Multi-surface optical 3D microscope
A method of detecting multi-surfaces of an object includes providing an imaging system capable of detecting surfaces of the object. After system parameters are set up, two-dimensional images of the object at multiple Z steps can be acquired. Each surface of the object can then be extracted using two steps. In a first step, the surface can be constructed based on a confidence threshold. In a second step, the surface can be enhanced using an interpolation filter.
1. A method of measuring multiple surfaces of an object, the method comprising:
using an imaging system to acquire a plurality of two-dimensional (2D) images of the object at a corresponding plurality of scan positions;
extracting multiple surfaces of the object from the plurality of 2D images, wherein each of the multiple surfaces represents a distinct physical layer of the object;
selecting a plurality of cross-sectional profiles, wherein each of the cross-sectional profiles represents a different one of the extracted multiple surfaces of the object;
correcting at least one of the plurality of cross-sectional profiles based on a known characteristic of the object, thereby providing a corrected plurality of cross-sectional profiles;
calculating parameters of the object based on at least one of the corrected plurality of cross-sectional profiles; and
simultaneously displaying the corrected plurality of cross-sectional profiles using a single x-y plot; and
displaying the calculated parameters.
2. The method of claim 1 , wherein the correcting includes converting an apparent thickness of a layer associated with a pair of the cross-sectional profiles into an actual thickness.
3. The method of claim 2 , wherein the correcting computes the actual thickness by multiplying the apparent thickness by a function of an index of refraction of the layer and numerical aperture of an objective lens.
4. The method of claim 1 , wherein the parameters include at least two of surface thickness, curvature, roughness, and waviness.
5. The method of claim 1 , wherein the displaying includes:
selecting a first section of the corrected plurality of cross-sectional profiles on the x-y plot; and
selecting a second section of the corrected plurality of cross sectional profiles on the x-y plot.
6. The method of claim 5 , wherein the displaying further includes:
calculating a first set of values based on the corrected plurality of cross-sectional profiles in the first section;
calculating a second set of values based on the corrected plurality of cross-sectional profiles in the second section; and
displaying the first set of values and the second set of values as the calculated parameters.
7. The method of claim 1 , wherein the correcting includes:
determining an apparent thickness of a layer defined by a pair of the cross-sectional profiles by determining a distance between the cross-sectional profiles; and
determining an actual thickness of the layer based on the apparent thickness of the layer and an index of refraction of the layer.
8. The method of claim 7 , wherein determining the actual thickness of the layer is further based on a numerical aperture of an objective lens used to determine the pair of cross-sectional profiles.
9. The method of claim 8 , wherein the actual thickness of the layer is determined to be the apparent thickness of the layer times tan [arcsin(NA)]/tan [arcsin(NA/n 1 )], wherein NA is the numerical aperture of the objective lens used to identify the pair of cross-sectional profiles, and n 1 is the index of refraction of the layer.
10. The method of claim 1 , wherein the 2D images comprise image contrast values, wherein contrast is used as a measure of confidence in determining valid surface data points of each of the surfaces of the object.
11. The method of claim 1 , wherein the 2D images comprise image intensity values, wherein intensity is used as a measure of confidence in determining a valid surface data points of each of the surfaces of the object.