Granted Patent B2

US 10,162,006 · App. 14/689,043 · Granted Dec 25, 2018

Abstract

Claims (25)

1. A drive tester system, comprising:

a digital data storage drive including one or more integrated circuits having at least one pair of pins connected via an interconnect;

a system management bus (SMBus) interface having two wire connections with at least one pull-up resistor coupled to each of the wire connections and wherein the pull up resistors are configured to be driven by one of an open drain and open collector transistor output; and

a host tester system coupled to the digital data storage drive via the SMBus interface and configured to carry out a boundary scan test concurrently with a built-in self-test including a burn-in test and an endurance test on the digital data storage drive via the SMBus interface during drive manufacturing, wherein the boundary scan test includes a vector test and the host tester system is configured with an inter-integrated circuit serial bus interface with bidirectional serial lines.

2. The drive tester system of claim 1 , wherein the digital data storage drive is a solid state drive.

3. The drive tester system of claim 1 , wherein the digital data storage drive is a hard disk drive.

4. The drive tester system of claim 1 , wherein the two wire connections include a serial clock line (SCL) and a serial data line (SDA).

5. The drive tester system of claim 1 , wherein the digital data storage drives includes a controller that is configured to port at least one of:

an SMBus protocol; or

an FC protocol.

6. The drive tester system of claim 5 , wherein the controller includes a general purpose microcontroller.

7. The drive tester system of claim 5 , wherein the controller is integrated into a system on chip (SoC) and uses one or more processors on the SoC.

8. The drive tester system of claim 1 , wherein the SMBus interface does not include a universal asynchronous/transceiver (UART) or a high-speed interface (HSSI).

9. The drive tester system of claim 1 , further comprising: at least one other digital data storage drive, wherein the host tester system is further configured to test the digital data storage drives in parallel over the SMBus interface.

10. A method for self-testing a digital data storage drive, the method comprising:

connecting a host tester system to the digital data storage drive via a two-wire system management bus (SMBus) interface with at least one pull-up resistor coupled to each of the two-wires and wherein the pull up resistors are configured to be driven by one of an open drain and open collector transistor output, wherein the digital storage drive includes one or more integrated circuits having at least one pair of pins connected via an interconnect and the host tester system is configured with an inter-integrated circuit serial bus interface with bidirectional serial lines; and

performing a boundary scan test on the digital data storage drive concurrently with a built-in self-test including a burn-in test and an endurance test via the two-wire SMBus interface during drive manufacturing, wherein the boundary scan test includes a vector test.

11. The method of claim 10 , wherein the digital data storage drive is a solid state drive.

12. The method of claim 10 , wherein the digital data storage drive is a hard disk drive.

13. The method of claim 10 , wherein the two wire SMBus interface include a serial clock line (SCL) and a serial data line (SDA).

14. The method of claim 10 , wherein the digital data storage drives includes a controller that is configured to port at least one of:

an SMBus protocol;

or an FC protocol.

15. The method of claim 14 , wherein the controller includes a general purpose microcontroller.

16. The method of claim 14 , wherein the controller is integrated into a system on chip (SoC) and uses one or more processors on the SoC.

Assignments (12)