result of a Green's function approach with the correct quasi-static limit, a modified discrete complex image approximation to the Green's function, and a continuous dipole expansion to evaluate the magnetic vector potential at the distances relevant to VLSI interconnects and intentional inductors.
1. One or more computer-readable memory or storage devices storing computer-executable instructions which when executed by a computer cause the computer to perform a method, the method comprising:
receiving layout information indicative of at least signal-wire segments in a circuit design and substrate profile information indicative of electrical characteristics of a substrate over which the circuit design is to be implemented;
performing impedance extraction using the layout information and the substrate profile information, wherein the impedance extraction generates a plurality of impedance values for the signal-wire segments and wherein the substrate is not represented by a plurality of filaments during the impedance extraction; and
generating a representation of electrical characteristics of the circuit design, the representation comprising the impedance values.
2. The one or more computer-readable memory or storage devices of claim 1 , wherein the impedance extraction is performed using an approximation of a Green's function in the presence of the substrate.
3. The one or more computer-readable memory or storage devices of claim 2 , wherein the Green's function is due to a magnetic dipole.
4. The one or more computer-readable memory or storage devices of claim 1 , wherein the impedance extraction is performed using a representation of the substrate comprising a superposition of complex exponentials.
5. The one or more computer-readable memory or storage devices of claim 1 , wherein the substrate is a multi-layer substrate.
6. The one or more computer-readable memory or storage devices of claim 1 , wherein the representation of the electrical characteristics of the circuit design is a netlist that includes the impedance values.
7. A computer-implemented method, comprising:
by computing hardware, receiving layout information indicative of at least signal-wire segments in a circuit design and substrate profile information indicative of electrical characteristics of a substrate over which the circuit design is to be implemented;
by the computing hardware, performing impedance extraction using the layout information and the substrate profile information, wherein the impedance extraction generates a plurality of impedance values for the signal-wire segments and wherein the substrate is not represented by a plurality of filaments during the impedance extraction; and
by the computing hardware, generating a representation of electrical characteristics of the circuit design, the representation comprising the impedance values.
8. The method of claim 7 , wherein the impedance extraction is performed using an approximation of a Green's function in the presence of the substrate.
9. The method of claim 8 , wherein the Green's function is due to a magnetic dipole.
10. The method of claim 7 , wherein the impedance extraction is performed using a representation of the substrate comprising a superposition of complex exponentials.
11. The method of claim 7 , wherein the substrate is a multi-layer substrate.
12. The method of claim 7 , wherein the representation of the electrical characteristics of the circuit design is a netlist that includes the impedance values.